Abstract:
Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.
Abstract:
Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.
Abstract:
Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.
Abstract:
An electrochromic device can include a substrate, a transparent conductive oxide layer over the substrate, and a bus bar over the substrate. The bus bar can include silver and has a resistivity of at most 6.7×10−6 Ω*cm, an average adhesion strength to SiO2 of at least 3N based on 20 measurements, as determined by Method A of ASTM B905-00 (Reapproved 2010), or a classification of at least 4, as determined by Method B of ASTM B905-00 (Reapproved 2010). In another aspect a process of forming an electrochromic device can include forming a transparent conductive oxide layer over a substrate; forming a bus bar precursor over the substrate, wherein the precursor includes silver; and firing the precursor to form a bus bar. Firing can be performed such that the first bus bar is at a temperature of at least 390° C.
Abstract:
The present invention provides a liquid crystal display device, a liquid crystal display, a manufacturing method and a darkening process. The liquid crystal display includes a lower substrate provided with a lower common electrode, a scanning line, a data line, a pixel electrode and a TFT. A gate electrode of the TFT is connected with the scanning line. A source electrode of the TFT is connected with a data line. A drain electrode of the TFT is connected with the pixel electrode. Wherein, the lower common electrode has an extension portion. A connection line of the data line and the source electrode of the TFT is spaced apart from and overlapped with the extension portion. When executing a darkening process, the connection line is disconnected from the data line, and connecting the extension portion and the connection line.
Abstract:
The invention discloses a liquid crystal display panel with a hot pixel being repaired and a method for repairing a hot pixel. The liquid crystal display panel includes an array substrate, the array substrate at least includes a pixel after being repaired. The pixel includes: a main pixel unit and a sub pixel unit, which receive data signals driven by a first scan line so as to have the same voltage; a charge-share unit. The sub pixel unit includes hot pixels, in the sub pixel after being repaired, a drain electrode of the thin film transistor is disconnected from an antenna, the antenna is disconnected from the sub pixel electrode, the antenna is connected to the main pixel electrode electrically, the sub pixel electrode is connected to the common line electrically; and the charge-share unit is disconnected from the main pixel unit and the sub pixel unit.
Abstract:
A slit-shaped repair hole (27S) for repairing a short circuit defect of adjacent pixel electrodes (27) is provided straddling a storage capacitance wiring line (22CsL) at at least one intersection of the edges of the pixel electrode (27) and the storage capacitance wiring line (22CsL).
Abstract:
Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.
Abstract:
A liquid crystal display panel includes: a plurality of switching elements each provided on a transparent substrate (10) for each sub-pixel and having a drain electrode (14b); an interlayer insulating film (17) provided to cover the switching elements and including an inorganic insulating film (15) and an organic insulating film (16) sequentially layered; a capacitor electrode (18a) provided on the interlayer insulating film (17); a capacitor insulating film (19) provided to cover the capacitor electrode (18a); a plurality of pixel electrodes (20a) which are provided on the capacitor insulating film (19) and face the capacitor electrode (18a); and a connection region (R) at which the drain electrode (14b) and the capacitor electrode (18a) overlap each other via the inorganic insulating film (15) exposed from the organic insulating film (16).
Abstract:
A substrate for an LCD includes a transparent substrate, a pixel electrode, first and second storage wirings, and a storage duplication wiring. The pixel electrode is patterned as a unit pixel area on a thin film transistor layer formed on the substrate. The pixel electrode includes a first sub electrode receiving a first pixel voltage from the thin film transistor layer and a second sub electrode electrically separated from the first sub electrode and receiving a second pixel voltage. The first and second storage wirings are formed in the unit pixel area and respectively maintain the first and second pixel voltages during an image frame. The storage duplication wiring is formed along edges of the unit pixel area and is electrically connected to the first and second storage wirings. The substrate reduces pixel defects and improves display image quality.