摘要:
Provision of configuration access to a programmable device such as a programmable logic device (PLD) via a boundary-scannable devices. In one embodiment a configuration controller is arranged to transfer configuration data that specify configuration access for the PLD. A scan controller is coupled to the configuration controller and arranged to generate boundary-scan signals responsive to configuration data from the configuration controller. At least one boundary-scannable device has a plurality of boundary-scan pins coupled to the scan controller, and a PLD is coupled to the boundary-scannable device.
摘要:
A bitstream having a plurality of data sets is provided to an integrated circuit device such as an FPGA having test circuitry capable of routing data to the device's internal resources, with each data set including configuration information and a trigger signal. Successive data sets of the bitstream are sequentially processed by the test circuitry in response to the trigger signals to sequentially initialize the device's resources to various states. For some embodiments, each data set includes configuration data to configure one or more configurable elements of the device to implement a desired design and includes soft data for use by a processor embedded within the device. For one embodiment, control logic is provided to selectively wait for a predetermined time period before processing a next data set.
摘要:
Method and apparatus are described for providing analog capability with boundary-scanning for an integrated circuit. The integrated circuit includes a boundary-scan controller (1517) coupled to an analog-to-digital converter (200). An analog channel is selected for input to the analog-to-digital converter (200). Analog information is converted to digital information by the analog-to-digital converter (200), and then such digital information may be stored in data registers (209) for reading out via the boundary-scan controller (1517).
摘要:
A method for programming a series of in-system programmable devices that uses Boundary-Scan techniques to read device identification codes from each device of a system, and to automatically generate a board/device information file including a record for each device arranged in the order in which the devices are chained in the system. The device identification codes are then used to automatically retrieve device specifications from a central database. When no identification code is provided from the device, or the database fails to include specifications for a particular device, the user is prompted to enter minimum information or specifications necessary to carry out communications with the device. After device specifications are entered for each device, the user is prompted to enter configuration data, which is automatically matched to its associated device, and compared for consistency with the device specifications. After verifying the configuration data, programming is performed using the configuration data.
摘要:
Various approaches for converting configuration data for programmable circuits are disclosed. In one embodiment, a first configuration bitstream is provided. The first configuration bitstream has a format compatible with a first protocol for communicating with and configuring the programmable circuit. A second protocol is selected for communicating with and configuring the programmable circuit, and the first configuration bitstream is converted to a second configuration bitstream. The second configuration bitstream has a format compatible with the second protocol. The programmable circuit is configured with the second configuration bitstream.
摘要:
A Java-based method for performing Boundary-Scan Test procedures on an IEEE Standard 1149.1 compliant integrated circuit device. A Boundary-Scan Test application procedural interface (BST API) is provided that includes several objects defining the Boundary-Scan architecture of IEEE Standard 1149.1 compliant integrated circuit devices, and defines a plurality of Java-based source code commands utilized in applets for performing Boundary-Scan Test procedures. To facilitate implementing a single applet on a wide variety of hardware platforms, the BST API is based on a command structure subset implemented by a wide range of available Java flavors.