公开(公告)号：US20190025511A1

公开(公告)日：2019-01-24

申请号：US16042968

申请日：2018-07-23

Applicant: Quantum-Si Incorporated

Inventor： Jonathan M. Rothberg ,  Gerard Schmid ,  Alexander Gondarenko ,  James Beach ,  Kyle Preston ,  Farshid Ghasemi ,  Jeremy Lackey ,  Jack Jewell ,  Keith G. Fife ,  Ali Kabiri

IPC: G02B6/122 ,  G02B26/08 ,  H01L25/16 ,  G02B6/02 ,  G02B5/20 ,  G02B5/30

Abstract: An integrated device and related instruments and systems for analyzing samples in parallel are described. The integrated device may include sample wells arranged on a surface of where individual sample wells are configured to receive a sample labeled with at least one fluorescent marker configured to emit emission light in response to excitation light. The integrated device may further include photodetectors positioned in a layer of the integrated device, where one or more photodetectors are positioned to receive a photon of emission light emitted from a sample well. The integrated device further includes one or more photonic structures positioned between the sample wells and the photodetectors, where the one or more photonic structures are configured to attenuate the excitation light relative to the emission light such that a signal generated by the one or more photodetectors indicates detection of photons of emission light.