Roughness measurement sensor, an apparatus with a roughness measurement sensor and the respective use thereof

    公开(公告)号:US10539407B2

    公开(公告)日:2020-01-21

    申请号:US15479963

    申请日:2017-04-05

    申请人: Klingelnberg AG

    发明人: Georg Mies

    摘要: A roughness measurement sensor (15), comprising a sliding element and a sensor tip (15.4), wherein the sensor tip (15.4) is arranged in the region of the extremal end of a sensor arm (13.1) which has a longitudinal extension parallel to a longitudinal axis (LA) and is mounted in a lever-like manner. In some embodiments, the sliding element is formed in the manner of a skid (15.3), and the skid (15.3) lies, as viewed in a sectional plane (SE), perpendicularly to the longitudinal axis (LA), laterally adjacent to the sensor tip (15.4).

    Roundness measuring machine
    34.
    发明授权

    公开(公告)号:US10514244B2

    公开(公告)日:2019-12-24

    申请号:US15689370

    申请日:2017-08-29

    IPC分类号: G01B5/20 G01B7/28 G01B21/20

    摘要: A roundness measuring machine includes: a base; a table rotatable relative to the base; a probe configured to scan a surface of a workpiece mounted on the table; a motor configured to rotate the table; and a control device configured to control a rotation of the motor. The control device includes: a starting current detector configured to detect a starting current of the motor; and an acceleration/deceleration time setting unit configured to detect at least one of acceleration time and deceleration time for the motor in accordance with the starting current. The roundness measuring machine can suitably set the acceleration time and the deceleration time for the motor corresponding to the inertia moment of the workpiece mounted on the table.

    Surface pressure measuring device
    36.
    发明授权

    公开(公告)号:US10365175B2

    公开(公告)日:2019-07-30

    申请号:US15664191

    申请日:2017-07-31

    摘要: A surface pressure measuring device includes an abutting plate, a lift, a probe, a piezo actuator and a controller. A pinhole is formed in the abutting plate at an abutting surface that abuts a target. The lift causes the target to abut the abutting surface such that the target is compressed to a predetermined thickness. The probe is inserted through the pinhole to be movable in an axial direction of the pinhole. The piezo actuator holds a state in which a tip surface is flush with the abutting surface as the probe resists a repulsive force received from the target while the lift causes the target to abut the abutting surface. The controller calculates a local surface pressure of the target from a load applied to the probe and an area of the tip surface of the probe.

    LENS-MEASURING MACHINE AND LENS-MEASUREMENT METHOD

    公开(公告)号:US20190212121A1

    公开(公告)日:2019-07-11

    申请号:US16243539

    申请日:2019-01-09

    发明人: Yoshiyuki OMORI

    IPC分类号: G01B5/008 G01B5/20

    CPC分类号: G01B5/008 G01B5/20 G01M11/08

    摘要: A lens-measuring machine includes: a table rotatable around a rotation axis; a lens holder that holds a workpiece in a form of a lens, the lens holder being placed on the table so that an optical axis of the lens becomes orthogonal to the rotation axis; a contact tip that contacts a measurement surface of the lens; an angle sensor for detecting a rotary angle of the table; a displacement detector for detecting a displacement of the contact tip; and a controller for calculating coordinates information of the measurement surface of the lens in a form of polar coordinates, whose origin is at the rotation axis, based on displacement of the contact tip for every predetermined rotary angle of the table, the controller converting the calculated polar coordinates into Cartesian coordinates.

    Surface pressure measuring device
    38.
    发明授权

    公开(公告)号:US10288503B2

    公开(公告)日:2019-05-14

    申请号:US15664191

    申请日:2017-07-31

    摘要: A surface pressure measuring device includes an abutting plate, a lift, a probe, a piezo actuator and a controller. A pinhole is formed in the abutting plate at an abutting surface that abuts a target. The lift causes the target to abut the abutting surface such that the target is compressed to a predetermined thickness. The probe is inserted through the pinhole to be movable in an axial direction of the pinhole. The piezo actuator holds a state in which a tip surface is flush with the abutting surface as the probe resists a repulsive force received from the target while the lift causes the target to abut the abutting surface. The controller calculates a local surface pressure of the target from a load applied to the probe and an area of the tip surface of the probe.