摘要:
A semiconductor memory device having a bank including a redundancy cell block and a plurality of normal cell blocks includes a plurality of normal data inputting/outputting units configured to respectively input/output data from the normal cell blocks in response to a first input/output strobe signal, a redundancy data inputting/outputting unit configured to input/output data from the redundancy cell block in response to the first input/output strobe signal, and a connection selecting unit configured to selectively connect the normal data inputting/outputting units and the redundancy data inputting/outputting unit to a plurality of local data lines in response to a address.
摘要:
A semiconductor memory device includes a reference strobe signal generator configured to generate a reference strobe signal having a reference pulse width in response to a bank information signal and a column command signal, and a main strobe signal generator configured to generate a main strobe signal by controlling the reference pulse width in response to the reference strobe signal and a bank grouping signal that is activated in a bank grouping mode where columns are continuously accessed in a plurality of logically grouped banks.
摘要:
A column decoder includes: a plurality of main decoding units coupled to different memory banks that decode a pre-decoding signal and output column selection signals to the corresponding memory banks; and one or more pre-decoders, having a lesser number than the main decoders, which generates and outputs the pre-decoding signal by decoding the column address and the bank information signal.
摘要:
A semiconductor memory apparatus includes a main bank configured to combine a first sub bank and a second sub bank. A center bitline sense amplifier array is arranged in a region where the first sub bank meets the second sub bank. A first precharge section is arranged above the first sub bank and a second precharge section is arranged below the second sub bank. The first precharge section precharges local input/output lines of the first sub bank and the second sub bank and the second precharge section precharges the local input/output lines.
摘要:
In a memory device that operates at high speed, a bit-line sense amplifier driver is provided to overdrive a sense amplifier in a refresh mode. A bit-line sense amplifier driver includes a refresh overdriving control unit that is coupled to an external power supply terminal and a sense amplifier power line signal output terminal, and driven by a refresh flag signal and a sense amplifier power line enable signal to apply an external supply voltage to the sense amplifier power line signal output terminal in a refresh mode.Therefore, it is possible to prevent a driving voltage from serving as noise, which hinders the high speed operation of the memory device.
摘要:
The present invention relates to a semiconductor memory device with a fixed burst length, including a column control circuit, the semiconductor memory device including: a command decoder decoding external commands to be output as an internal command with fixed burst length information; a column controlling unit giving a bank address to the internal command to be output as a column control signal; and a bank controlling a read and write operation corresponding to the fixed burst length in accordance with on the column control signal.
摘要:
In a memory device that operates at high speed, a bit-line sense amplifier driver is provided to overdrive a sense amplifier in a refresh mode. A bit-line sense amplifier driver includes a refresh overdriving control unit that is coupled to an external power supply terminal and a sense amplifier power line signal output terminal, and driven by a refresh flag signal and a sense amplifier power line enable signal to apply an external supply voltage to the sense amplifier power line signal output terminal in a refresh mode. Therefore, it is possible to prevent a driving voltage from serving as noise, which hinders the high speed operation of the memory device.