Abstract:
A metal oxide semiconductor structure and a production method thereof, the structure including: a substrate; a gate electrode, deposited on the substrate; a gate insulation layer, deposited over the gate electrode and the substrate; an IGZO layer, deposited on the gate insulation layer and functioning as a channel; a source electrode, deposited on the gate insulation layer and being at one side of the IGZO layer; a drain electrode, deposited on the gate insulation layer and being at another side of the IGZO layer; a first passivation layer, deposited over the source electrode, the IGZO layer, and the drain electrode; a second passivation layer, deposited over the first passivation layer; and an opaque resin layer, deposited over the source electrode, the second passivation layer, and the drain electrode.
Abstract:
A driving circuit with reduced power consumption and a liquid crystal display using the same. The driving circuit includes at least a power circuit, a source driver and a VCOM driver. The power circuit is coupled to a power supply to receive a power signal to generate a positive supply voltage and an inverted power signal. The source driver includes a first source operational amplifier. The first source operational amplifier is powered by the positive supply voltage and a power ground, to couple a positive polarity display voltage to a first terminal of a first display capacitor of a pixel array. The VCOM driver includes a VCOM operational amplifier. The VCOM operational amplifier provides a second terminal of the first display capacitor with a VCOM voltage, and a negative power terminal of the VCOM operational amplifier is coupled to the inverted power signal.
Abstract:
Rapid thermal annealing methods and systems for annealing patterned substrates with minimal pattern effect on substrate temperature non-uniformity are provided. The rapid thermal annealing system includes a front-side heating source and a backside heating source. The backside heating source of the rapid thermal annealing system supplies a dominant amount of heat to bring the substrate temperature to the peak annealing temperature. The front-side heating source contributes to heat up the environment near the front-side of the substrate to a temperature lower than about 100° C. to about 200° C. less than the peak annealing temperature. The asymmetric front-side and backside heating for rapid thermal annealing reduce or eliminate pattern effect and improve WIW and WID device performance uniformity.
Abstract:
A housing for an electronic device is disclosed, the housing comprises a base layer and a transparent film layer overlapped in the base layer, the film layer includes an inner surface abutting the base layer and an outer surface having ridges protruding thereform. The housing is formed by injection molding a molten plastic material over the transparent film layer, the ridges are formed on the transparent film layer by the molten plastic pressing the transparent film layer in injection molding. It is also disclosed a mold for making the housing and a method to make the housing.
Abstract:
The present disclosure provides a high surface dopant concentration semiconductor device and method of fabricating. In an embodiment, a method of forming the semiconductor device includes providing a substrate, forming a doped region in the substrate, forming a stressing layer over the doped region, performing a boron (B) doping implant to the stressing layer, annealing the B doping implant, and after annealing the B doping implant, forming a silicide layer over the stressing layer.
Abstract:
An integrated circuit device and method for manufacturing the integrated circuit device are disclosed. An exemplary method includes providing a substrate; forming a first gate over the substrate for a first device having a first threshold voltage characteristic, the first gate including a first material having a first-type work function; forming a second gate over the substrate for a second device having a second threshold voltage characteristic that is greater than the first threshold voltage characteristic, the second gate including a second material having a second-type work function that is opposite the first-type work function; and configuring the first device and the second device as a same channel type device.
Abstract:
A method of forming an integrated circuit includes providing a semiconductor wafer including a semiconductor fin dispatched on a surface of the semiconductor wafer; forming a dopant-rich layer having an impurity on a top surface and sidewalls of the semiconductor fin, wherein the impurity is of n-type or p-type; performing a knock-on implantation to drive the impurity into the semiconductor fin; and removing the dopant-rich layer.
Abstract:
A display panel is used with an image display system. The display panel includes a light-transmissive substrate, a gate insulating layer, a gate conductor, a first light-shielding structure, a channel layer and a second light-shielding structure. The gate insulating layer is formed over the light-transmissive substrate. The gate conductor and the first light-shielding structure are made of the same material, formed over the gate insulating layer, and electrically isolated from each other. The first light-shielding structure has a hollow portion. The channel layer and the second light-shielding structure made of the same material and formed over the light-transmissive substrate but under the gate insulating layer. The second light-shielding structure is disposed under the hollow portion of the first light-shielding structure.
Abstract:
An image sensing module includes a printed circuit board, an image sensor, and a color filter exchanging system. The image sensor positioned between the printed circuit board and the color filter exchanging system is assembled on the printed circuit board. The color filter exchanging system aligning with the image sensor fastens to the printed circuit board. The color filter exchanging system includes a stand, a driving module and a filter assembly. The stand fastening to the printed circuit board defines an opening revealing the image sensor. The driving module slides the filter assembly within the stand. The filter assembly includes a frame and a visible light bandpass filter and an infrared bandpass filter assembled to the frame. In different modes, the driving module drives the filter assembly so that the visible light bandpass filter or the infrared bandpass filter aligns with the image sensor by way of the opening.
Abstract:
The present invention provides an environmental friendly brass alloy, including 0.4 to 0.8 wt % of aluminum; 0.6 to 1.6 wt % of nickel; 0.8 to 2.0 wt % of tin; more than 95.6 wt % of copper and zinc; and less than 0.1 wt % of iron, lead, phosphorous and impurities, wherein the copper is present in an amount ranging from 60 to 68 wt %.