摘要:
A block decoding circuit of a semiconductor memory device includes a plurality of block decoders, a plurality of repair address check circuits, a dummy repair address check circuit and a block selection signal generation circuit. The plurality of block decoders are configured to decode a received block selection address. The plurality of repair address check circuits are configured to generate second output signals based on whether a received block selection address and word line selection address are repair addresses. The dummy repair address check circuit is configured to generate a control signal in response to the block selection address and the word line selection address. The block selection signal generation circuit is configured to generate block selection signals based on the first output signals from the plurality of block decoders, the control signal from the dummy repair address circuit, and the second output signals from the repair address check circuits.
摘要:
A semiconductor device includes a comparator, an internal voltage generator, a control signal generator, and a selector. The comparator may compare a reference voltage to an internal voltage and output a comparison signal. The internal voltage generator may generate and output the internal voltage in response to the comparison signal. The control signal generator may generate a control signal. The selector may receive first and second target voltages, and select and output one of the first and second target voltages as the reference voltage in response to the control signal.
摘要:
Disclosed herein are an electrode connector including a conductive wire and a plurality of plates mounted on the wire such that the plates can be electrically connected to electrodes of cells, wherein the plates are electrically connected to the wire in a structure in which the plates are coupled to the wire by clamping, and a surface (A) of each plate contacting the wire is plated with the same metal (a) as the wire while a surface (B) of each plate connected to the corresponding electrode of each cell is plated with the same metal (b) as the corresponding electrode of each cell, and a battery module constructed with the electrode connector.
摘要:
A method and apparatus for controlling a power-down mode of a delay locked loop (DLL), in which the apparatus includes a first switch unit, a DLL, and a second switch unit. The first switch unit transfers a first clock signal in response to a clock input enable signal. The DLL receives the first clock signal through the first switch unit to generate a second clock signal and is turned off by a power-down signal that is generated from the first clock signal latched by the first switch unit. The second switch unit transfers the second clock signal in response to a clock output enable signal. In a power-down mode, the clock input enable signal is deactivated in response to a clock enable signal and the clock output enable signal is deactivated after a predetermined number of clock cycles that are necessary for the latched first clock signal to be completely transferred through the delay cells of the DLL to an output terminal of the DLL. In a power-down exit mode, the power-down signal is deactivated in response to the clock enable signal and the clock input enable signal and the clock output enable signal are activated after a predetermined number of clock cycles that are necessary for the latched second clock signal to be completely transferred through the delay cells of the DLL to the output terminal of the DLL.
摘要:
A semiconductor memory device includes a command buffer that receives an external command and outputs a first command signal, a clock buffer that receives an external clock signal and outputs a first internal clock signal, a delay measurement and initialization unit that receives the first internal clock signal and a fourth internal clock signal and responsively outputs a second internal clock signal and a plurality of delayed signals corresponding to a delay time between when the external clock signal is input and data is output, a delay locked loop that receives the second internal clock signal and outputs a third internal clock signal and the fourth internal clock signal, a latency signal generation unit that delays the first command signal by a delay time between when the second internal clock signal is input to the delay locked loop and when the third internal clock signal is output from the delay locked loop, and then outputs the delayed first command signal as a latency signal, in response to the second and third internal clock signals and the delayed signals, and a data output buffer that outputs the data in response to the latency signal and the third internal clock signal.