公开(公告)号：US20170310947A1

公开(公告)日：2017-10-26

申请号：US15593313

申请日：2017-05-11

Applicant: INTEL CORPORATION

Inventor： Ron Kimmel ,  Barak Freedman ,  Alex Bronstein ,  Michael Bronstein ,  Sagi Ben Moshe

IPC: H04N13/02 ,  G06T7/521 ,  H04N5/357 ,  G06T7/80 ,  H04N5/33 ,  H04N5/225 ,  H04N13/00

CPC classification number: H04N13/246 ,  G06T7/521 ,  G06T7/80 ,  G06T2207/10024 ,  G06T2207/10028 ,  G06T2207/10048 ,  H04N5/2256 ,  H04N5/33 ,  H04N5/332 ,  H04N5/357 ,  H04N13/167 ,  H04N13/239 ,  H04N13/25 ,  H04N13/254 ,  H04N13/296

Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.

公开(公告)号：US09794545B2

公开(公告)日：2017-10-17

申请号：US14865211

申请日：2015-09-25

Applicant: Intel Corporation

Inventor： Alex Bronstein ,  Aviad Zabatani ,  Ron Kimmel ,  Michael Bronstein ,  Erez Sperling ,  Vitaly Surazhsky

IPC: H04N13/02 ,  G06T7/00 ,  H04N13/00

CPC classification number: H04N13/246 ,  G01B11/2504 ,  G01B11/2545 ,  G06T7/521 ,  G06T7/529 ,  H04N13/111 ,  H04N13/243 ,  H04N13/25 ,  H04N13/254

Abstract: A method and apparatus for performing a single view depth and texture calibration are described. In one embodiment, the apparatus comprises a calibration unit operable to perform a single view calibration process using a captured single view a target having a plurality of plane geometries having detectable features and being at a single orientation and to generate calibration parameters to calibrate one or more of the projector and multiple cameras using the single view of the target.

公开(公告)号：US20170091917A1

公开(公告)日：2017-03-30

申请号：US14865201

申请日：2015-09-25

Applicant: INTEL CORPORATION

Inventor： Michael Bronstein ,  Zachi Karni ,  Alex Bronstein ,  Ron Kimmel ,  Erez Sperling ,  Aviad Zabatani ,  Vitaly Surazhsky

IPC: G06T5/20 ,  H04N13/02 ,  G06T7/00

CPC classification number: G06T5/20 ,  G06K9/40 ,  G06T5/002 ,  G06T2207/10028 ,  G06T2207/20028 ,  H04N13/204

Abstract: A mechanism is described for facilitating depth image dequantization at computing devices according to one embodiment. A method of embodiments, as described herein, includes detecting a digital image of an object, the digital image including pixels having associated pixel values contaminated by noise, and side information pertaining to confidence of a value acquired in each pixel. The method may further include measuring characteristics of noise in each pixel of the digital image, and a plurality of weights relating to one or more of the pixel values, the side information, and the noise characteristics. The method may further include computing a smart filter based on a combination of the plurality of weights, applying the smart filter to filter the digital image by reducing the noise in the digital image, and outputting the filtered digital image.

公开(公告)号：US20160373727A1

公开(公告)日：2016-12-22

申请号：US15251578

申请日：2016-08-30

Applicant: INTEL CORPORATION

Inventor： Ron Kimmel ,  Barak Freedman ,  Alex Bronstein ,  Michael Bronstein ,  Sagi Ben Moshe

IPC: H04N13/02 ,  H04N13/00

CPC classification number: H04N13/246 ,  G06T7/521 ,  G06T7/80 ,  G06T2207/10024 ,  G06T2207/10028 ,  G06T2207/10048 ,  H04N5/2256 ,  H04N5/33 ,  H04N5/332 ,  H04N5/357 ,  H04N13/167 ,  H04N13/239 ,  H04N13/25 ,  H04N13/254 ,  H04N13/296

Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.

公开(公告)号：US20150172635A1

公开(公告)日：2015-06-18

申请号：US14104242

申请日：2013-12-12

Applicant: Intel Corporation

Inventor： Ron Kimmel ,  Barak Freedman ,  Alex Bronstein ,  Michael Bronstein ,  Sagi Ben Moshe

IPC: H04N13/02 ,  H04N5/357 ,  G06T7/00 ,  G01B11/25

CPC classification number: H04N13/246 ,  G06T7/521 ,  G06T7/80 ,  G06T2207/10024 ,  G06T2207/10028 ,  G06T2207/10048 ,  H04N5/2256 ,  H04N5/33 ,  H04N5/332 ,  H04N5/357 ,  H04N13/167 ,  H04N13/239 ,  H04N13/25 ,  H04N13/254 ,  H04N13/296

Abstract: Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.

Abstract translation: 本公开的实施例提供了用于校正图像失真的光电三维物体采集组件的技术和配置。 在一个实例中，组件可以包括被配置成以确定的角度将光图案投射在物体上的第一装置; 第二装置，被配置为捕获被投射的光图案照射的对象的第一图像; 被配置为捕获所述对象的第二图像的第三设备; 以及控制器，其耦合到所述第一，第二和第三设备，并且被配置为根据从所述第一图像获得的对象的几何参数重建所述对象的图像，并且校正由所确定的角度的变化引起的所述重建图像中的失真 至少部分地基于对象的第一和第二图像。 可以描述和/或要求保护其他实施例。