Abstract:
A power control circuit for an integrated circuit module includes at least one switch device coupled between a supply voltage and a node of the integrated circuit module; and a switch control module having a first terminal coupled to the switch device and a second terminal coupled to the node of the integrated circuit module for controlling the switch device to pass the supply voltage to the node with or without a substantial voltage drop depending on an operation mode of the integrated circuit module, the switch control module having at least one capacitor for selectively discharging the node, thereby creating the substantial voltage drop for the supply voltage across the switch device.
Abstract:
A fuse detection circuit has; a fuse (102) under detection to produce a first voltage in the first arm in response to a read signal; a reference fuse (108) to produce a second voltage in response to the read signal; a sensing circuit (124) to sense the first voltage and the second voltage as status value data of the fuse under detection; a latch circuit (136) to keep the data in the sensing circuit; and a timing control circuit (138) to turn off the fuse bridge circuit independently of the read signal.
Abstract:
A digital memory element has a sense circuit latch to read the value stored in a bit cell. Before addressing a word line, the bit lines are precharged. During the read operation, a bit line is coupled to a supply voltage through a bit cell memory element that has different resistances at logic states “0” and “1.” A reference bit line is coupled to the supply voltage through a comparison resistance value, especially a resistance between high and low resistance of the memory element in the two logic states. Voltages on the bit line and reference bit line ramp toward a switching threshold at rates related to the resistance values. The first line to discharge to switching threshold voltage sets the sense circuit latch.
Abstract:
A circuit includes a reference data line configured to receive a reference voltage value, a memory cell, a data line coupled to the memory cell and configured to have a data logic value associated with data stored in the memory cell, a first circuit coupled to the reference data line and to the data line, and an output node configured to selectively receive the data logic value from the data line or receive the data logic value through the first circuit, based on the reference voltage value and a trip point used to trigger the first circuit to provide the data logic value through the first circuit.
Abstract:
A differential read write back sense amplifier circuit and corresponding methods. A memory array comprises a plurality of memory cells arranged in rows and columns; a plurality of read word lines coupled to the memory cells; a plurality of write word lines coupled to the memory cells arranged along rows of the memory array; a plurality of read bit line pairs coupled to the memory cells arranged in columns; a plurality of write bit line pairs coupled to the memory cells arranged in columns; and at least one differential read write back sense amplifier coupled to a read bit line pair and coupled to a write bit line pair corresponding to one of the columns of memory cells, configured to differentially sense small signal read data on the read bit line pair, and output the sensed data onto the write bit line pair. Corresponding methods are disclosed.
Abstract:
This invention discloses a static random access memory (SRAM) cell comprising a pair of cross-coupled inverters having a storage node, and a NMOS transistor having a gate terminal, a first and a second source/drain terminal connected to the storage node, a read word-line (RWL) and a read bit-line (RBL), respectively, the RWL and RBL being activated during a read operation and not being activated during any write operation.