Terahertz-wave spectrometer and prism member
    47.
    发明授权
    Terahertz-wave spectrometer and prism member 有权
    太赫兹波谱仪和棱镜成员

    公开(公告)号:US09080913B2

    公开(公告)日:2015-07-14

    申请号:US14005849

    申请日:2012-02-21

    CPC classification number: G01J3/42 G01J3/0205 G01N21/3581 G01N21/552

    Abstract: By mating a main part with a first prism part or second prism part, a terahertz-wave spectrometer can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism. When the main part mates with the first prism part, the terahertz wave T incident on an entrance surface passes through a depression, so as to be reflected by an arrangement part, whereby reflection spectrometry can be performed. When the main part mates with the second prism part, the terahertz wave T incident on the entrance surface is refracted by the depression, so as to pass through an object to be measured within a groove, whereby transmission spectrometry can be preformed.

    Abstract translation: 通过将主要部分与第一棱镜部分或第二棱镜部分配合,太赫兹波谱仪可以容易地在分光棱镜内传播的太赫兹波T的光路之间切换。 当主体与第一棱镜部分配合时,入射表面上的太赫兹波T穿过凹陷,以便被布置部反射,从而可以进行反射光谱测定。 当主要部分与第二棱镜部分配合时,入射表面上的太赫兹波T被凹陷折射,以便在沟槽内通过待测物体,从而可进行透射光谱测定。

    Optical system for laser optical rectification and wave front control
    48.
    发明授权
    Optical system for laser optical rectification and wave front control 有权
    激光光学整流和波前控制光学系统

    公开(公告)号:US08810890B2

    公开(公告)日:2014-08-19

    申请号:US13809468

    申请日:2011-07-13

    Abstract: A laser light shaping and wavefront controlling optical system 1 in accordance with an embodiment of the present invention comprises an intensity conversion lens 24 for converting and shaping an intensity distribution of laser light incident thereon into a desirable intensity distribution; an optical modulation device 34 for modulating the laser light emitted from the intensity conversion lens 24 so as to control a wavefront thereof; a condenser optical system 36 for converging the laser light issued from the optical modulation device 34; and an image-forming optical system 30, arranged between the optical modulation device 34 and the condenser optical system 36, having an entrance-side imaging plane between a plane 24x where the laser light emitted from the intensity conversion lens 24 attains the desirable intensity distribution and a modulation plane 34a of the optical modulation device 34 and an exit-side imaging plane on a pupil plane 36a of the condenser optical system 36.

    Abstract translation: 根据本发明的实施例的激光成形和波前控制光学系统1包括:强度转换透镜24,用于将入射到其上的激光的强度分布转换和成形为期望的强度分布; 用于调制从强度转换透镜24发射的激光以控制其波前的光调制装置34; 用于会聚从光调制装置34发出的激光的聚光光学系统36; 以及配置在光调制装置34和聚光光学系统36之间的成像光学系统30,其具有在从强度转换透镜24发射的激光达到所需强度分布的平面24x之间的入射侧成像面 以及光调制装置34的调制面34a和聚光镜36的光瞳面36a的出射侧成像面。

    Casing Projections of an Image Forming Apparatus Configured to Support a Seal of a Developing Device
    49.
    发明申请
    Casing Projections of an Image Forming Apparatus Configured to Support a Seal of a Developing Device 有权
    配置为支持显影装置的密封的图像形成装置的套管突出

    公开(公告)号:US20140105635A1

    公开(公告)日:2014-04-17

    申请号:US14136609

    申请日:2013-12-20

    CPC classification number: G03G15/0898 G03G15/0817 G03G2215/0614

    Abstract: A developing device for an image forming apparatus may include a seal and a casing to prevent leakage of developer. In some examples, the seal member may include multiple side surfaces while the casing may include projections that may abut and contact various surfaces of the seal member. According to one arrangement, the casing may include first, second and third protrusions, where each protrusion is configured to abut and contact a corresponding surface of the seal member. Additionally, the second projection may protrude in a position inside of the first projection while the third projection may protrude in a position between the first and second projections.

    Abstract translation: 用于图像形成装置的显影装置可以包括密封件和用于防止显影剂泄漏的外壳。 在一些示例中,密封构件可以包括多个侧表面,而壳体可以包括可以邻接和接触密封构件的各个表面的突起。 根据一种布置,壳体可以包括第一,第二和第三突起,其中每个突起被构造成抵靠和接触密封构件的相应表面。 此外,第二突起可以在第一突起内部的位置突出,而第三突起可以在第一和第二突起之间的位置突出。

    TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
    50.
    发明申请
    TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD 审中-公开
    总反射光谱测量方法

    公开(公告)号:US20140008541A1

    公开(公告)日:2014-01-09

    申请号:US14005863

    申请日:2012-02-28

    CPC classification number: G01J3/42 G01N21/3577 G01N21/3581 G01N21/552

    Abstract: A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34.

    Abstract translation: 使用全反射光谱仪1的全反射测量方法是全反射测量方法,包括在内部全反射棱镜31的全反射表面31c上布置被测物体,并根据太赫兹测量关于物体34的光常数 在通过棱镜31之后,由全反射面31c全反射的波形,其中不能溶解物体34的液体50至少插入在全反射面31c和物体34之间。诸如作用在物体34之间的粘附力的力 液体50和物体34可以使物体34更靠近全反射面31c,从而稳定地产生ev逝部件与物体34之间的相互作用。

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