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公开(公告)号:US11900026B1
公开(公告)日:2024-02-13
申请号:US16393654
申请日:2019-04-24
Applicant: X Development LLC
Inventor: Martin Schubert , Brian Adolf , Jesse Lu
IPC: G06F30/20 , G06N3/084 , G06N3/045 , G06F30/27 , G06F30/23 , G06F111/04 , G06F119/18 , G06F119/22 , G02B5/02
CPC classification number: G06F30/20 , G06N3/045 , G06N3/084 , G02B5/0268 , G06F30/23 , G06F30/27 , G06F2111/04 , G06F2119/18 , G06F2119/22 , Y02P90/02
Abstract: A computer-implemented method for modeling fabrication constraints of a fabrication process is described. The method includes receiving training data including pre-fabrication structures and post-fabrication, training a fabrication constraint model by optimizing parameters of the fabrication constraint model based on the training data to model the fabrication constraints of the fabrication process, receiving an input design corresponding to a physical device, and generating a fabricability metric of the input design via the fabrication constraint model. The fabricability metric is related to a probabilistic certainty that the input design is fabricable by the fabrication process determined by the fabrication constraint model.
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公开(公告)号:US11727171B2
公开(公告)日:2023-08-15
申请号:US17037226
申请日:2020-09-29
Applicant: X Development LLC
Inventor: Martin Schubert , David Alexander
IPC: G06F30/20
CPC classification number: G06F30/20
Abstract: In some embodiments, techniques for creating a fabricable segmented design for a physical device are provided. A computing system receives a design specification. The computing system generates a proposed segmented design based on the design specification. The computing system determines one or more fabricable segmented designs based on the proposed segmented design. The computing system determines an overall fabrication loss value based on the one or more fabricable segmented designs. The computing system backpropagates a gradient of the overall fabrication loss value to create an updated design specification.
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公开(公告)号:US20230252201A1
公开(公告)日:2023-08-10
申请号:US17667307
申请日:2022-02-08
Applicant: X Development LLC
IPC: G06F30/20
CPC classification number: G06F30/20 , G06F2113/10
Abstract: Techniques for optimizing a design for a physical device to be fabricated by a fabrication system are disclosed. A computing system receives an initial design of the physical device. The computing system simulates fabrication of the physical device using a fabrication model associated with the fabrication system to determine predicted structural parameters. The computing system determines a gradient of the fabrication model based on an estimator. The computing system backpropagates the gradient of the fabrication model to update the predicted structural parameters and thereby generate updated structural parameters. The computing system backpropagates a gradient associated with the updated structural parameters to update the initial design and thereby generate an updated initial design. In some embodiments, the updated initial design is transmitted to the fabrication system for fabrication of the physical device.
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公开(公告)号:US11703640B2
公开(公告)日:2023-07-18
申请号:US17490622
申请日:2021-09-30
Applicant: X Development LLC
Inventor: Martin Schubert , Brian Adolf , Jesse Lu
CPC classification number: G02B6/12007 , G02B6/12004 , G06F30/23
Abstract: A two-channel photonic demultiplexer includes an input region to receive a multi-channel optical signal, two output regions, each adapted to receive a corresponding one of two distinct wavelength channels demultiplexed from the multi-channel optical signal, and a dispersive region including a first material and a second material inhomogeneously interspersed to form a plurality of interfaces that collectively structure the dispersive region to optically separate each of the two distinct wavelength channels from the multi-channel optical signal and respectively guide the first distinct wavelength channel to a first output region and the second distinct wavelength channel to the second output region when the input region receives the multi-channel optical signal. At least one of the first material or the second material is structured within the dispersive region to be schematically reproducible by a feature shape with a pre-determined width.
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45.
公开(公告)号:US20230185987A1
公开(公告)日:2023-06-15
申请号:US17551514
申请日:2021-12-15
Applicant: X Development LLC
Inventor: Ardavan Oskooi , Martin Schubert , Cyril Pierre Bortolato
IPC: G06F30/20
CPC classification number: G06F30/20
Abstract: In some embodiments, a non-transitory computer-readable medium is provided. The computer-readable medium has logic stored thereon that, in response to execution by one or more processors of a computing system, cause the computing system to perform actions for deriving a fabrication model for a fabrication system using an inverse design process. The actions include determining a test design for a test physical device, measuring performance of an instance of the test physical device fabricated by the fabrication system using the test design to determine an as-fabricated performance metric, optimizing the test design using a first loss function based on differences in a simulated performance metric of the test design and the as-fabricated performance metric to determine an as-fabricated design, and optimizing a fabrication model using a second loss function based on differences between the test design and the as-fabricated design.
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46.
公开(公告)号:US11630932B2
公开(公告)日:2023-04-18
申请号:US17036722
申请日:2020-09-29
Applicant: X Development LLC
Inventor: Martin Schubert
IPC: G06F30/23 , G06F111/08 , G02B27/00 , G06F30/10 , G06F119/18 , G06F111/06
Abstract: A method of creating a fabricable segmented design for a physical device is provided. A computing system receives a design specification. The computing system optimizes an initial segmented design based on the design specification to create an improved segmented design. The computing system perturbs the improved segmented design to create a perturbed segmented design. The computing system optimizes the perturbed segmented design to create a second improved segmented design.
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47.
公开(公告)号:US20220077948A1
公开(公告)日:2022-03-10
申请号:US17529112
申请日:2021-11-17
Applicant: X Development LLC
Inventor: Jesse Lu , Brian Adolf , Martin Schubert
IPC: H04J14/02 , H04B10/073 , G06N3/08 , G05B19/4097
Abstract: Embodiments of techniques for inverse design of physical devices are described herein, in the context of generating designs for photonic integrated circuits (including a multi-channel photonic demultiplexer). In some embodiments, an initial design of the physical device is received, and a plurality of sets of operating conditions for fabrication of the physical device are determined. In some embodiments, the performance of the physical device as fabricated under the sets of operating conditions is simulated, and a total performance loss value is backpropagated to determine a gradient to be used to update the initial design. In some embodiments, instead of simulating fabrication of the physical device under the sets of operating conditions, a robustness loss is determined and combined with the performance loss to determine the gradient.
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48.
公开(公告)号:US11196503B2
公开(公告)日:2021-12-07
申请号:US16796660
申请日:2020-02-20
Applicant: X Development LLC
Inventor: Jesse Lu , Brian Adolf , Martin Schubert
IPC: H04B10/07 , H04J14/02 , H04B10/073 , G06N3/08 , G05B19/4097 , G06F30/20 , H04J14/00 , H04B10/079
Abstract: Embodiments of techniques for inverse design of physical devices are described herein, in the context of generating designs for photonic integrated circuits (including a multi-channel photonic demultiplexer). In some embodiments, an initial design of the physical device is received, and a plurality of sets of operating conditions for fabrication of the physical device are determined. In some embodiments, the performance of the physical device as fabricated under the sets of operating conditions is simulated, and a total performance loss value is backpropagated to determine a gradient to be used to update the initial design. In some embodiments, instead of simulating fabrication of the physical device under the sets of operating conditions, a robustness loss is determined and combined with the performance loss to determine the gradient.
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公开(公告)号:US11187854B2
公开(公告)日:2021-11-30
申请号:US16685473
申请日:2019-11-15
Applicant: X Development LLC
Inventor: Martin Schubert , Brian Adolf , Jesse Lu
Abstract: A two-channel photonic demultiplexer includes an input region to receive a multi-channel optical signal, two output regions, each adapted to receive a corresponding one of two distinct wavelength channels demultiplexed from the multi-channel optical signal, and a dispersive region including a first material and a second material inhomogeneously interspersed to form a plurality of interfaces that collectively structure the dispersive region to optically separate each of the two distinct wavelength channels from the multi-channel optical signal and respectively guide the first distinct wavelength channel to a first output region and the second distinct wavelength channel to the second output region when the input region receives the multi-channel optical signal. At least one of the first material or the second material is structured within the dispersive region to be schematically reproducible by a feature shape with a pre-determined width.
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50.
公开(公告)号:US20210266088A1
公开(公告)日:2021-08-26
申请号:US16796660
申请日:2020-02-20
Applicant: X Development LLC
Inventor: Jesse Lu , Brian Adolf , Martin Schubert
IPC: H04J14/02 , H04B10/073 , G05B19/4097 , G06N3/08
Abstract: Embodiments of techniques for inverse design of physical devices are described herein, in the context of generating designs for photonic integrated circuits (including a multi-channel photonic demultiplexer). In some embodiments, an initial design of the physical device is received, and a plurality of sets of operating conditions for fabrication of the physical device are determined. In some embodiments, the performance of the physical device as fabricated under the sets of operating conditions is simulated, and a total performance loss value is backpropagated to determine a gradient to be used to update the initial design. In some embodiments, instead of simulating fabrication of the physical device under the sets of operating conditions, a robustness loss is determined and combined with the performance loss to determine the gradient.
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