公开(公告)号：US20170201739A1

公开(公告)日：2017-07-13

申请号：US15470541

申请日：2017-03-27

Applicant: Texas Instruments Incorporated

Inventor： Vikram VijayanBabu Appia

IPC: H04N13/02

CPC classification number: H04N13/254 ,  G01B11/2513 ,  G06T7/40 ,  G06T7/521 ,  G06T2207/20016 ,  H04N13/271 ,  H04N2013/0081

Abstract: A method of image processing in a structured light imaging device is provided that includes receiving a captured image of a scene, wherein the captured image is captured by a camera of a projector-camera pair in the structured light imaging system, and wherein the captured image includes a pre-determined hierarchical binary pattern projected into the scene by the projector, wherein the pre-determined hierarchical binary pattern was formed by iteratively scaling a lower resolution binary pattern to multiple successively higher resolutions, rectifying the captured image to generated a rectified captured image, extracting a binary image from the rectified captured image at full resolution and at each resolution used to generate the pre-determined hierarchical binary pattern, and using the binary images to generate a depth map of the captured image.

公开(公告)号：US09609306B2

公开(公告)日：2017-03-28

申请号：US14312549

申请日：2014-06-23

Applicant: Texas Instruments Incorporated

Inventor： Vikram VijayanBabu Appia

IPC: H04N13/00 ,  H04N13/02 ,  G01B11/25 ,  G06T7/00 ,  G06T7/40

CPC classification number: H04N13/254 ,  G01B11/2513 ,  G06T7/40 ,  G06T7/521 ,  G06T2207/20016 ,  H04N13/271 ,  H04N2013/0081

Abstract: A method of image processing in a structured light imaging device is provided that includes receiving a captured image of a scene, wherein the captured image is captured by a camera of a projector-camera pair in the structured light imaging system, and wherein the captured image includes a pre-determined hierarchical binary pattern projected into the scene by the projector, wherein the pre-determined hierarchical binary pattern was formed by iteratively scaling a lower resolution binary pattern to multiple successively higher resolutions, rectifying the captured image to generated a rectified captured image, extracting a binary image from the rectified captured image at full resolution and at each resolution used to generate the pre-determined hierarchical binary pattern, and using the binary images to generate a depth map of the captured image.

公开(公告)号：US20160116573A1

公开(公告)日：2016-04-28

申请号：US14857000

申请日：2015-09-17

Applicant: Texas Instruments Incorporated

Inventor： Vikram VijayanBabu Appia ,  Dan Wang

IPC: G01S7/40 ,  H01Q15/18 ,  G01S13/86

CPC classification number: G01S7/40 ,  G01S7/4026 ,  G01S13/867 ,  G01S13/931 ,  G01S2007/403 ,  G01S2007/4034 ,  G01S2013/9375 ,  G01S2013/9378 ,  G01S2013/9385 ,  H01Q15/18

Abstract: A method of generating an alignment matrix for a camera-radar system includes: receiving radar data originated by a radar subsystem and representative of an area of interest within a field of view for the radar subsystem; receiving image data originated by a camera subsystem and representative of the area of interest within a field of view for the camera subsystem; processing the radar data to detect features within the area of interest and to determine a reflected radar point with three dimensions relating to a camera-radar system; processing the image data to detect features within the area of interest and to determine a centroid with two dimensions relating to the camera-radar system; and computing an alignment matrix for radar and image data from the camera-radar system based on a functional relationship between the three dimensions for the reflected radar point and the two dimensions for the centroid.

Abstract translation: 一种生成相机 - 雷达系统的对准矩阵的方法包括：从雷达子系统接收由雷达子系统发起的雷达数据，并代表雷达子系统的视野范围内的感兴趣区域; 接收由照相机子系统发起的图像数据，并代表照相机子系统的视野范围内的感兴趣区域; 处理雷达数据以检测感兴趣区域内的特征，并确定具有与摄像机雷达系统有关的三维的反射雷达点; 处理图像数据以检测感兴趣区域内的特征并且确定具有与摄像机 - 雷达系统相关的二维的质心; 并且基于反射雷达点的三维和质心的二维之间的功能关系，从相机雷达系统计算用于雷达和图像数据的对准矩阵。

公开(公告)号：US09256943B2

公开(公告)日：2016-02-09

申请号：US14228236

申请日：2014-03-27

Applicant: Texas Instruments Incorporated

Inventor： Vikram VijayanBabu Appia ,  Ibrahim Ethem Pekkucuksen

IPC: G06K9/00 ,  G06K9/32 ,  G06T7/00

CPC classification number: G06T7/0018 ,  G06T7/80

Abstract: A method of misalignment correction in a structured light device is provided that includes extracting features from a first captured image of a scene, wherein the first captured image is captured by an imaging sensor component of the structured light device, and wherein the first captured image includes a pattern projected into the scene by a projector component of the structured light device, matching the features of the first captured image to predetermined features of a pattern image corresponding to the projected pattern to generate a dataset of matching features, determining values of alignment correction parameters of an image alignment transformation model using the dataset of matching features, and applying the image alignment transformation model to a second captured image using the determined alignment correction parameter values.

Abstract translation: 提供了一种结构化光装置中的未对准校正方法，其包括从场景的第一拍摄图像中提取特征，其中第一拍摄图像由结构化光装置的成像传感器部件捕获，并且其中第一拍摄图像包括 通过结构化光装置的投影仪部件投影到场景中的图案，将第一拍摄图像的特征与对应于投影图案的图案图像的预定特征相匹配，以生成匹配特征的数据集，确定对准校正参数的值 使用匹配特征的数据集的图像对准变换模型，以及使用所确定的对准校正参数值将图像对准变换模型应用于第二捕获图像。

公开(公告)号：US20150022697A1

公开(公告)日：2015-01-22

申请号：US14318590

申请日：2014-06-28

Applicant: Texas Instruments Incorporated

Inventor： Vikram VijayanBabu Appia ,  Pedro Gelabert ,  Aziz Umit Batur

IPC: H04N9/31 ,  G02B26/08 ,  H04N5/262 ,  H04N5/222 ,  H04N5/74 ,  H04N5/232

CPC classification number: H04N9/317 ,  G02B7/32 ,  G02B7/36 ,  H04N9/3173 ,  H04N9/3194

Abstract: A method of automatically focusing a projector in a projection system is provided that includes projecting, by the projector, a binary pattern on a projection surface, capturing an image of the projected binary pattern by a camera synchronized with the projector, computing a depth map from the captured image, and adjusting focus of the projector based on the computed depth map.

Abstract translation: 提供一种将投影仪自动聚焦在投影系统中的方法，其包括通过投影仪将投影仪上的二进制图案投影到投影表面上，通过与投影仪同步的照相机捕获投影二进制图案的图像，从 捕获的图像，以及基于所计算的深度图调整投影仪的焦点。

公开(公告)号：US20140294290A1

公开(公告)日：2014-10-02

申请号：US14228236

申请日：2014-03-27

Applicant: Texas Instruments Incorporated

Inventor： Vikram VijayanBabu Appia ,  Ibrahim Ethem Pekkucuksen

IPC: G06T5/00 ,  G06T7/00

CPC classification number: G06T7/0018 ,  G06T7/80

Abstract: A method of misalignment correction in a structured light device is provided that includes extracting features from a first captured image of a scene, wherein the first captured image is captured by an imaging sensor component of the structured light device, and wherein the first captured image includes a pattern projected into the scene by a projector component of the structured light device, matching the features of the first captured image to predetermined features of a pattern image corresponding to the projected pattern to generate a dataset of matching features, determining values of alignment correction parameters of an image alignment transformation model using the dataset of matching features, and applying the image alignment transformation model to a second captured image using the determined alignment correction parameter values.

Abstract translation: 提供了一种结构化光装置中的未对准校正方法，其包括从场景的第一拍摄图像中提取特征，其中第一拍摄图像由结构化光装置的成像传感器部件捕获，并且其中第一拍摄图像包括 通过结构化光装置的投影仪部件投影到场景中的图案，将第一拍摄图像的特征与对应于投影图案的图案图像的预定特征相匹配，以生成匹配特征的数据集，确定对准校正参数的值 使用匹配特征的数据集的图像对准变换模型，以及使用所确定的对准校正参数值将图像对准变换模型应用于第二捕获图像。