摘要:
A measurement method and apparatus rely upon the coherent optical interference between a reference beam and a diffractionless sensing beam having an optical path length that has been disturbed. The interference pattern can be analyzed to determine a measurement parameter of the disturbance. The diffractionless beam is particularly a Bessel beam. Exemplary optical interferometer types including Mach-Zehnder, Michelson, Sagnac and Fabry-Perot include a Bessel beam generator to generate a diffractionless beam as the sensing optical beam and in some aspects the reference optical beam of the interferometer. The sensing optical beam propagates along a sensing optical beam path in free-space. The reference optical beam path may be a free-space medium or a material medium such as an optical fiber. The sensing optical beam path is subject to a disturbance manifested by the optical interference pattern between the sensing optical beam and the reference optical beam. Parameters of the disturbance, such as motion, acoustics, environmental conditions and others can be determined by analysis of the interference pattern.
摘要:
A system, apparatus and method for performing low coherence ranging of a sample with high transverse resolution and large depth of focus can be provided. For example, an optical ranging system including a light source can be used. Certain exemplary arrangement can be provided, e.g., a first arrangement for directing light from the light source to the sample, a second arrangement for directing reflected light from the sample to a detector, at least one detector, and a third arrangement for processing light data received by the detector and which generates an image can be utilized. Further, for example, an optical element can be provided which can have a transverse resolution defined as .Δris less than or equal to about μ5 m, and a depth of focus Δz of at least about 50 μm.
摘要:
In optical coherence tomography (OCT), Axial and lateral resolutions are determined by the source coherence length and numerical aperture of the sampling lens, respectively. While axial resolution can be improved using a broadband light source, there is a trade-off between lateral resolution and focusing depth when conventional optical elements are used. The incorporation of an axicon lens into the sample arm of the interferometer overcomes this limitation. Using an axicon lens with a top angle of 160 degrees, 10 μm or better-lateral resolution is maintained over a focusing depth of at least 6 mm. In addition to high lateral resolution, the focusing spot intensity is approximately constant over a greater depth range.
摘要:
A measurement method and apparatus rely upon the coherent optical interference between a reference beam and a diffractionless sensing beam having an optical path length that has been disturbed. The interference pattern can be analyzed to determine a measurement parameter of the disturbance. The diffractionless beam is particularly a Bessel beam. Exemplary optical interferometer types including Mach-Zehnder, Michelson, Sagnac and Fabry-Perot include a Bessel beam generator to generate a diffractionless beam as the sensing optical beam and in some aspects the reference optical beam of the interferometer. The sensing optical beam propagates along a sensing optical beam path in free-space. The reference optical beam path may be a free-space medium or a material medium such as an optical fiber. The sensing optical beam path is subject to a disturbance manifested by the optical interference pattern between the sensing optical beam and the reference optical beam. Parameters of the disturbance, such as motion, acoustics, environmental conditions and others can be determined by analysis of the interference pattern.
摘要:
In optical coherence tomography (OCT), Axial and lateral resolutions are determined by the source coherence length and numerical aperture of the sampling lens, respectively. While axial resolution can be improved using a broadband light source, there is a trade-off between lateral resolution and focusing depth when conventional optical elements are used. The incorporation of an axicon lens into the sample arm of the interferometer overcomes this limitation. Using an axicon lens with a top angle of 160 degrees, 10 nullm or better-lateral resolution is maintained over a focusing depth of at least 6 mm. In addition to high lateral resolution, the focusing spot intensity is approximately constant over a greater depth range.