CROSSOVER TOOL, METHOD OF MAKING A CROSSOVER TOOL AND TWO PARTS OF A TWO-PART CROSSOVER TOOL
    61.
    发明申请
    CROSSOVER TOOL, METHOD OF MAKING A CROSSOVER TOOL AND TWO PARTS OF A TWO-PART CROSSOVER TOOL 审中-公开
    绞车工具,制造刀具刀具的方法和两部分刀具刀具的两个部件

    公开(公告)号:US20160084046A1

    公开(公告)日:2016-03-24

    申请号:US14490997

    申请日:2014-09-19

    CPC classification number: E21B43/045 E21B41/0078 E21B43/14 E21B43/26

    Abstract: A cross over tool includes, a first tubular forming part of a structure having a channel formed radially through a wall thereof and having a passageway formed longitudinally through the wall. The tool includes a second tubular forming part of a tool string, the second tubular is positionable radially of the first tubular, and has a port through a wall thereof, the port is alignable with the channel. The crossover tool is configured such that while the a port is aligned with the a channel fluid can flow through an inside of the tool string radially through the a port and the a channel and back into the inside of the tool string and through the a passageway and through an annular space defined between the tool string and the structure.

    Abstract translation: 交叉工具包括:第一管状形成部分,其具有径向形成通过壁的通道,并且具有纵向穿过壁形成的通道。 该工具包括第二管形成工具串的一部分,第二管状物可位于第一管状物的径向位置,并且具有通过其壁的端口,该端口可与通道对准。 交叉工具被构造成使得当端口与通道流体对准时,流体可以径向穿过工具串的一个端口和通道并且返回到工具串的内部并且通过通道 并且通过在工具串和结构之间限定的环形空间。

    Systems and methods for detecting defects on a wafer
    63.
    发明授权
    Systems and methods for detecting defects on a wafer 有权
    用于检测晶片缺陷的系统和方法

    公开(公告)号:US08467047B2

    公开(公告)日:2013-06-18

    申请号:US13541579

    申请日:2012-07-03

    CPC classification number: G01N21/9501 G01N2021/887 H01L22/12

    Abstract: Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.

    Abstract translation: 提供了用于检测晶片上的缺陷的系统和方法。 一种方法包括通过使用检查系统的第一和第二光学状态的检查系统扫描晶片来产生晶片的输出。 第一和第二光学状态由检查系统的至少一个光学参数的不同值来定义。 该方法还包括使用使用第二光学状态产生的输出使用第一光学状态产生的输出和晶片的第二图像数据为晶片产生第一图像数据。 此外,该方法包括将第一图像数据和对应于晶片上基本相同位置的第二图像数据组合,从而产生用于晶片的附加图像数据。 该方法还包括使用附加图像数据检测晶片上的缺陷。

    Computer-implemented methods, carrier media, and systems for stabilizing output acquired by an inspection system
    64.
    发明授权
    Computer-implemented methods, carrier media, and systems for stabilizing output acquired by an inspection system 有权
    计算机实现的方法,载体介质和用于稳定由检查系统获取的输出的系统

    公开(公告)号:US07774153B1

    公开(公告)日:2010-08-10

    申请号:US12049858

    申请日:2008-03-17

    Applicant: James A. Smith

    Inventor: James A. Smith

    Abstract: Various computer-implemented methods, carrier media, and systems for stabilizing output acquired by an inspection system are provided. One computer-implemented method includes determining a characteristic of output acquired for a wafer by an inspection system using an inspection recipe. The method also includes comparing the characteristic to a reference characteristic. In addition, if the characteristic is above the reference characteristic, the method includes altering the output acquired for the wafer such that the characteristic of the altered output substantially matches the reference characteristic thereby stabilizing the output acquired for the wafer to the reference characteristic.

    Abstract translation: 提供各种计算机实现的方法,载体介质和用于稳定由检查系统获取的输出的系统。 一种计算机实现的方法包括通过使用检查配方的检查系统确定为晶片获取的输出的特性。 该方法还包括将特征与参考特征进行比较。 此外,如果特性高于参考特性,则该方法包括改变对于晶片获得的输出,使得改变的输出的特性基本上与参考特性相匹配,从而将获得的晶片的输出稳定为参考特性。

    Cleaning attachment for converting a cleaning implement to a mop
    66.
    发明授权
    Cleaning attachment for converting a cleaning implement to a mop 失效
    用于将清洁工具转换成拖把的清洁附件

    公开(公告)号:US07458128B2

    公开(公告)日:2008-12-02

    申请号:US10737287

    申请日:2003-12-16

    Abstract: Various forms of cleaning attachments are described for converting a cleaning implement to a mop. In one form the attachment is a combination wipe and attachment wherein at least a portion of the attachment is made of an absorbent material so that the attachment itself can function as a wipe. In another form of the invention a wipe is detachably mounted to the cover portion of the attachment by reusable mounting structure located on at least one of the side walls of the cover. Various forms of pouches or containers are also described for containing a cleaning solution or other added ingredients which may form part of the attachment by the container of pouch being secured to the attachment.

    Abstract translation: 描述了各种形式的清洁附件用于将清洁工具转换成拖把。 在一种形式中,附件是组合擦拭和附接,其中附件的至少一部分由吸收材料制成,使得附件本身可以用作擦拭物。 在本发明的另一形式中,擦拭物通过位于盖的至少一个侧壁上的可重复使用的安装结构可拆卸地安装到附件的盖部分。 还描述了各种形式的袋或容器,用于容纳清洁溶液或其它添加的成分,其可以通过固定到附件的小袋的容器形成附件的一部分。

    Defect detection using multiple sensors and parallel processing
    67.
    发明授权
    Defect detection using multiple sensors and parallel processing 有权
    使用多个传感器和并行处理的缺陷检测

    公开(公告)号:US06990385B1

    公开(公告)日:2006-01-24

    申请号:US10765515

    申请日:2004-01-26

    Abstract: Techniques for detecting defects on semiconductor wafers are described. The techniques involve a parallel processing system wherein a data distribution system contains data distribution nodes that are interconnected by multiple data transfer paths. This configuration allows data collected by any of the detectors to be routed to any one of a plurality of processing nodes. This in turn allows a variety of defect analysis algorithms to be implemented.

    Abstract translation: 描述了用于检测半导体晶片上的缺陷的技术。 这些技术涉及并行处理系统,其中数据分配系统包含通过多个数据传送路径互连的数据分发节点。 该配置允许由任何检测器收集的数据被路由到多个处理节点中的任何一个。 这又允许实现各种缺陷分析算法。

    Measurement of fiber strain during processing
    68.
    发明授权
    Measurement of fiber strain during processing 失效
    加工过程中纤维应变的测量

    公开(公告)号:US06947637B2

    公开(公告)日:2005-09-20

    申请号:US10206708

    申请日:2002-07-25

    Applicant: James A. Smith

    Inventor: James A. Smith

    CPC classification number: G01L1/246 G01D5/35312 G01D5/35316

    Abstract: A method and system for determining strain impressed on an optical fiber at a possibly indeterminate temperature. The fiber (14) is formed with at least two sensors having different strain and temperature characteristics, preferably a Bragg Fabry-Perot sensor having a Fabry-Perot cavity (16) formed between two like Bragg gratings (10, 12) and another Bragg grating 18 of a different pitch written into the Fabry-Perot cavity. Many such pairs can be written if the Bragg gratings reflect in different bands. The fiber is irradiated with broadband light, and the reflection is spectrally separated to produce separate spectra for all sensors. Wavelength shifts from two types of sensors can be correlated with strain and temperature according to predetermined variations of the shifts with known strain and temperature changes.

    Abstract translation: 用于确定在可能不确定的温度下施加在光纤上的应变的方法和系统。 纤维(14)形成有具有不同应变和温度特性的至少两个传感器,优选布拉格法布里 - 珀罗传感器,其具有在两个类似的布拉格光栅(10,12)和另一个布拉格光栅之间形成的法布里 - 珀罗腔(16) 18个不同的音调写入法布里 - 珀罗腔。 如果布拉格光栅在不同的频带中反射,则可以写入许多这样的对。 用宽带光照射光纤,并且光谱分离反射,为所有传感器产生分离的光谱。 根据具有已知应变和温度变化的偏移的预定变化,来自两种类型的传感器的波长偏移可以与应变和温度相关。

    Dual sided disposable cleaning cloth
    69.
    发明授权
    Dual sided disposable cleaning cloth 失效
    双面一次性清洁布

    公开(公告)号:US06681434B2

    公开(公告)日:2004-01-27

    申请号:US09995134

    申请日:2001-11-27

    Applicant: James A. Smith

    Inventor: James A. Smith

    CPC classification number: A47L13/17 A47L13/20 B32B5/18 B32B5/26 C11D17/049

    Abstract: A disposable dual sided cleaning cloth is in the form of a laminate having outer layers which are preferably made of non-woven material. The outer layers are secured together by an intermediate hydrophilic polyurethane absorbent foam coating which contains at least one cleaning ingredient.

    Abstract translation: 一次性双面清洁布是具有优选由无纺布材料制成的外层的叠层形式。 外层通过含有至少一种清洁成分的中间亲水性聚氨酯吸收泡沫涂料固定在一起。

    Lift axle assembly
    70.
    发明授权
    Lift axle assembly 失效
    提升轴总成

    公开(公告)号:US6158750A

    公开(公告)日:2000-12-12

    申请号:US87237

    申请日:1998-05-29

    CPC classification number: B60G7/02 B60G11/27 B60G9/02

    Abstract: A lift axle assembly for supporting an auxiliary axle and wheels and selectively moving the auxiliary axle between in use and storage positions. The auxiliary axle is supported using two sets of upper and lower support arms pivotally connected between saddles attached to the axle and support hangers which are attached to the vehicle. Lift air springs selectively push the upper support arms vertically upwardly for rotating the support arms and placing the auxiliary axle in the storage position. The pivotal connections of the lower support arm as well as the pivotal connection of the upper support arm to the support hanger are of a bushing type allowing both rotational motion about the axis of rotation and coning for allowing twisting of the support arms about their longitudinal axes. The pivotal connection between the upper support arms and the saddles are of an antitwist type allowing pivotal motion about the axis of rotation but preventing coning or twisting of the upper support arms about their longitudinal axes.

    Abstract translation: 用于支撑辅助轴和轮子并且在使用和存储位置之间选择性地移动辅助轴的升降车轴组件。 辅助轴由两组可枢转地连接在安装在轴上的鞍座和连接到车辆的支撑悬架之间的上下支撑臂支撑。 提升空气弹簧选择性地将上支撑臂垂直向上推动以旋转支撑臂并将辅助轴放置在存放位置。 下支撑臂的枢转连接以及上支撑臂与支撑架的枢转连接是一种衬套型,允许围绕旋转轴线的旋转运动和锥形以允许支撑臂围绕其纵向轴线的扭转 。 上支撑臂和鞍座之间的枢转连接是抗扭转的,允许围绕旋转轴线枢转运动,但是防止上支撑臂围绕其纵向轴线进行锥形或扭转。

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