Abstract:
A cross over tool includes, a first tubular forming part of a structure having a channel formed radially through a wall thereof and having a passageway formed longitudinally through the wall. The tool includes a second tubular forming part of a tool string, the second tubular is positionable radially of the first tubular, and has a port through a wall thereof, the port is alignable with the channel. The crossover tool is configured such that while the a port is aligned with the a channel fluid can flow through an inside of the tool string radially through the a port and the a channel and back into the inside of the tool string and through the a passageway and through an annular space defined between the tool string and the structure.
Abstract:
Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.
Abstract:
Various computer-implemented methods, carrier media, and systems for stabilizing output acquired by an inspection system are provided. One computer-implemented method includes determining a characteristic of output acquired for a wafer by an inspection system using an inspection recipe. The method also includes comparing the characteristic to a reference characteristic. In addition, if the characteristic is above the reference characteristic, the method includes altering the output acquired for the wafer such that the characteristic of the altered output substantially matches the reference characteristic thereby stabilizing the output acquired for the wafer to the reference characteristic.
Abstract:
An active headrest for selectively supporting the head of an occupant, includes a shell, and an actuator disposed within the shell, including a bar linkage system drivenly coupled to the shell, so as to adjust the distance or engagement between the shell and head when displaced, and an active material element drivenly coupled to the system, so as to cause or enable the displacement of the system, and preferably further including a ratchet sector/pawl and latch cooperating to present plural achievable deployment positions.
Abstract:
Various forms of cleaning attachments are described for converting a cleaning implement to a mop. In one form the attachment is a combination wipe and attachment wherein at least a portion of the attachment is made of an absorbent material so that the attachment itself can function as a wipe. In another form of the invention a wipe is detachably mounted to the cover portion of the attachment by reusable mounting structure located on at least one of the side walls of the cover. Various forms of pouches or containers are also described for containing a cleaning solution or other added ingredients which may form part of the attachment by the container of pouch being secured to the attachment.
Abstract:
Techniques for detecting defects on semiconductor wafers are described. The techniques involve a parallel processing system wherein a data distribution system contains data distribution nodes that are interconnected by multiple data transfer paths. This configuration allows data collected by any of the detectors to be routed to any one of a plurality of processing nodes. This in turn allows a variety of defect analysis algorithms to be implemented.
Abstract:
A method and system for determining strain impressed on an optical fiber at a possibly indeterminate temperature. The fiber (14) is formed with at least two sensors having different strain and temperature characteristics, preferably a Bragg Fabry-Perot sensor having a Fabry-Perot cavity (16) formed between two like Bragg gratings (10, 12) and another Bragg grating 18 of a different pitch written into the Fabry-Perot cavity. Many such pairs can be written if the Bragg gratings reflect in different bands. The fiber is irradiated with broadband light, and the reflection is spectrally separated to produce separate spectra for all sensors. Wavelength shifts from two types of sensors can be correlated with strain and temperature according to predetermined variations of the shifts with known strain and temperature changes.
Abstract:
A disposable dual sided cleaning cloth is in the form of a laminate having outer layers which are preferably made of non-woven material. The outer layers are secured together by an intermediate hydrophilic polyurethane absorbent foam coating which contains at least one cleaning ingredient.
Abstract:
A lift axle assembly for supporting an auxiliary axle and wheels and selectively moving the auxiliary axle between in use and storage positions. The auxiliary axle is supported using two sets of upper and lower support arms pivotally connected between saddles attached to the axle and support hangers which are attached to the vehicle. Lift air springs selectively push the upper support arms vertically upwardly for rotating the support arms and placing the auxiliary axle in the storage position. The pivotal connections of the lower support arm as well as the pivotal connection of the upper support arm to the support hanger are of a bushing type allowing both rotational motion about the axis of rotation and coning for allowing twisting of the support arms about their longitudinal axes. The pivotal connection between the upper support arms and the saddles are of an antitwist type allowing pivotal motion about the axis of rotation but preventing coning or twisting of the upper support arms about their longitudinal axes.