公开(公告)号：US06890185B1

公开(公告)日：2005-05-10

申请号：US10700401

申请日：2003-11-03

Applicant: January Kister ,  James Jaquette ,  Steve Fahrner

Inventor： January Kister ,  James Jaquette ,  Steve Fahrner

IPC: H01R12/04 ,  H01R13/24 ,  H01R9/09

CPC classification number: H01R13/2407 ,  H01R12/714 ,  H01R13/2428 ,  H01R13/2485

Abstract: An interconnect assembly includes a number of interconnect stages combined in a carrier structure. Each interconnect stage includes at least two contact sets having an upwards pointing cantilever contact and a downwards pointing cantilever contact. The cantilever contacts are attached to the carrier structure and are arranged around openings in the carrier structure such that the downward pointing cantilevers may reach through the carrier structure. Each contact set defines an independent conductive path between a single pair of opposing chip and test apparatus contacts such that multiple conductive paths are available for each interconnect stage for increased transmission reliability and reduced resistance. The cantilever contacts have a meandering contour and are either combined in symmetrical pairs at their respective tips or are free pivoting. The meandering contour provides a maximum deflectable cantilever length within an available footprint defined by the pitch of the tested chip.

公开(公告)号：US06424164B1

公开(公告)日：2002-07-23

申请号：US09593262

申请日：2000-06-13

Applicant: January Kister

Inventor： January Kister

IPC: G01R3102

CPC classification number: G01R1/07357

Abstract: An apparatus for electronically testing of bound electrical circuits connected to planar arrayed pads having removable mounted conductive beam probes to simplify the manufacturing and maintaining process. A space transformer comprises from outside electrically accessible conductive holes wherein the guided beam probes are friction resilient resting. In a second embodiment, the friction resilient resting induces a predetermined bending onto the beam probes. This is accomplished by offsetting guiding plates thus imposing a rotational urging on the probe neck within the conductive hole which is just a bare extension of the beam probe.

Abstract translation: 用于电连接到具有可拆卸安装的导电束探针的平面阵列焊盘的结合电路的电子测试装置，以简化制造和维护过程。 空间变压器包括从外部可电导通孔，其中被引导的光束探针是摩擦弹性静止的。 在第二实施例中，摩擦弹性静止在光束探针上引起预定的弯曲。 这是通过偏移引导板来实现的，从而在导电孔内的探针颈部施加旋转推动力，导电孔仅仅是光束探头的裸露延伸部分。

公开(公告)号：USRE46221E1

公开(公告)日：2016-11-29

申请号：US13545571

申请日：2012-07-10

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/00 ,  G01R31/20 ,  G01R3/00 ,  G01R1/067

CPC classification number: G01R3/00 ,  G01R1/06733

Abstract: A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe contact tip below the arm, and a generally planar self-cleaning skate disposed perpendicular below the contact tip. The self-cleaning skate has a square front, a round back and a flat middle section. The conductive pad is of generally convex shape having a granular non-conductive surface of debris and moves to engage the skate, whereby an overdrive motion is applied to the pad causing the skate to move across and scrub non-conductive debris from the pad displacing the debris along the skate and around the skate round back end to a position on the skate that is away from the pad.

Abstract translation: 提供用于接合导电焊盘的探针。 探头包括用于接收测试电流的探针接触端，接触端下方的探针保持部分，用于保持探针保持部分的块，在保持部分下方的探针臂，臂下方的探针接触尖端，以及通常 平面自清洁溜冰板垂直设置在接触尖端下方。 自洁滑冰鞋有一个正方形的前面，一个圆形的背部和一个平的中间部分。 导电垫具有大致凸形的形状，具有颗粒状非导电表面的碎屑并且移动以接合滑冰板，由此将过载驱动运动施加到垫上，从而使滑冰板移动并且擦去来自垫的非导电碎片， 沿着溜冰鞋和溜冰鞋周围的碎屑回到位于远离垫子的溜冰鞋上的位置。

公开(公告)号：US09250266B2

公开(公告)日：2016-02-02

申请号：US13557879

申请日：2012-07-25

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/20 ,  G01R3/00

CPC classification number: G01R3/00 ,  Y10T29/49158 ,  Y10T29/49163 ,  Y10T29/49208 ,  Y10T29/49213 ,  Y10T29/4922 ,  Y10T29/49222

Abstract: In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated.

公开(公告)号：US08988091B2

公开(公告)日：2015-03-24

申请号：US12880808

申请日：2010-09-13

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067

CPC classification number: G01R1/073 ,  G01R1/06716 ,  G01R1/06733 ,  G01R1/06761 ,  G01R1/07357

Abstract: The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.

Abstract translation: 本发明是用于测试包括一个或多个接地/功率探针和一个或多个信号探针以及任选的气流装置的被测电气装置的探针阵列。

公开(公告)号：US08415963B2

公开(公告)日：2013-04-09

申请号：US13108368

申请日：2011-05-16

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/20 ,  G01R31/00

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US20120313660A1

公开(公告)日：2012-12-13

申请号：US13526759

申请日：2012-06-19

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067

CPC classification number: G01R1/06733 ,  G01R1/06738 ,  G01R3/00

Abstract: A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is aligned along a scrub direction and also has a certain curvature along the scrub direction such that it may undergo both a scrub motion and a self-cleaning rotation upon application of a contact force between the skate and the conductive pad. While the scrub motion clears oxide from the pad to establish electrical contact, the rotation removes debris from the skate and thus preserves a low contact resistance between the skate and the pad. The use of probes with one or more blunt skates and methods of using such self-cleaning probes are especially advantageous when testing DUTs with low-K conductive pads or other mechanically fragile pads that tend to be damaged by large contact force concentration.

Abstract translation: 一种探针，其具有导电体和接触尖端，所述接触尖端由一个或多个钝头溜冰鞋端接，用于接合待测器件（DUT）的导电焊盘，用于进行电气测试。 接触尖端具有一定的宽度，并且钝溜冰鞋比尖端宽度窄。 溜冰鞋沿着洗涤方向对准，并且沿擦洗方向也具有一定的曲率，使得它可以在施加滑板和导电垫之间的接触力的同时进行擦洗运动和自清洁旋转。 当擦洗动作从衬垫中清除氧化物以建立电接触时，旋转从溜冰鞋去除碎屑，从而保持溜冰鞋和衬垫之间的低接触电阻。 使用具有一个或多个钝头溜冰鞋的探头以及使用这种自清洁探针的方法在使用低K导电垫或其他易受大接触力浓度损伤的机械脆性垫进行测试时尤为有利。

公开(公告)号：US20110273199A1

公开(公告)日：2011-11-10

申请号：US13118952

申请日：2011-05-31

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US07952377B2

公开(公告)日：2011-05-31

申请号：US12419912

申请日：2009-04-07

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02 ,  G01R31/00

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US20100289512A1

公开(公告)日：2010-11-18

申请号：US12777827

申请日：2010-05-11

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067 ,  G01R31/00

CPC classification number: G01R1/06733 ,  G01R1/06738 ,  G01R3/00

Abstract: A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is aligned along a scrub direction and also has a certain curvature along the scrub direction such that it may undergo both a scrub motion and a self-cleaning rotation upon application of a contact force between the skate and the conductive pad. While the scrub motion clears oxide from the pad to establish electrical contact, the rotation removes debris from the skate and thus preserves a low contact resistance between the skate and the pad. The use of probes with one or more blunt skates and methods of using such self-cleaning probes are especially advantageous when testing DUTs with low-K conductive pads or other mechanically fragile pads that tend to be damaged by large contact force concentration.

Abstract translation: 一种探针，其具有导电体和接触尖端，所述接触尖端由一个或多个钝头溜冰鞋端接，用于接合待测器件（DUT）的导电焊盘，用于进行电气测试。 接触尖端具有一定的宽度，并且钝溜冰鞋比尖端宽度窄。 溜冰鞋沿着洗涤方向对准，并且沿擦洗方向也具有一定的曲率，使得它可以在施加滑板和导电垫之间的接触力的同时进行擦洗运动和自清洁旋转。 当擦洗动作从衬垫中清除氧化物以建立电接触时，旋转从溜冰鞋去除碎屑，从而保持溜冰鞋和衬垫之间的低接触电阻。 使用具有一个或多个钝头溜冰鞋的探头以及使用这种自清洁探针的方法在使用低K导电垫或其他易受大接触力浓度损伤的机械脆性垫进行测试时尤为有利。