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    Oven-controlled crystal oscillator
    61.
    发明申请
    Oven-controlled crystal oscillator 失效
    烤箱控制晶体振荡器

    公开(公告)号：US20090212878A1

    公开(公告)日：2009-08-27

    申请号：US12378741

    申请日：2009-02-19

    Applicant: Junichi Arai ,  Kenji Kasahara

    Inventor： Junichi Arai ,  Kenji Kasahara

    IPC: H03B5/30

    CPC classification number: H03B5/04 ,  H03L1/04 ,  H05K1/0212 ,  H05K1/167 ,  H05K2201/10075 ,  H05K2201/10151 ,  H05K2201/10166

    Abstract: An oven-controlled crystal oscillator includes a circuit board, a crystal unit surface-mounted on the circuit board, and a temperature control circuit that maintains operating temperature of the crystal unit constant. The temperature control circuit includes a heating resistor, a power transistor that supplies power to a heating resistor, and a temperature sensitive resistor that detects temperature of the crystal unit. The heating resistor is formed, as a film resistor, on a surface of the circuit board in an area thereof in which the crystal unit is located. The temperature sensitive resistor is provided on the circuit board as a film resistor.

    Abstract translation: 炉控晶体振荡器包括电路板，表面安装在电路板上的晶体单元和保持晶体单元的工作温度恒定的温度控制电路。 温度控制电路包括加热电阻器，向加热电阻器供电的功率晶体管和检测晶体单元的温度的温度敏感电阻器。 加热电阻器作为薄膜电阻器形成在其中晶体单元所在的区域中的电路板的表面上。 温度敏感电阻器作为薄膜电阻器设置在电路板上。

    Constant temperature crystal oscillator
    63.
    发明申请
    Constant temperature crystal oscillator 有权
    恒温晶体振荡器

    公开(公告)号：US20060214743A1

    公开(公告)日：2006-09-28

    申请号：US11384556

    申请日：2006-03-20

    Applicant: Junichi Arai ,  Naoki Sekine

    Inventor： Junichi Arai ,  Naoki Sekine

    IPC: H03L1/00

    CPC classification number: H03L1/028 ,  H03B5/04 ,  H03B5/36 ,  H03L1/04

    Abstract: A constant temperature crystal oscillator includes on a circuit substrate: a surface-mount crystal resonator which is provided with two crystal terminals as mount terminals and a dummy terminal on the bottom surface, and has a metal cover; an oscillation circuit element which forms an oscillation circuit together with the crystal resonator; and a temperature control element which keeps a constant operation temperature of the crystal resonator, in which the temperature control element includes at least a heating chip resistor, a power transistor for supplying electric power to the chip resistor, and a temperature sensitive resistor for detecting the operation temperature of the crystal resonator, wherein a dummy terminal on the substrate side of the circuit substrate for connection to the dummy terminal of the crystal resonator is connected to a resistor terminal on the substrate side to which the temperature sensitive resistor is connected through a conductive path.

    Abstract translation: 恒温晶体振荡器包括在电路基板上：表面安装晶体谐振器，其在底表面上设置有两个晶体端子作为安装端子和虚拟端子，并且具有金属盖; 与晶体谐振器一起形成振荡电路的振荡电路元件; 以及温度控制元件，其保持晶体谐振器的恒定工作温度，其中温度控制元件至少包括加热片式电阻器，用于向片式电阻器提供电力的功率晶体管，以及用于检测 晶体谐振器的工作温度，其中用于连接到晶体谐振器的虚拟端子的电路基板的基板侧上的虚拟端子连接到通过导电的温度敏感电阻器连接到的基板侧的电阻器端子 路径。

    Method of testing hardness in rebound type hardness tester
    69.
    发明授权
    Method of testing hardness in rebound type hardness tester 失效
    回弹型硬度计硬度测试方法

    公开(公告)号：US5827953A

    公开(公告)日：1998-10-27

    申请号：US45444

    申请日：1998-03-20

    Applicant: Yasunori Sato ,  Junichi Arai ,  Yuichi Minami

    Inventor： Yasunori Sato ,  Junichi Arai ,  Yuichi Minami

    IPC: G01N3/44 ,  G01N3/00 ,  G01N3/52 ,  G01N3/30

    CPC classification number: G01N3/52 ,  G01N2203/001 ,  G01N2203/0083

    Abstract: An impacting velocity v.sub.1 and a rebounding velocity v.sub.1 ' of the hammer at a second hammer velocity measurement point 12 a distance x.sub.1 apart from a first hammer velocity measurement point 11 in the system of movement of the hammer are measured and the hardness H of the specimen is calculated in accordance with Equation 1, ##EQU1## where x.sub.2 denotes the distance between the first hammer velocity measurement point 11 and the specimen 2 and .alpha. denotes the acceleration acting on said hammer. Thereby, a hardness test in a rebound type hardness tester can be performed without measuring the velocities of the hammer immediately before impacting against the specimen and immediately after the impaction.

    Abstract translation: 测量在第二锤速度测量点12处的锤的冲击速度v1和回弹速度v1'，与锤的运动系统中的第一锤速度测量点11相距一个距离x1，并且样本的硬度H 根据等式1计算， [等式 1]其中x2表示第一锤速度测量点11和样本2之间的距离，α表示作用在所述锤上的加速度。 因此，可以在不抵抗撞击样本之前立即锤击后的锤的速度来测量回弹型硬度计中的硬度试验。

    Bearing sealing device
    70.
    发明授权
    Bearing sealing device 失效
    轴承密封装置

    公开(公告)号：US5480235A

    公开(公告)日：1996-01-02

    申请号：US284215

    申请日：1994-08-02

    Applicant: Junichi Arai

    Inventor： Junichi Arai

    IPC: B29D99/00 ,  F16C33/78 ,  F16C33/76

    CPC classification number: F16C33/7856 ,  F16C33/783 ,  F16C19/04

    Abstract: A bearing sealing device is used for sealing a bearing assembly by inserting the sealing device through an insertion hole in the bearing assembly and mounting it in a fitting groove formed therein. Individual bearing sealing devices may be obtained by punching operations, and may be produced in large quantities and continuously without requiring any subsequent treatment such as removal of burrs. The bearing sealing device thus formed provides improved firm fitting to the bearing assembly. The bearing sealing device includes an elastic sealing ring and a backing ring combined with each other. The elastic sealing ring has a sealing lip around the peripheral edge thereof extending beyond the corresponding peripheral edge of the backing ring. With the bearing sealing device mounted on the bearing assembly, part of the lip is formed to include a swelling that extends outwardly of the fitting groove so as to embrace the peripheral edge of the backing ring, thus holdiong the backing ring firmly.

    Abstract translation: 轴承密封装置用于通过将密封装置穿过轴承组件中的插入孔并将其安装在其中形成的配合槽中来密封轴承组件。 单独的轴承密封装置可以通过冲压操作获得，并且可以大量和连续地生产，而不需要随后的处理，例如去除毛刺。 如此形成的轴承密封装置提供了改进的与轴承组件的紧密配合。 轴承密封装置包括弹性密封环和彼此结合的背衬环。 弹性密封环具有围绕其周缘延伸超过背衬环的相应周边边缘的密封唇。 通过将轴承密封装置安装在轴承组件上，唇部的一部分形成为包括从配合槽向外延伸的膨胀，以便包围背衬环的周边边缘，从而牢固地固定衬垫环。

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