公开(公告)号：US09775572B2

公开(公告)日：2017-10-03

申请号：US14647568

申请日：2013-11-28

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Tsvi Katchalski ,  Ewald Roessl ,  Reuven Levinson

IPC: A61B6/00 ,  A61B6/03 ,  A61B6/06 ,  G21K1/02 ,  G21K1/10

CPC classification number: A61B6/4035 ,  A61B6/032 ,  A61B6/035 ,  A61B6/06 ,  G21K1/02 ,  G21K1/10

Abstract: An imaging system (500) includes a focal spot (510) that rotates along a path around an examination region (506) and emits radiation. A collimator (512) collimates the radiation, producing a radiation beam (516) that traverses a field of view (520) of the examination region and a subject or object therein. A detector array (522), located opposite the radiation source, across the examination region, detects radiation traversing the field of view and produces a signal indicative of the detected radiation. A beam shaper (524), located between the radiation source and the collimator, rotates in coordination with the focal spot and defines an intensity profile of the radiation beam. The beam shaper includes a plurality of elongate x-ray absorbing elements (606) arranged parallel to each other along a transverse direction with respect to a direction of the beam, separated from each other by a plurality of material free regions (604).

公开(公告)号：US09664797B2

公开(公告)日：2017-05-30

申请号：US14648735

申请日：2013-12-12

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl ,  Roger Steadman-Booker

IPC: H05G1/64 ,  G01T1/17 ,  G01N23/04

CPC classification number: G01T1/17 ,  G01N23/04 ,  G01T1/171

Abstract: The invention relates to a detector unit (100) for the detection of photons of incident radiation. The detector unit (100) comprises a signal processing circuit (40, 50, 60) for generating signals (V0) that are dependent on the energy of a currently detected photon (X) and at least one processing-parameter (Rf). Moreover, it comprises a flux estimator (70) for estimating the flux of photons and for adjusting the processing-parameter (Rf) based on said estimated flux. The flux estimator (70) receives its input (Vi), from which the flux of photons is estimated, from a processing stage that is independent of the output of the signal processing circuit. In a preferred embodiment, the signal processing circuit is or comprises a shaper (40).

公开(公告)号：US09613441B2

公开(公告)日：2017-04-04

申请号：US14916609

申请日：2014-08-29

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Thomas Koehler ,  Bernhard Johannes Brendel ,  Ewald Roessl

IPC: G06T11/00 ,  G06T7/00

CPC classification number: G06T11/006 ,  G06T7/0012 ,  G06T2207/10081 ,  G06T2211/408 ,  G06T2211/424

Abstract: A method and a related system (IMA) for reconstructing an image of an electron density in a subject PAT. An x-ray radiation imager is used to expose the subject PAT to radiation to receive projection data. The reconstruction method combines projection data from two channels, namely Compton scatter based attenuation data pC and phase shift data pdφ.

公开(公告)号：US09597050B2

公开(公告)日：2017-03-21

申请号：US14373969

申请日：2013-01-22

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl ,  Thomas Koehler

IPC: A61B6/00 ,  G21K1/02 ,  A61B6/06

CPC classification number: A61B6/484 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4233 ,  A61B6/502 ,  F04C2270/041 ,  G21K1/02 ,  G21K2207/005

Abstract: A phase contrast X-ray imaging system of an object includes an X-ray source, an X-ray detector arrangement, and a grating arrangement with a phase-grating structure and an analyzer-grating structure. The X-ray detector arrangement includes at least eight line-detector units parallel to each other in a first direction, the line-detector units extending linearly in a direction perpendicular to the first direction. The phase-grating structure has a number of linear phase-gratings having a first part with first phase-gratings with slits in the first direction, and a second part with second phase-gratings with slits in a second direction different than the first direction. The analyzer-grating structure has a number of linear analyzer-gratings having a first part with first analyzer-gratings with slits in the first direction, and a second part with second analyzer-gratings with slits in the second direction.

公开(公告)号：US20150272528A1

公开(公告)日：2015-10-01

申请号：US14438947

申请日：2014-09-16

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Hans-Aloys Wischmann ,  Ewald Roessl

IPC: A61B6/00 ,  A61B6/06

CPC classification number: A61B6/484 ,  A61B6/03 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4078 ,  A61B6/4208 ,  A61B6/4291 ,  A61B6/4435 ,  A61B6/502 ,  A61B6/547 ,  A61B6/585 ,  G21K1/025 ,  G21K1/06 ,  G21K2207/005

Abstract: An X-ray differential phase contrast imaging device (10) comprises an X-ray source (20) for generating an X-ray beam; a source grating (G0) for generating a coherent X-ray beam from a non-coherent X-ray source (20); a collimator (22) for splitting the coherent X-ray beam into a plurality of fan-shaped X-ray beams (28) for passing through an object (14); a phase grating (G1) for generating an interference pattern and an absorber grating (G2) for generating a Moiré pattern from the interference pattern arranged after the object (14); and a line detector (24) for detecting the Moiré pattern generated by the phase grating (G1) and the absorber grating (G2) from the fan-shaped X-ray beams (28) passing through the object (14). The X-ray source (20), source grating (G0), collimator (22), phase grating (G1), absorber grating (G2) and line detector (24) are fixed to a common gantry (12) and are movable with respect to the object (14), such that a number of interference pattern from different positions of the gantry are detectable for reconstructing a differential phase image of the object (14). At least one grating (G0, G1, G2) comprises, in an alternating manner, groups (36) of grating lines (34) and transparent areas (38). At least one grating (G0, G1, G2) is movable with respect to the gantry (12), such that in a first position of the grating (G1, G2) the fan-shaped X-ray beams (28) pass through the grating lines (34), and in a second position of the grating (G1, G2), the fan-shaped X-ray beams (28) pass through the transparent areas (38).

Abstract translation: X射线差分相位差成像装置（10）包括用于产生X射线束的X射线源（20）; 用于从非相干X射线源（20）产生相干X射线束的源光栅（G0）; 准直器（22），用于将相干X射线束分解成多个扇形X射线束（28），用于穿过物体（14）; 用于产生干涉图案的相位光栅（G1）和用于根据布置在物体（14）之后的干涉图案产生莫尔图案的吸收光栅（G2）。 以及线检测器（24），用于检测由通过物体（14）的扇形X射线束（28）产生的相位光栅（G1）和吸收光栅（G2）产生的莫尔图案。 X射线源（20），源光栅（G0），准直器（22），相位光栅（G1），吸收光栅（G2）和线检测器（24）固定在公共台架（12） 相对于物体（14），使得可以检测到台架的不同位置的多个干涉图案，用于重建物体（14）的差分相位图像。 至少一个光栅（G0，G1，G2）以交替的方式包括光栅线（34）和透明区域（38）的组（36）。 至少一个光栅（G0，G1，G2）可相对于台架（12）移动，使得在光栅（G1，G2）的第一位置，扇形X射线束（28）穿过 光栅线（34），并且在光栅（G1，G2）的第二位置，扇形X射线束（28）穿过透明区域（38）。

公开(公告)号：US20150063527A1

公开(公告)日：2015-03-05

申请号：US14387550

申请日：2013-03-25

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Heiner Daerr ,  Ewald Roessl

IPC: G01T1/18 ,  G01N23/04 ,  G01T1/24

CPC classification number: G01T1/18 ,  A61B6/032 ,  A61B6/4241 ,  A61B6/482 ,  A61B6/585 ,  G01N23/046 ,  G01T1/171 ,  G01T1/248

Abstract: An imaging system (600) includes a radiation source (608) that emits polychromatic radiation that traverses an examination region and a detector array (610) located opposite the radiation source, across the examination region, which includes a paralyzable photon counting detector pixel (611) that detects photons of the radiation that traverse the examination region and illuminate the detector pixel and that generates a signal indicative of each detected photon. An output photon count rate to input photon count rate map (626) includes at least one map which maps multiple input photon count rates of the detector pixel to a single output photon count rate of the detector pixel, and an input photon count rate determiner (624) identifies one input photon count rate of the multiple input photon count rates of the map as a correct input photon count rate for the detector pixel. A reconstructor that reconstructs the signal based on the identified input photon count rate.

Abstract translation: 成像系统（600）包括：放射源（608），其辐射穿过检查区域的多色辐射;以及跨越检查区域的与辐射源相对的检测器阵列（610），该检测器阵列包括可分离的光子计数检测器像素（611 ），其检测穿过检查区域的辐射的光子并照亮检测器像素，并且产生指示每个检测到的光子的信号。 输入光子计数速率到输入光子计数率图（626）包括至少一个映射，其将检测器像素的多个输入光子计数率映射到检测器像素的单个输出光子计数率，以及输入光子计数率确定器 624）将映射的多输入光子计数率的一个输入光子计数率识别为检测器像素的正确输入光子计数率。 一种基于所识别的输入光子计数率来重建信号的重建器。

公开(公告)号：US20150036795A1

公开(公告)日：2015-02-05

申请号：US14373969

申请日：2013-01-22

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl ,  Thomas Koehler

IPC: A61B6/00 ,  A61B6/06

CPC classification number: A61B6/484 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4233 ,  A61B6/502 ,  F04C2270/041 ,  G21K1/02 ,  G21K2207/005

Abstract: The present invention relates to phase contrast X-ray imaging of an object. In order to provide phase contrast information in more than one direction, an X-ray imaging system is provided that comprises an X-ray source (12), an X-ray detector arrangement (16), and a grating arrangement (18) with a phase-grating structure (46) and an analyser-grating structure (48). The X-ray detector arrangement comprises at least eight line-detector units (40) parallel to each other in a first direction (42), the line-detector units extending linearly in a direction (44) perpendicular to the first direction. The X-ray source, the X-ray detector arrangement and the grating arrangement are adapted to perform an acquisition movement in relation to an object in a scanning direction parallel to the first direction. The phase-grating structure has a number of linear phase-gratings, each of which is arranged in fixed association with an assigned line of the at least eight line-detector units; a first part as first phase-gratings with slits in the first direction, and a second part as second phase-gratings with slits in a second direction different to the first direction. The analyser-grating structure has a number of linear analyser-gratings, each of which is arranged in fixed association with an assigned line of the at least eight line-detector units; a first part as first analyser-gratings with slits in the first direction, and a second part as second analyser-gratings with slits in the second direction. At least four adjacent lines of the line-detector units are associated with the first phase-gratings and the first analyser-gratings and at least four adjacent lines of the line-detector units are associated with the second phase-gratings and the second analyser-gratings. The grating arrangement may comprise a source-grating structure arranged between the X-ray source and the phase-grating structure, to provide sufficient coherence to the X-ray beam passing the source-grating structure, so that after passing the phase-grating structure, the interference can be observed at the location of the analyser-grating structure.

公开(公告)号：US20140306116A1

公开(公告)日：2014-10-16

申请号：US14359311

申请日：2012-11-23

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ewald Roessl ,  Axel Thran ,  Roland Proksa

IPC: G01T1/20

CPC classification number: G01T1/20 ,  G01T1/2008

Abstract: Detection apparatus for detecting radiation The invention relates to a detection apparatus for detecting radiation. The detection apparatus comprises at least two scintillators (14, 15) having different temporal behaviors, each generating scintillation light upon reception of radiation, wherein the generated scintillation light is commonly detected by a scintillation light detection unit (16), thereby generating a common light detection signal. A detection values determining unit determines first detection values by applying a first determination process and second detection values by applying a second determination process, which is different to the first determination process, on the detection signal. The first determination process includes frequency filtering the detection signal. Since the scintillation light of the different scintilla-tors is collectively detected by the same scintillation light detection unit, detection arrangements with, for example, side-looking photodiodes for separately detecting the different scintillation light of the different scintillators are not necessarily required, thereby reducing the technical complexity of the detection apparatus.

Abstract translation: 用于检测辐射的检测装置技术领域本发明涉及一种用于检测辐射的检测装置。 检测装置包括具有不同时间行为的至少两个闪烁体（14,15），每个闪烁体在接收到辐射时产生闪烁光，其中所产生的闪烁光通常由闪烁光检测单元（16）检测，从而产生公共光 检测信号。 检测值确定单元通过对检测信号应用与第一确定处理不同的第二确定处理来应用第一确定处理和第二检测值来确定第一检测值。 第一确定处理包括对检测信号进行频率滤波。 由于不同的闪烁体的闪烁光被同一个闪烁光检测部共同检测，所以不一定需要与例如用于分别检测不同的闪烁体的不同的闪烁体的侧视光电二极管的检测装置，从而减少 检测装置的技术复杂性。