Abstract:
An apparatus for measuring a surface profile of an object to be measured includes a measuring probe positioned to contact the surface of the object to be measured, a guide mechanism for supporting and guiding the measuring probe in an axial direction of the measuring probe, a tilt angle adjustment mechanism for tilting the guide mechanism at a predetermined tilt angle with respect to a horizontal direction so that the measuring probe contacts the surface of the object to be measured with a predetermined contact force, and a drive mechanism for relatively driving at least one of the measuring probe and the object to scan the surface of the object to be measured with the measuring probe. The contact force is derived from a tilt direction component of the gravity of the measuring probe generated when the measuring probe is tilted.
Abstract:
The invention is directed to a method for determining the weight of a probe of a coordinate measuring machine wherein the probe is connected to a probe head (1) of the machine. The machine includes a control unit and the weight of the probe (3) is preferably statically determined without active control of the movement of the probe. Signals from the probe (3) and/or the probe head (1) are supplied to the control unit (51).
Abstract:
A comparator (1) has: a frame (2); a spindle and an anvil (4) supported by the frame (2) to be advanceable and retractable in the axial direction thereof; a biaser (39) for biasing the anvil (4) toward the spindle; a release (6) for retracting the anvil relative to the spindle against the biaser (39); an indicator (7); and an indicator driver (8) for transmitting the movement of the anvil (4) to the indicator (7), where a seal member (40, 43, 47) provided on the border between an outer surface of the frame (2) and at least one of the anvil (4), the biaser (39), the release (6) and the indicator (7) and a biasing force adjuster (5) for varying the biasing force of the biaser (39) are provided.
Abstract:
A dual stage scanning instrument includes a sensor for sensing a parameter of a sample and coarse and fine stages for causing relative motion between the sensor and the sample. The coarse stage has a resolution of about 1 micrometer and the fine stage has a resolution of 1 nanometer or better. The sensor is used to sense the parameter when both stages cause relative motion between the sensor assembly and the sample. The sensor may be used to sense height variations of the sample surface as well as thermal variations, electrostatic, magnetic, light reflectivity or light transmission parameters at the same time when height variation is sensed. By performing along scan at a coarser resolution and short scans a high resolution using the same probe tip or two probe tips at fixed relative positions, data obtained from the long and short scans can be correlated accurately.
Abstract:
Gauging head and apparatus for the linear dimension checking of mechanical pieces comprising an integral element (1) that defined an arm (5) carrying a feeler (25), a reference portion (3), and a fulcrum (13) that enables rotations of arm (5) with respect to the reference portion (3), and a differential transformer position transducer with a cylindrical shaped casing (35; 82), carrying the windings (34; 83), fixed to the reference portion (3), and a ferromagnetic core (32; 84) movable together with the arm (5). The integral element (1) is locked in an adjustable way to a support (67), by means of the cylindrical casing (35; 82). The integral fulcrum is achieved by work hardening the material and subsequently grinding it.
Abstract:
A coordinate measuring apparatus measures a workpiece in accordance with a measuring sequence. The apparatus has a probe unit for scanning the workpiece and a mechanical assembly for moving the probe unit in three coordinate directions (X, Y, Z). Drives are provided for driving the mechanical assembly to move the probe unit and a manually actuable control element controls the drives. A force unit superposes a force onto the control element in correspondence to specific conditions in the measuring sequence.
Abstract:
A profilometer has a constant force mechanism for biasing of the stylus arm. The mechanism has a centrally-aligned configuration of the moving magnet relative to the magnetic coil and also has a magnetic shield isolating these elements from other ferromagnetic materials in the assembly. The moving magnet is made of a material that is hard magnetically and the magnetic shield is made of a series of low hysteresis, high permeability materials. The force thus generated by the stylus biasing device is very linear with the drive current upon the magnetic coil at any particular position of the stylus, thereby allowing for control and predictability of the stylus force upon the surface to be profiled. This predictability is used for dynamic stylus force adjustments during profiling of a specimen. The profilometer is also equipped with a balanced, spring-loaded stylus-stabilizing sensor assembly, task-specific dual-view optics for protection of the delicate stylus assembly, and a temperature drift compensator.
Abstract:
A force control system (50) and method are provided for controlling a position contact sensor (10) so as to produce a constant controlled contact force therewith. The system (50) includes a contact position sensor (10) which has a contact probe (12) for contacting the surface of a target to be measured and an output signal (V.sub.o) for providing a position indication thereof. An actuator (30) is provided for controllably driving the contact position sensor (10) in response to an actuation control signal (I). A controller (52) receives the position indication signal (V.sub.o) and generates in response thereto the actuation control signal (I) so as to provide a substantially constant selective force (F) exerted by the contact probe (12). The actuation drive signal (I) is generated further in response to substantially linear approximation curves based on predetermined force and position data attained from the sensor (10) and the actuator (30).
Abstract:
A stylus counterbalancing mechanism for a probe includes a stylus support member suspended on a resilient suspension system and connected to a spring which provides a force to counterbalance the weight of the stylus. The spring is connected to one end of a plate which is capable of sliding up and down a rod but is locked in position due to the clockwise moment produced by the spring force. The plate is unlocked from its position, when required, by movement of an actuating member. The actuating member is slidable up and down the rod and has bearing areas arranged to provide an anti-clockwise moment to the plate to unlock it and to move it along the rod to increase or decrease the spring force as required.In the probe, the actuating member includes a projection extending through the probe housing to be operable from the outside either manually or by the co-ordinate positioning machine, the machine being programmed to move the probe to engage the projection with a fixed ledge on the machine.
Abstract:
An intelligent multiprobe tip comprising a mounting member comprised essentially of piezoelectric material wherein, through appropriately locating metalized areas, the characteristics of the piezoelectric material are employed to insulate selected regions from each other while providing an appropriate force-induced output signal responsive to the contact of an attached tip with a movable work piece.