Abstract:
A supporting frame structure including two supporting frames bilaterally connected between a bracket on a main rod member of a golf cart and two wheel holder frames, which each hold a wheel, each supporting frame formed of a first frame bar and a second frame bar pivotably connected in parallel between the bracket and one wheel holder frame, wherein the first frame of each supporting frame has a beveled peripheral side wall, the second frame bar of each supporting frame has a beveled peripheral side wall facing the beveled peripheral side wall of the corresponding first frame bar and spaced from the beveled peripheral side wall of the corresponding first frame bar by a gap; the beveled peripheral side walls of the first frame bars of the supporting frames are forced downwards into close contact with the beveled peripheral side walls of the respective second frame bars to support the golf cart on the wheels stably.
Abstract:
A folding collapsible frame assembly for a golf cart in which a locating block is pivotably mounted in an opening between two parallel walls of upper bag cradle being fixedly fastened to the front end of a main shaft, a spring is mounted in the opening in the upper bag cradle to support the locating block, a handle bracket is pivoted to the upper bag cradle to hold a handle bar and turned about an axis between a first position where the handle bracket is received in a receiving chamber in the upper bag cradle to hold the handle bar in longitudinal alignment with the main shaft and a locating flange of the handle bracket is forced into engagement with a locating groove on the locating block, and a second position where the locating flange of the handle bracket is disengaged from the locating groove of the locating block and the handle bracket is moved out of the receiving chamber and retained in parallel to the main shaft.
Abstract:
A club head brush having a first bristle holder and a second bristle holder at one end of the body thereof, the first bristle holder and the second bristle holder holding bundles of bristles of different softness for cleaning golf club heads, and a pick coupled to a sliding switch at an opposite end of the body and used for removing dirt from scoring lines and grooves on golf club heads, the pick being moved in and out of a through hole at the rear end of the club head brush when the sliding switch is moved along a longitudinal sliding slot on the body.
Abstract:
A video processing system may be operable to utilize multi-band sharpening to process luma signals for image signals. The luma signal may be decomposed into a plurality of frequency band components, wherein each component may be processed separately using different sharpening gains and/or offsets. The multi-band processed components may be combined to generate sharpened output luma signals. The multi-band sharpening may be performed utilizing peaking processing, and the input luma signal and/or LTI sharpened luma signals may be combined with the multi-band peaking sharpened signals to generate the sharpened output luma signals. Corresponding chroma signals may also be adjusted to generate sharpened output chroma signals. Luma and/or chroma sharpening operations may be further adjusted based on coring, clipping avoidance, luma statistics, color region detections, and/or curve control parameters. Sharpened output image signals may be generated based on the sharpened output luma signals and the sharpened output chroma signals.
Abstract:
Shallow trench isolation silicon-on-insulator (SOI) devices are formed with improved charge protection. Embodiments include an SOI film diode and a P+ substrate junction as a charging protection device. Embodiments also include a conductive path from the SOI transistor drain, through a conductive contact, a metal line, a second conductive contact, an SOI diode, isolated from the transistor, a third conductive contact, a second conductive line, and a fourth conductive contact to a P+-doped substrate contact in the bulk silicon layer of the SOI substrate.
Abstract:
Shallow trench isolation silicon-on-insulator (SOI) devices are formed with improved charge protection. Embodiments include an SOI film diode and a P+ substrate junction as a charging protection device. Embodiments also include a conductive path from the SOI transistor drain, through a conductive contact, a metal line, a second conductive contact, an SOI diode, isolated from the transistor, a third conductive contact, a second conductive line, and a fourth conductive contact to a P+-doped substrate contact in the bulk silicon layer of the SOI substrate.
Abstract:
Shallow trench isolation silicon-on-insulator (SOI) devices are formed with improved charge protection. Embodiments include an SOI film diode and a P+ substrate junction as a charging protection device. Embodiments also include a conductive path from the SOI transistor drain, through a conductive contact, a metal line, a second conductive contact, an SOI diode, isolated from the transistor, a third conductive contact, a second conductive line, and a fourth conductive contact to a P+-doped substrate contact in the bulk silicon layer of the SOI substrate.
Abstract:
The techniques and technologies described herein relate to the automatic creation of photoresist masks for stress liners used with semiconductor based transistor devices. The stress liner masks are generated with automated design tools that leverage layout data corresponding to features, devices, and structures on the wafer. A resulting stress liner mask (and wafers fabricated using the stress liner mask) defines a stress liner coverage area that extends beyond the boundary of the transistor area and into a stress insensitive area of the wafer. The extended stress liner further enhances performance of the respective transistor by providing additional compressive/tensile stress.
Abstract:
A stress-enhanced semiconductor device is provided which includes a substrate having an inactive region and an active region, a first-type stress layer overlying at least a portion of the active region, and a second-type stress layer. The active region includes a first lateral edge which defines a first width of the active region, and a second lateral edge which defines a second width of the active region. The second-type stress layer is disposed adjacent the second lateral edge of the active region.
Abstract:
A method of detecting damage to at least one dielectric layer in an IC die by determining a capacitance factor. The capacitance factor can be used to determine damage in a low-k dielectric material. A system for detecting damage can include a conductive line structure for measuring capacitance and software or a device for determining the capacitance to determine the damage.