Bottom conductor for integrated MRAM
    82.
    发明申请
    Bottom conductor for integrated MRAM 有权
    集成MRAM的底部导体

    公开(公告)号:US20070281427A1

    公开(公告)日:2007-12-06

    申请号:US11891923

    申请日:2007-08-14

    IPC分类号: H01L21/336

    CPC分类号: H01L43/12 H01L27/228

    摘要: A method to fabricate an MTJ device and its connections to a CMOS integrated circuit is described. The device is built out of three layers. The bottom layer serves as a seed layer for the center layer, which is alpha tantalum, while the third, topmost, layer is selected for its smoothness, its compatibility with the inter-layer dielectric materials, and its ability to protect the underlying tantalum.

    摘要翻译: 描述了制造MTJ器件及其与CMOS集成电路的连接的方法。 该设备由三层构建。 底层用作中心层的种子层,其为α钽,而第三最顶层选择为其平滑度,其与层间电介质材料的相容性以及其保护下面的钽的能力。

    Bottom conductor for integrated MRAM
    83.
    发明授权
    Bottom conductor for integrated MRAM 有权
    集成MRAM的底部导体

    公开(公告)号:US07265404B2

    公开(公告)日:2007-09-04

    申请号:US11215276

    申请日:2005-08-30

    IPC分类号: H01L29/76

    CPC分类号: H01L43/12 H01L27/228

    摘要: A structure that is well suited to connecting an MTJ device to a CMOS integrated circuit is described. It is built out of three layers. The bottom layer serves as a seed layer for the center layer, which is alpha tantalum, while the third, topmost, layer is selected for its smoothness, its compatibility with the inter-layer dielectric materials, and its ability to protect the underlying tantalum. A method for its formation is also described.

    摘要翻译: 描述了非常适合于将MTJ设备连接到CMOS集成电路的结构。 它由三层构建。 底层用作中心层的种子层,其为α钽,而第三最顶层选择为其平滑度,其与层间电介质材料的相容性以及其保护下面的钽的能力。 还描述了其形成方法。