公开(公告)号：US20060066560A1

公开(公告)日：2006-03-30

申请号：US11228118

申请日：2005-09-16

申请人： Brian Gally ,  William Cummings

发明人： Brian Gally ,  William Cummings

IPC分类号： G09G3/34

CPC分类号： G09G3/3466 ,  G02B26/001 ,  G09G2310/061 ,  G09G2320/0204

摘要： Apparatus and methods of actuating MEMS display elements are disclosed. The disclosed embodiments can be incorporated into other drive schemes for MEMS display elements. In one embodiment, an apparatus for controlling a MEMS display element to display a frame of video data, said MEMS display element comprising a portion of an array of MEMS display elements, includes an array controller configured to assert a potential difference on said MEMS display element during a first portion of a frame display write process to place the MEMS display element in a first display state, and to assert a potential difference on said MEMS display element during a second portion of the frame display write process to place the MEMS display element in a second display state to display the frame of the video data, where the first display state is different from the second display state. In another embodiment, an array controller asserts a large potential difference across a MEMS display element to affect charge build up and an offset voltage level. In another embodiment, an array controller asserts a series of pulses to rapidly switch the MEMS display element between states to overcome adverse conditions that may affect the operation of the MEMS display element.

公开(公告)号：US20110090136A1

公开(公告)日：2011-04-21

申请号：US12973612

申请日：2010-12-20

申请人： Brian Gally

发明人： Brian Gally

IPC分类号： G09G3/20 ,  H01R43/00

CPC分类号： G02B26/001 ,  Y10T29/49117

摘要： Disclosed herein are iMoD displays optimized by utilizing different materials for one or more different color subpixels. Such optimized displays have improved color gamut over displays where all subpixels are constructed with the same material. Also disclosed are methods for manufacturing such displays and methods for optimizing iMoD displays.

摘要翻译： 本文公开了通过利用用于一个或多个不同颜色子像素的不同材料来优化的iMoD显示器。 这种优化的显示器在显示器上具有改善的色域，其中所有子像素由相同的材料构成。 还公开了用于制造这种显示器的方法和用于优化iMoD显示器的方法。

公开(公告)号：US07869055B2

公开(公告)日：2011-01-11

申请号：US11841633

申请日：2007-08-20

申请人： William Cummings ,  Brian Gally

发明人： William Cummings ,  Brian Gally

IPC分类号： G01B9/02

CPC分类号： B81C99/004 ,  B81B2201/042 ,  G01N21/55 ,  G01N21/9501 ,  G02B26/001

摘要： Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.

摘要翻译： 公开了使用用于制造MEMS器件的至少一些相同工艺步骤制造的过程控制监视器。 过程控制监视器的分析可以提供关于MEMS器件和器件中的部件或子部件的属性的信息。 该信息可用于识别处理中的错误或优化MEMS器件。 在一些实施例中，过程控制监视器的分析可以利用光学测量。

公开(公告)号：US07684107B2

公开(公告)日：2010-03-23

申请号：US11544978

申请日：2006-10-06

申请人： Gang Xu ,  Alan Lewis ,  Brian Gally ,  Mark Mienko

发明人： Gang Xu ,  Alan Lewis ,  Brian Gally ,  Mark Mienko

IPC分类号： G02B26/00 ,  G02F1/29

摘要： An optical isolation structure is incorporated into a display between the display elements and the transparent substrate for the display elements. The optical isolation structure reflects light rays within the substrate that impact the structure at high angles relative to normal to the structure, thereby permitting the substrate to be used as an integrated light guide for distributing light over the display from a light source on the edge of the substrate. The optical isolation structure may include a single layer having an index of refraction less than the substrate or a plurality of thin-film interference layers.

公开(公告)号：US07618831B2

公开(公告)日：2009-11-17

申请号：US11281763

申请日：2005-11-17

申请人： William Cummings ,  Brian Gally

发明人： William Cummings ,  Brian Gally

IPC分类号： H01L21/00

CPC分类号： B81C99/004 ,  B81B2201/042 ,  G01N21/55 ,  G01N21/9501 ,  G02B26/001

摘要： Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.

摘要翻译： 公开了使用用于制造MEMS器件的至少一些相同工艺步骤制造的过程控制监视器。 过程控制监视器的分析可以提供关于MEMS器件和器件中的部件或子部件的属性的信息。 该信息可用于识别处理中的错误或优化MEMS器件。 在一些实施例中，过程控制监视器的分析可以利用光学测量。

公开(公告)号：US07403323B2

公开(公告)日：2008-07-22

申请号：US11281176

申请日：2005-11-17

申请人： William Cummings ,  Brian Gally

发明人： William Cummings ,  Brian Gally

IPC分类号： G02B26/00 ,  G01B11/16 ,  G01B11/02 ,  G03C5/00

CPC分类号： B81C99/004 ,  B81B2201/042 ,  G01N21/55 ,  G01N21/9501 ,  G02B26/001

摘要： Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.

公开(公告)号：US20080112031A1

公开(公告)日：2008-05-15

申请号：US11969818

申请日：2008-01-04

申请人： Brian Gally ,  William Cummings

发明人： Brian Gally ,  William Cummings

IPC分类号： G02F1/01

CPC分类号： G02B26/001

摘要： A specular interferometric modulator array is configured to be at least partially selectably reflective. As such, the array forms a mirror surface having the capability of displaying information to the user while simultaneously being used as a specular mirror. The displayed information may be based on information from an external source, may be programmable, and may be based on user input.

摘要翻译： 镜面干涉式调制器阵列被配置为至少部分地可选择地反射。 因此，阵列形成具有向用户显示信息的能力的镜面，同时被用作镜面反射镜。 显示的信息可以基于来自外部源的信息，可以是可编程的，并且可以基于用户输入。

公开(公告)号：US20060176487A1

公开(公告)日：2006-08-10

申请号：US11198888

申请日：2005-08-05

申请人： William Cummings ,  Brian Gally

发明人： William Cummings ,  Brian Gally

IPC分类号： G01N21/55

CPC分类号： B81C99/004 ,  B81B2201/042 ,  G01N21/55 ,  G01N21/9501 ,  G02B26/001

摘要： Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.

摘要翻译： 公开了使用用于制造MEMS器件的至少一些相同工艺步骤制造的过程控制监视器。 过程控制监视器的分析可以提供关于MEMS器件和器件中的部件或子部件的属性的信息。 该信息可用于识别处理中的错误或优化MEMS器件。 在一些实施例中，过程控制监视器的分析可以利用光学测量。

公开(公告)号：US20060132383A1

公开(公告)日：2006-06-22

申请号：US11064143

申请日：2005-02-22

申请人： Brian Gally ,  William Cummings

发明人： Brian Gally ,  William Cummings

IPC分类号： G09G3/00

CPC分类号： G09G3/3466 ,  G02B6/0011 ,  G02B26/001 ,  H04M1/22

摘要： Abstract of the DisclosureMethods and apparatus are disclosed for directing light from a remote light source into interferometric modulator structures. Light redirectors, including reflective structures, scattering centers, and fluorescent or phosphorescent material, are used to redirect light from a light source into interferometric modulator structures.

摘要翻译： 公开的摘要公开了将来自远程光源的光引导到干涉式调制器结构中的方法和装置。 使用包括反射结构，散射中心和荧光或磷光材料的光重定向器将来自光源的光重定向到干涉式调制器结构中。

公开(公告)号：US20060066872A1

公开(公告)日：2006-03-30

申请号：US11281176

申请日：2005-11-17

申请人： William Cummings ,  Brian Gally

发明人： William Cummings ,  Brian Gally

IPC分类号： G01B11/02

CPC分类号： B81C99/004 ,  B81B2201/042 ,  G01N21/55 ,  G01N21/9501 ,  G02B26/001

摘要： Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.