公开(公告)号：US11060966B2

公开(公告)日：2021-07-13

申请号：US16626444

申请日：2018-06-15

申请人： BYK-GARDNER GMBH

发明人： Peter Schwarz

IPC分类号： G01N21/25 ,  G01B11/25 ,  G01N21/27 ,  G01N21/57

摘要： The invention relates to a docking station 2 for a surface measuring apparatus 1, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surface 4 which can be brought into a covered state in which it is covered from the environment of the docking station 2 and an uncovered state in which it is not covered from the environment of the docking station 2. When the surface measuring apparatus 1 is in the docking station 2 and the reference measuring surface 4 is in the uncovered state, the surface measuring apparatus 1 can perform a reference measurement of the reference measuring surface 4 and can calibrate the surface measuring apparatus 1 using the reference measurement. In contrast, when the reference measuring surface 4 is in the covered state, it is not exposed to the environment of the docking station 2 and is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surface 4 are preferably reached through a movement of the reference measuring surface 4 itself or through a movement of a cover for the reference measuring surface 4.

公开(公告)号：US09417184B2

公开(公告)日：2016-08-16

申请号：US14604182

申请日：2015-01-23

申请人： BYK-Gardner GmbH

发明人： Severin Wimmer

IPC分类号： G01N21/55 ,  G01N21/47 ,  G06K7/14

CPC分类号： G01N21/4785 ,  G01N21/55 ,  G01N2201/13 ,  G06K7/1417

摘要： An apparatus for the calibration of optical measuring instruments with a carrier includes a calibration body having a glass body which has at least one scattering element, wherein the scattering element is completely surrounded by the glass body, and wherein a degree of transmission of the scattering element and of the glass body differ from one another.

公开(公告)号：USD755651S1

公开(公告)日：2016-05-10

申请号：US29504115

申请日：2014-10-02

申请人： BYK-Gardner GmbH

设计人： Heinrich Henssler ,  Martin Schultheiss

公开(公告)号：US07834991B2

公开(公告)日：2010-11-16

申请号：US11774376

申请日：2007-07-06

申请人： Peter Schwarz ,  Konrad Lex

发明人： Peter Schwarz ,  Konrad Lex

IPC分类号： G01N21/00

CPC分类号： G01N21/4738 ,  G01N21/55

摘要： An apparatus for determining surface properties, comprises at least a first radiation device which emits radiation onto a surface to be analyzed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a further radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation.

摘要翻译： 用于确定表面性质的装置包括至少第一辐射装置，其将辐射发射到待分析的表面上，至少第一辐射检测器装置，其接收由至少一个辐射装置发射的辐射的至少一部分，然后散射 或由表面反射并输出至少是反射或散射辐射的特征的第一测量信号，以及至少另外的辐射检测器装置，其接收由至少一个辐射装置发射的辐射的至少一部分，然后散射 或由表面反射，并且输出至少是反射或散射的辐射的特征的第二测量信号。

公开(公告)号：US07679756B2

公开(公告)日：2010-03-16

申请号：US11187694

申请日：2005-07-22

申请人： Uwe Sperling ,  Peter Schwarz

发明人： Uwe Sperling ,  Peter Schwarz

IPC分类号： G01B11/30

CPC分类号： G01N21/57 ,  G01J3/504 ,  G01N2021/575

摘要： A device for examining the optical properties of surfaces includes at least one first radiation device emitting radiation to a surface to be examined at least at a first predetermined spatial angle, at least one first detector for capturing the radiation emitted to and reflected back from the surface, wherein the detector, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface. At least one spatial angle at which the radiation device and/or the detector are positioned, is variable and the radiation device and the detector are positioned in a space at least part of which exhibits light-reflecting properties.

摘要翻译： 用于检查表面的光学特性的装置包括至少一个第一辐射装置，至少以第一预定空间角发射到待检测表面的辐射，至少一个第一检测器，用于捕获从表面发射并从表面反射的辐射 ，其中允许检测到的辐射的局部分辨率的所述检测器相对于所述表面至少位于第二预定空间角度。 辐射装置和/或检测器所在的至少一个空间角度是可变的，并且辐射装置和检测器被定位在其至少一部分呈现光反射性质的空间中。

公开(公告)号：US07630516B2

公开(公告)日：2009-12-08

申请号：US10924361

申请日：2004-08-23

申请人： Konrad Lex

发明人： Konrad Lex

IPC分类号： G06K9/00

CPC分类号： G01B11/303

摘要： A method for characterizing surfaces wherein a first and a second quantity characteristic of roughness of the surface are determined, a first derived quantity is determined by applying mathematical operations to at least said first characteristic quantity and a second derived quantity is determined by applying mathematical operations to at least said second characteristic quantity; wherein an interrelationship between the first and the second derived quantity will be formed which at least partially specifies at least the optical properties of the surface. Finally, the first and the second derived quantities are represented in a common reference frame.

摘要翻译： 一种用于表征表面的方法，其中确定表面的粗糙度的第一和第二量特征，通过对至少所述第一特征量应用数学运算来确定第一导出量，并且通过将数学运算应用于 至少所述第二特征量; 其中将形成第一和第二导出量之间的相互关系，其至少部分地至少部分地指定表面的光学性质。 最后，第一和第二导出量在公共参考系中被表示。

公开(公告)号：US07566894B2

公开(公告)日：2009-07-28

申请号：US11139027

申请日：2005-05-26

申请人： Konrad Lex

发明人： Konrad Lex

IPC分类号： G01N21/86 ,  G02B11/24

CPC分类号： G01N21/57 ,  G01B11/306

摘要： A device for the quantified evaluation of surface characteristics including a first radiation structure which is arranged in a first predetermined angle with respect to a surface to be analyzed and which directs radiation onto the surface to be analyzed, wherein the radiation directed onto the surface has at least one component with wavelengths in the infrared area, a detection apparatus arranged in a second predetermined angle with respect to the surface to be analyzed detecting the radiation radiated onto the surface and being thrown back from it.

摘要翻译： 一种用于量化评估表面特性的装置，包括相对于待分析表面以第一预定角度布置并将辐射引导到待分析表面上的第一辐射结构，其中指向表面的辐射具有 至少一个具有红外区域波长的部件，相对于要分析的表面以第二预定角度布置的检测装置，检测辐射到表面上的辐射并从其中被抛回。

公开(公告)号：US07433055B2

公开(公告)日：2008-10-07

申请号：US11175903

申请日：2005-07-06

申请人： Peter Schwarz ,  Uwe Sperling

发明人： Peter Schwarz ,  Uwe Sperling

IPC分类号： G01B11/30

CPC分类号： G01N21/474 ,  G01N21/8806 ,  G01N2021/8835

摘要： A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

摘要翻译： 用于检查表面的光学性质的装置包括至少一个第一辐射装置，其以第一预定空间角发射到被检查表面的辐射; 至少一个第一检测器装置，用于捕获从表面发射和反射的辐射，其中允许检测到的辐射的局部分辨率的第一检测器装置相对于表面至少定位在第二预定的空间角度; 以及至少一个另外的辐射装置或第二检测器装置，以第三预定的空间角发射到待检测的表面的辐射，或者检测从表面发射并从表面反射的辐射。

公开(公告)号：US20070206195A1

公开(公告)日：2007-09-06

申请号：US11230295

申请日：2005-09-19

申请人： Uwe Sperling

发明人： Uwe Sperling

IPC分类号： G01N21/47

CPC分类号： G01N21/57 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0237 ,  G01J3/10 ,  G01J3/504 ,  G01J3/51 ,  G01J2003/1221

摘要： A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a portion of the radiation emitted from the radiation device and subsequently diffused and/or reflected off a measuring surface and emits at least one measuring signal characteristic of the reflected/diffused radiation, and at least one second radiation detector having a second radiation detector element capturing a portion of the radiation from the radiation device and diffused/reflected off a measuring surface and outputs a measuring signal characteristic of the reflected and/or diffused radiation, and at least one filter device which is placeable both in the optical path between the radiation device and the first radiation detector and in the optical path between the radiation device and the second radiation detector.

摘要翻译： 一种用于确定具有至少一个具有至少一个发射辐射源的辐射源的第一辐射装置的表面的特性的装置，具有至少一个具有第一辐射检测器元件的第一辐射检测器，该第一辐射检测器捕获从辐射装置发射的辐射的至少一部分 并且随后从测量表面扩散和/或反射并且发射反射/扩散辐射的特征的至少一个测量信号，并且至少一个第二辐射检测器具有捕获来自辐射装置的辐射的一部分的第二辐射检测器元件，以及 从测量表面扩散/反射并输出反射和/或扩散辐射特征的测量信号，以及至少一个可放置在辐射装置和第一辐射检测器之间的光路中以及在光路中的滤光器装置 在辐射装置和第二辐射检测器之间。

公开(公告)号：US07177032B2

公开(公告)日：2007-02-13

申请号：US10854926

申请日：2004-05-27

申请人： Konrad Lex

发明人： Konrad Lex

IPC分类号： G01B11/30

CPC分类号： G01B11/303 ,  G01J1/00 ,  G01N21/474

摘要： A method for determining the properties of surfaces wherein a first process step specified radiation emits from at least one radiation source to a measuring surface, in further process steps the radiation reflected and/or scattered off the measuring surface is detected by a plurality of image-capturing components, and a signal is generated which specifies at least one parameter of the radiation detected by the image-capturing components. In further process steps the first signals are grouped based on predetermined criteria to form group signals, and at least one group-specific evaluation figure is computed, and a dependent statistical parameter correlating with at least one measuring surface remission characteristic. Finally at least one statistical parameter is read out in dependence on the predetermined criterion for grouping said first signals. The properties of the surface are specified by a relation between at least two statistical parameters.

摘要翻译： 一种用于确定表面性质的方法，其中特定辐射的第一工艺步骤从至少一个辐射源发射到测量表面，在进一步的处理步骤中，由测量表面反射和/或散射的辐射被多个图像 - 捕获组件，并且生成指定由图像捕获组件检测到的辐射的至少一个参数的信号。 在进一步的处理步骤中，基于预定标准对第一信号进行分组以形成组信号，并且计算至少一个组特定评估图，以及与至少一个测量表面缓解特性相关的依赖统计参数。 最后，根据用于对所述第一信号进行分组的预定标准，读出至少一个统计参数。 表面的属性由至少两个统计参数之间的关系指定。