SILICON DETECTOR ASSEMBLY FOR X-RAY IMAGING
    1.
    发明申请
    SILICON DETECTOR ASSEMBLY FOR X-RAY IMAGING 有权
    硅检测器组件进行X射线成像

    公开(公告)号:US20100204942A1

    公开(公告)日:2010-08-12

    申请号:US12488930

    申请日:2009-06-22

    IPC分类号: G06F19/00 G01T1/24 G06F15/00

    CPC分类号: G01T1/242 G01T1/243

    摘要: A Silicon detector for x-ray imaging is based on multiple semiconductor detector modules (A) arranged together to form an overall detector area, where each semiconductor detector module includes an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in the x-ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV to provide the spatial and energy information from these interactions to enable an image of an object. Further, anti-scatter modules (B) are interfolded between at least a subset of the semiconductor detector modules to at least partly absorb Compton scattered x-rays.

    摘要翻译: 用于X射线成像的硅检测器基于多个半导体检测器模块(A),其布置在一起以形成整体检测器区域,其中每个半导体检测器模块包括结晶硅的X射线传感器,其朝向入射的X射线 并连接到集成电路,用于通过光电效应和通过康普顿散射以及在40keV至250keV之间的入射x射线能量在x射线传感器中相互作用的X射线配准,以提供来自这些相互作用的空间和能量信息 以启用对象的图像。 此外,防散射模块(B)在半导体检测器模块的至少一个子集之间被折叠以至少部分地吸收康普顿散射的X射线。

    Silicon detector assembly for X-ray imaging
    2.
    发明授权
    Silicon detector assembly for X-ray imaging 有权
    硅检测器组件用于X射线成像

    公开(公告)号:US08183535B2

    公开(公告)日:2012-05-22

    申请号:US12488930

    申请日:2009-06-22

    IPC分类号: G01T1/24

    CPC分类号: G01T1/242 G01T1/243

    摘要: A Silicon detector for x-ray imaging is based on multiple semiconductor detector modules (A) arranged together to form an overall detector area, where each semiconductor detector module includes an x-ray sensor of crystalline Silicon oriented edge-on to incoming x-rays and connected to integrated circuitry for registration of x-rays interacting in the x-ray sensor through the photoelectric effect and through Compton scattering and for an incident x-ray energy between 40 keV and 250 keV to provide the spatial and energy information from these interactions to enable an image of an object. Further, anti-scatter modules (B) are interfolded between at least a subset of the semiconductor detector modules to at least partly absorb Compton scattered x-rays.

    摘要翻译: 用于X射线成像的硅检测器基于多个半导体检测器模块(A),其布置在一起以形成整体检测器区域,其中每个半导体检测器模块包括结晶硅的X射线传感器,其朝向入射的X射线 并连接到集成电路,用于通过光电效应和通过康普顿散射以及在40keV至250keV之间的入射x射线能量在x射线传感器中相互作用的X射线配准,以提供来自这些相互作用的空间和能量信息 以启用对象的图像。 此外,抗散射模块(B)在半导体检测器模块的至少一个子集之间被折叠,以至少部分地吸收康普顿散射的x射线。

    Approach and device for focusing x-rays
    3.
    发明授权
    Approach and device for focusing x-rays 有权
    聚焦X射线的方法和设备

    公开(公告)号:US07742574B2

    公开(公告)日:2010-06-22

    申请号:US12081235

    申请日:2008-04-11

    申请人: Staffan Karlsson

    发明人: Staffan Karlsson

    IPC分类号: G21K1/06 G01T1/30

    摘要: A new device for x-ray optics is proposed which is an analogous to zone plates but works for higher x-ray energies. This is achieved by using both refraction and diffraction of the x-rays and building the new device(s) in a three dimensional structure, contrary to the zone plates which are basically a two dimensional device. The three dimensional structure is built from a multitude of prisms, utilizing both refraction and diffraction of incoming x-rays to shape the overall x-ray flux. True two dimensional focusing is achieved in the x-ray energy range usually employed in medical imaging and may be used in a wide area of applications in this field and in other fields of x-ray imaging. The device can be readily produced in large volumes.

    摘要翻译: 提出了一种用于x射线光学器件的新器件,其类似于区域板,但适用于较高的x射线能量。 这是通过使用x射线的折射和衍射和以三维结构建立新的装置来实现的,这与基本上是二维装置的区域板相反。 三维结构由多个棱镜构成,利用入射X射线的折射和衍射来整形X射线通量。 在通常用于医学成像的x射线能量范围内实现真正的二维聚焦,并且可以在该领域和在其他X射线成像领域的广泛应用领域中使用。 该装置可以容易地大量生产。

    IMAGE QUALITY IN PHOTON COUNTING-MODE DETECTOR SYSTEMS
    4.
    发明申请
    IMAGE QUALITY IN PHOTON COUNTING-MODE DETECTOR SYSTEMS 有权
    光电计数模式检测系统的图像质量

    公开(公告)号:US20100215230A1

    公开(公告)日:2010-08-26

    申请号:US12707076

    申请日:2010-02-17

    IPC分类号: G06K9/40 G01T1/24

    摘要: The current invention applies to photon counting silicon x-ray detectors with energy discriminating capabilities and applications in x-ray imaging systems. The overall image quality produced by such a system is improved by the presented novel methods for optimally using the energy information in Compton events and making selective use of counts induced from charges collected in neighboring pixels. The pile-up problem during high-flux imaging regimes is reduced by a novel method for signal reset, which improves the count efficiency by reducing the risk of losing event due to signal pile-up in the read out electronics chain.

    摘要翻译: 本发明适用于具有能量鉴别能力和x射线成像系统中的应用的光子计数硅x射线检测器。 通过提出的用于最佳地使用康普顿事件中的能量信息的新颖方法并且选择性地使用从相邻像素中收集的电荷引起的计数来改善由这样的系统产生的整体图像质量。 高通量成像方案中的堆积问题通过一种用于信号复位的新颖方法来减少,通过降低由于读出的电子链中的信号堆积而导致的事件丢失的风险,提高了计数效率。