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公开(公告)号：US09171650B2
公开(公告)日：2015-10-27
申请号：US14233188
申请日：2012-07-19
CPC分类号： G21K1/06 , A61B6/4233 , A61B6/4291 , A61B6/484 , A61B6/585 , A61B6/587 , G01N23/04 , G01N23/20075 , G01N2223/313 , G01N2223/401
摘要： A method of aligning masks for phase imaging or phase contrast imaging in X-ray apparatus using a pixel-type X-ray detector makes use of non-idealities of all real detectors. A mask may be provided before the sample to generate beams, adjacent to the pixels of the detector or both. The method includes moving the mask into a plurality of translational position increments and identifying the increment for which the intensity has a maximum or minimum. The identified value of the increment may vary over the pixels of the detector. Alignment positions are selected in which steps in a plot of the increment over the area of the detector are minimized and/or aligned with the rows and columns of pixels.
摘要翻译： 使用像素型X射线检测器在X射线设备中对准用于相位成像或相位对比成像的掩模的方法利用了所有真实检测器的非理想性。 可以在样品之前提供掩模以产生与检测器的像素相邻的光束或两者。 该方法包括将掩模移动到多个平移位置增量中并且识别强度具有最大或最小值的增量。 增量的识别值可以在检测器的像素上变化。 选择对准位置，其中在检测器的区域上的增量的图中的步骤被最小化和/或与像素的行和列对准。
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公开(公告)号：US20140233697A1
公开(公告)日：2014-08-21
申请号：US14233188
申请日：2012-07-19
CPC分类号： G21K1/06 , A61B6/4233 , A61B6/4291 , A61B6/484 , A61B6/585 , A61B6/587 , G01N23/04 , G01N23/20075 , G01N2223/313 , G01N2223/401
摘要： A method of aligning masks for phase imaging or phase contrast imaging in X-ray apparatus using a pixel-type X-ray detector makes use of non-idealities of all real detectors. A mask may be provided before the sample to generate beams, adjacent to the pixels of the detector or both. The method includes moving the mask into a plurality of translational position increments and identifying the increment for which the intensity has a maximum or minimum. The identified value of the increment may vary over the pixels of the detector. Alignment positions are selected in which steps in a plot of the increment over the area of the detector are minimised and/or aligned with the rows and columns of pixels.
摘要翻译： 使用像素型X射线检测器在X射线设备中对准用于相位成像或相位对比成像的掩模的方法利用了所有真实检测器的非理想性。 可以在样品之前提供掩模以产生与检测器的像素相邻的光束或两者。 该方法包括将掩模移动到多个平移位置增量中并且识别强度具有最大或最小值的增量。 增量的识别值可以在检测器的像素上变化。 选择对准位置，其中在检测器的区域上的增量的图中的步骤被最小化和/或与像素的行和列对准。
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公开(公告)号：US09164045B2
公开(公告)日：2015-10-20
申请号：US14233050
申请日：2012-07-19
CPC分类号： G01N23/04 , A61B6/4291 , A61B6/484 , A61B6/5205 , G01N23/046 , G01N2223/419
摘要： A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.
摘要翻译： 相位成像的方法使用具有与像素重叠的边缘的X射线束。 可以使用一个或多个X射线束从第一和第二图像获得相位图像，第一图像是用第一边缘测量的，而不是每个X射线束的第二边缘与相应的像素重叠，而第二个 用第二边缘测量的图像，但不是第一边缘与相应的像素重叠。 可以计算X射线吸收函数的梯度，并且在图像处理中包括比例项以计算定量相位图像。
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公开(公告)号：US20140233699A1
公开(公告)日：2014-08-21
申请号：US14233050
申请日：2012-07-19
IPC分类号： G01N23/04
CPC分类号： G01N23/04 , A61B6/4291 , A61B6/484 , A61B6/5205 , G01N23/046 , G01N2223/419
摘要： A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.
摘要翻译： 相位成像的方法使用具有与像素重叠的边缘的X射线束。 可以使用一个或多个X射线束从第一和第二图像获得相位图像，第一图像是用第一边缘测量的，而不是每个X射线束的第二边缘与相应的像素重叠，而第二个 用第二边缘测量的图像，但不是第一边缘与相应的像素重叠。 可以计算X射线吸收函数的梯度，并且在图像处理中包括比例项以计算定量相位图像。
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公开(公告)号：US07869567B2
公开(公告)日：2011-01-11
申请号：US12439742
申请日：2007-09-03
IPC分类号： G01N23/20
CPC分类号： G01N23/04
摘要： Phase contrast imaging is achieved using a sample mask 8 and a detector mask (6). X-rays emitted from x-ray source (2) are formed into individual beams (16) by sample mask which pass through sample (14) and arrive at individual pixels (12) of the detector (4) through detector mask (6). The individual x-ray beams are arranged to hit the pixel edge (20) of individual rows of pixels, individual columns of pixels or individual pixels. Small deviations θ in the individual beams (16) cause a significant increase or decrease in the signal hitting the exposed area (22) of the pixel resulting in a significant phase contrast signal.
摘要翻译： 使用样品掩模8和检测器掩模（6）实现相位成像。 从X射线源（2）发射的X射线通过样本掩模通过样本（14）形成为单独的束（16），并通过检测器掩模（6）到达检测器（4）的各个像素（12） 。 各个x射线束被布置成撞击各行像素的像素边缘（20），各个像素列或单个像素。 小偏差 在单独的光束（16）中，导致信号撞击像素的曝光区域（22）的显着增加或减小，导致显着的相位相差信号。
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公开(公告)号：US20100054415A1
公开(公告)日：2010-03-04
申请号：US12439742
申请日：2007-09-03
CPC分类号： G01N23/04
摘要： Phase contrast imaging is achieved using a sample mask 8 and a detector mask (6). X-rays emitted from x-ray source (2) are formed into individual beams (16) by sample mask which pass through sample (14) and arrive at individual pixels (12) of the detector (4) through detector mask (6). The individual x-ray beams are arranged to hit the pixel edge (20) of individual rows of pixels, individual columns of pixels or individual pixels. Small deviations θ in the individual beams (16) cause a significant increase or decrease in the signal hitting the exposed area (22) of the pixel resulting in a significant phase contrast signal.
摘要翻译： 使用样品掩模8和检测器掩模（6）实现相位成像。 从X射线源（2）发射的X射线通过样本掩模通过样本（14）形成为单独的束（16），并通过检测器掩模（6）到达检测器（4）的各个像素（12） 。 各个x射线束被布置成撞击各行像素的像素边缘（20），各个像素列或单个像素。 小偏差 在单独的光束（16）中，导致信号撞击像素的曝光区域（22）的显着增加或减小，导致显着的相位相差信号。
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