公开(公告)号：US07290434B2

公开(公告)日：2007-11-06

申请号：US11017676

申请日：2004-12-22

申请人： Jürgen Ammann ,  Alfred Peer ,  René Oberlin ,  Klaus-Dieter Anders ,  Christian Zwicky

发明人： Jürgen Ammann ,  Alfred Peer ,  René Oberlin ,  Klaus-Dieter Anders ,  Christian Zwicky

IPC分类号： G01N21/00

CPC分类号： G01N27/4165

摘要： An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (TS/M) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.

摘要翻译： 公开了一种示例性方法，其用于确定集成在具有一个或多个系统级的处理系统的处理容器中的至少一个测量探针的状态，并且使用例如CIP-和 SIP过程，无需卸载测量探头进行清洁。 测量探针或测量探头周围的介质的温度可以通过布置在测量探头的内部或外部的测量传感器来测量，并且可以基于温度记录来确定测量探针的状态（T _{S / M ）。 在某些情况下，该方法可以包括监视CIP和SIP进程的正确执行。}

公开(公告)号：US20050166660A1

公开(公告)日：2005-08-04

申请号：US11017676

申请日：2004-12-22

申请人： Jurgen Ammann ,  Alfred Peer ,  Rene Oberlin ,  Klaus-Dieter Anders ,  Christian Zwicky

发明人： Jurgen Ammann ,  Alfred Peer ,  Rene Oberlin ,  Klaus-Dieter Anders ,  Christian Zwicky

IPC分类号： G01N17/02 ,  G01N27/06 ,  G01N27/26 ,  G01N27/416 ,  G01N33/20

CPC分类号： G01N27/4165

摘要： An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (TS/M) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.

摘要翻译： 公开了一种示例性方法，其用于确定集成在具有一个或多个系统级的处理系统的处理容器中的至少一个测量探针的状态，并且使用例如CIP-和 SIP过程，无需卸载测量探头进行清洁。 测量探针或测量探头周围的介质的温度可以通过布置在测量探头的内部或外部的测量传感器来测量，并且可以基于温度记录来确定测量探针的状态（T _{S / M ）。 在某些情况下，该方法可以包括监视CIP和SIP进程的正确执行。}