摘要:
A system and method for measuring optical characteristics of an optical device under test (DUT) is provided. The system includes a light source for generating an optical signal applied to the optical DUT. A reference interferometer and a test interferometer are optically coupled to the light source. A computing unit is coupled to the interferometers, and utilizes amplitude and phase computing components, such as orthogonal filters, in determining optical characteristics of the optical DUT.
摘要:
A method and system for measuring optical characteristics of a sub-component within a composite optical system is disclosed. In one embodiment, the present invention generates an optical response from a composite optical system. The present embodiment then separates an optical response of a sub-component from the optical response of the composite optical system. The present embodiment then determines the optical characteristics of the sub-component by utilizing at least one portion of the optical response of the sub-component.
摘要:
In the measurements of optical characteristics, such as measurements of group delay using an interferometric system, vibration noise can be at least partially offset by providing corrections on the basis of detecting light patterns that are indicative of the vibration noise. In each embodiment, light beams propagating through first and second paths are combined to form an interference signal, which is analyzed to provide the basis for the adjustments.
摘要:
A heterodyne optical network analyzer and method for device characterization reduces the effect of relative intensity noise (RIN) in interferometric optical measurements by subtracting the measured intensities of first and second interference signals derived from an optical interferometer. The first and second interference signals are produced by combining a first lightwave transmitted to an optical device being characterized with a second lightwave, which is a delayed version of the first lightwave. The first and second lightwaves are derived by splitting an input lightwave having a continuously swept optical frequency generated by a light source, such as a continuously tunable laser.
摘要:
The present invention relates to determination of a property of an optical device under test, e.g. the group-delay of the optical device under test, by: tuning an optical frequency &lgr; of an optical beam, deriving a dependency of the optical frequency &lgr; of the optical beam over a first time period t, deriving a dependency of the optical property of the device under test over a second time period t+&Dgr;t, synchronizing the time dependency of the optical frequency &lgr; of the optical beam with the time dependency of the optical property of the device under test, and deriving the frequency dependency of the optical property of the device under test from the synchronized time dependencies.