摘要:
An X-ray inspection system includes an X-ray source that generates more than one beam defining an inspection plane, the beams being substantially parallel to each other; an X-ray detector having a plurality of detector arrays, each of which is aligned with one of the beams, and structure for supporting an object between the X-ray source and the X-ray detector. The X-ray source includes an electron gun and a device for steering an electron beam generated by the gun to multiple focal spots on a target.
摘要:
A linear array detector (LAD) for scanning an object is provided. The detector includes a scintillator layer configured for generating a number of optical signals representative of a fraction of an incident X-ray beam passing through the object. The plane of the scintillator is parallel to the X-ray beam. The LAD further includes a two dimensional array of photo-conversion elements configured to receive several X-rays of the X-ray beams and configured to generate corresponding electrical signals. An arrangement of the photo-conversion elements is independent of the X-ray paths.
摘要:
An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.
摘要:
A system and method for radiographic inspection of an aircraft fuselage includes a radiation source located on one side of the fuselage and a plurality of radiation detectors located on another side of the fuselage. The system includes manipulators for moving the radiation source and the radiation detectors in a coordinated fashion. Radiation detected by the radiation detectors is processed to display stereoscopic images of areas of interest of the fuselage. The radiation source and detector positions are manipulated to obtain multiple sets of images from different viewing angles. The multiple sets of images are used to produce the stereoscopic images.
摘要:
A detector (20) for high voltage x-rays includes a plurality of sensor elements (22) with each sensor element being aligned along a respective focal axis (25) with respect to a high voltage x-ray source (24). A fiber optic scintillator (34) is optically coupled to each of said sensor elements and is disposed to receive incident x-ray radiation passing from the object to be imaged. Optical fibers of the scintillator are positioned such that their optical axes are perpendicular to incident x-rays. Each sensor element has a length along the focal axis sufficiently long for the fibers to absorb substantially all incident x-rays. Each sensor element comprises an array of amorphous silicon photosensors disposed to detect light generated by the scintillator.
摘要:
A method for non-destructive examination of components within an assembly is described. The method includes producing an image of at least a portion of the assembly, extracting a point cloud of the image, registering the point cloud to a CAD coordinate system, and determining points in the point cloud of the image that are more than a selected distance from surfaces on a corresponding CAD model utilizing the same CAD coordinate system. The method also includes utilizing the determined points to detect the presence of anomalies within the assembly.
摘要:
A radiographic inspection system includes an electron gun, a fixed anode of a dense material, and apparatus for steering an electron beam generated by the electron gun to multiple focal spots on the anode. A detector includes a plurality of individual detector elements. Operation of the system includes is carried out by directing the electron beam at a first time interval to a first focal spot on the anode, generating a first X-ray beam aligned with a first detector element. During a second time interval, the electron beam is directed to a second focal spot on the anode, spaced-away from the first focal spot, generating a second X-ray beam aligned with a second detector element. This cycle is repeated with additional focal spots in a one-dimensional or two-dimensional pattern. The detector element output is read in coordination with the position of the electron beam.
摘要:
A collimator for an X-ray inspection apparatus is provided comprising a carrier having a planar top surface; an arcuate base disposed on the carrier, comprising at least one arcuate bar section made from a radio-opaque material; and a plurality of radio-opaque collimator plates disposed on the arcuate base in a radial array with a bottom edge of each collimator plate in contact with the top surface of the arcuate base. A method for assembling such a collimator is also provided, as well as an alignment fixture useful for practicing the described method. The described structure, method, and alignment fixture permit the construction of large collimator assemblies while maintaining precision and minimizing cost.