公开(公告)号：US06167110A

公开(公告)日：2000-12-26

申请号：US963519

申请日：1997-11-03

申请人： Gerorge Edward Possin ,  Andrew Joseph Galish ,  Ralph Gerald Isaacs ,  Douglas Albagli ,  Ching-Yeu Wei ,  Thomas William Birdwell ,  Francis Howard Little ,  Sung Su Han

发明人： Gerorge Edward Possin ,  Andrew Joseph Galish ,  Ralph Gerald Isaacs ,  Douglas Albagli ,  Ching-Yeu Wei ,  Thomas William Birdwell ,  Francis Howard Little ,  Sung Su Han

IPC分类号： G01T5/08 ,  H05G1/60

CPC分类号： G01T1/201

摘要： A detector (20) for high voltage x-rays includes a plurality of sensor elements (22) with each sensor element being aligned along a respective focal axis (25) with respect to a high voltage x-ray source (24). A fiber optic scintillator (34) is optically coupled to each of said sensor elements and is disposed to receive incident x-ray radiation passing from the object to be imaged. Optical fibers of the scintillator are positioned such that their optical axes are perpendicular to incident x-rays. Each sensor element has a length along the focal axis sufficiently long for the fibers to absorb substantially all incident x-rays. Each sensor element comprises an array of amorphous silicon photosensors disposed to detect light generated by the scintillator.

摘要翻译： 用于高电压X射线的检测器（20）包括多个传感器元件（22），其中每个传感器元件相对于高压x射线源（24）沿相应的焦点轴线对齐。 光纤闪烁体（34）被光学耦合到每个所述传感器元件并被设置成接收从待成像的物体通过的入射的x射线辐射。 闪烁体的光纤被定位成使得它们的光轴垂直于入射的X射线。 每个传感器元件具有沿着焦点轴线的足够长的长度以使纤维基本上吸收所有入射的X射线。 每个传感器元件包括设置成检测由闪烁体产生的光的非晶硅光电传感器的阵列。

公开(公告)号：US06711235B2

公开(公告)日：2004-03-23

申请号：US10161276

申请日：2002-05-31

申请人： Andrew Joseph Galish ,  Thomas William Birdwell ,  Ralph Gerald Isaacs ,  Francis Howard Little

发明人： Andrew Joseph Galish ,  Thomas William Birdwell ,  Ralph Gerald Isaacs ,  Francis Howard Little

IPC分类号： G21K102

CPC分类号： G01N23/04 ,  G01N2223/316 ,  G21K1/025

摘要： An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.

摘要翻译： 提供具有X射线源和第一和第二准直仪的X射线检查系统。 第一和第二准直器相对于源和目标被布置，使得由X射线束实际照射的目标的部分基本上等于所选择的检查区的大小。

公开(公告)号：US20100194749A1

公开(公告)日：2010-08-05

申请号：US12363458

申请日：2009-01-30

申请人： Gerald Bernard Nightingale ,  Andrew Joseph Galish ,  Francis Howard Little

发明人： Gerald Bernard Nightingale ,  Andrew Joseph Galish ,  Francis Howard Little

IPC分类号： G06T17/00 ,  H05G1/60

CPC分类号： G01N23/046 ,  G01N2223/419 ,  G01N2223/63 ,  G06T7/001 ,  G06T2207/10081 ,  G06T2207/30164

摘要： A method for non-destructive examination of components within an assembly is described. The method includes producing an image of at least a portion of the assembly, extracting a point cloud of the image, registering the point cloud to a CAD coordinate system, and determining points in the point cloud of the image that are more than a selected distance from surfaces on a corresponding CAD model utilizing the same CAD coordinate system. The method also includes utilizing the determined points to detect the presence of anomalies within the assembly.

摘要翻译： 描述了用于组件内的部件的非破坏性检查的方法。 该方法包括产生组件的至少一部分的图像，提取图像的点云，将点云注册到CAD坐标系，以及确定图像的点云中多于所选距离的点 使用相同的CAD坐标系在相应的CAD模型的表面上。 该方法还包括利用确定的点来检测组件内的异常的存在。

公开(公告)号：US06687334B2

公开(公告)日：2004-02-03

申请号：US10161463

申请日：2002-05-31

申请人： Andrew Joseph Galish ,  Dean Frederick Graber ,  Douglas Edward Ingram ,  Francis Howard Little

发明人： Andrew Joseph Galish ,  Dean Frederick Graber ,  Douglas Edward Ingram ,  Francis Howard Little

IPC分类号： G21K102

CPC分类号： G21K1/025

摘要： A collimator for an X-ray inspection apparatus is provided comprising a carrier having a planar top surface; an arcuate base disposed on the carrier, comprising at least one arcuate bar section made from a radio-opaque material; and a plurality of radio-opaque collimator plates disposed on the arcuate base in a radial array with a bottom edge of each collimator plate in contact with the top surface of the arcuate base. A method for assembling such a collimator is also provided, as well as an alignment fixture useful for practicing the described method. The described structure, method, and alignment fixture permit the construction of large collimator assemblies while maintaining precision and minimizing cost.

摘要翻译： 提供了一种用于X射线检查装置的准直器，其包括具有平面顶表面的载体; 设置在所述载体上的弓形基部，包括由不透射线材料制成的至少一个弓形棒部分; 以及多个放射线不透明的准直器板，其以径向阵列设置在弧形基座上，每个准直板的底部边缘与弓形基座的顶面接触。 还提供了一种用于组装这种准直仪的方法，以及用于实践所述方法的对准夹具。 所描述的结构，方法和对准夹具允许构建大的准直器组件，同时保持精度并最小化成本。

公开(公告)号：US06985238B2

公开(公告)日：2006-01-10

申请号：US10065192

申请日：2002-09-25

申请人： Ralph Gerald Isaacs ,  John Charles Janning ,  Francis Howard Little ,  James Robert Reinhardt ,  Joseph Benjamin Ross

发明人： Ralph Gerald Isaacs ,  John Charles Janning ,  Francis Howard Little ,  James Robert Reinhardt ,  Joseph Benjamin Ross

IPC分类号： G01B11/24

CPC分类号： G01B11/24

摘要： A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held in a predetermined, fixed position. The part is aligned in a co-ordinate system for obtaining accurate measurements of the part's surface (S) and edges (E). For parts smaller than the optical sensor's field of view, the part is rotated about an axis so both sides of the part are viewed by the sensor. If required, the part can also be shifted linearly along a horizontal axis (X) parallel to the sensor. For parts larger in size than the sensor's field of view, the part is moved along a vertical axis (Y) in predetermined segments so all of the part is exposed to viewing by the sensor.

摘要翻译： 一种使用非接触式光学传感器的非接触式测量系统和具有定位系统的边缘检测传感器，用于使传感器在保持在预定的固定位置的部分（A）的表面和边缘上移动。 该零件在坐标系中对齐，用于获得零件表面（S）和边缘（E）的精确测量。 对于小于光学传感器视野的部件，部件绕轴线旋转，从而通过传感器观察部件的两侧。 如果需要，零件也可以沿着平行于传感器的水平轴线（X）线性移动。 对于尺寸大于传感器视野的部件，部件沿着预定段的垂直轴（Y）移动，因此所有部分都被传感器曝光。

公开(公告)号：US08205500B2

公开(公告)日：2012-06-26

申请号：US12277884

申请日：2008-11-25

申请人： Yanyan Wu ,  Edward James Nieters ,  Thomas James Batzinger ,  Nicholas Joseph Kray ,  James Norman Barshinger ,  Jian Li ,  Waseem Ibrahim Faidi ,  Prabhjot Singh ,  Francis Howard Little ,  Michael Everett Keller ,  Timothy Jesse Sheets

发明人： Yanyan Wu ,  Edward James Nieters ,  Thomas James Batzinger ,  Nicholas Joseph Kray ,  James Norman Barshinger ,  Jian Li ,  Waseem Ibrahim Faidi ,  Prabhjot Singh ,  Francis Howard Little ,  Michael Everett Keller ,  Timothy Jesse Sheets

IPC分类号： G01N29/44 ,  G01B5/00

CPC分类号： G01N29/07 ,  G01N29/0654 ,  G01N29/4418 ,  G01N2291/011

摘要： An ultrasound inspection system is provided for inspecting an object. The inspection system includes an ultrasound probe configured to scan the object and acquire a plurality of ultrasound scan data. The inspection system further includes a processor coupled to the ultrasound probe and configured to apply a transfer function to the ultrasound scan data to compensate for distortion of a plurality of ultrasound signals through the object and thereby generate a plurality of compensated ultrasound scan data, and to process the compensated ultrasonic scan data to characterize a feature in the object.

摘要翻译： 提供用于检查物体的超声检查系统。 检查系统包括被配置为扫描对象并获取多个超声扫描数据的超声波探头。 所述检查系统还包括处理器，其耦合到所述超声波探头并且被配置为将所述传递函数应用于所述超声波扫描数据以补偿通过所述物体的多个超声信号的失真，从而生成多个经补偿的超声波扫描数据，并且 处理补偿的超声波扫描数据以表征物体中的特征。

公开(公告)号：US07840367B2

公开(公告)日：2010-11-23

申请号：US11946244

申请日：2007-11-28

申请人： Francis Howard Little ,  Yanyan Wu ,  Prabhjot Singh

发明人： Francis Howard Little ,  Yanyan Wu ,  Prabhjot Singh

IPC分类号： G01B11/03 ,  G06F17/00

CPC分类号： G01B11/03 ,  G01B5/008

摘要： An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.

摘要翻译： 检查工件包括中央部分和布置在中心部分上的多个光学和坐标测量机（CMM）对准特征。 光学和CMM对准特征被配置为将光学或CMM测量系统的坐标与公共坐标系对准。 另一种检查工件包括布置在中心部分上的中心部分和多个计算机断层摄影（CT）对准特征。 CT对准特征被配置为将CT系统的坐标与公共坐标系对齐。

公开(公告)号：US08010315B2

公开(公告)日：2011-08-30

申请号：US11945456

申请日：2007-11-27

申请人： Yanyan Wu ,  Francis Howard Little ,  Prabhjot Singh

发明人： Yanyan Wu ,  Francis Howard Little ,  Prabhjot Singh

IPC分类号： G01C9/00 ,  G01N21/00

CPC分类号： G06K9/32 ,  G06K9/00 ,  G06K2209/19

摘要： An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component.

摘要翻译： 提供检查方法，包括获取至少一个检查数据集。 每个检查数据组包括组件的检查数据。 检查方法还包括将检查数据集映射到部件的三维（3D）模型上，以生成用于部件的3D检查模型，并使用至少一个验证来验证检测数据对组件的3D模型 标准。 还提供了一种多模式检查方法，包括获取对应于组件的多个检查模式的多个检查数据集，并将检验数据集合并形成融合数据集。 多模式检查方法还包括将融合数据集映射到组件的3D模型上，以生成用于组件的3D多模态检查模型。

公开(公告)号：US20090138231A1

公开(公告)日：2009-05-28

申请号：US11946244

申请日：2007-11-28

申请人： Francis Howard Little ,  Yanyan Wu ,  Prabhjot Singh

发明人： Francis Howard Little ,  Yanyan Wu ,  Prabhjot Singh

IPC分类号： G01B11/03 ,  G01B11/26

CPC分类号： G01B11/03 ,  G01B5/008

摘要： An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.

摘要翻译： 检查工件包括中央部分和布置在中心部分上的多个光学和坐标测量机（CMM）对准特征。 光学和CMM对准特征被配置为将光学或CMM测量系统的坐标与公共坐标系对准。 另一种检查工件包括布置在中心部分上的中心部分和多个计算机断层摄影（CT）对准特征。 CT对准特征被配置为将CT系统的坐标与公共坐标系对齐。

公开(公告)号：US07099017B2

公开(公告)日：2006-08-29

申请号：US10446295

申请日：2003-05-28

申请人： Kevin George Harding ,  Francis Howard Little ,  Joseph Benjamin Ross ,  Jeffery John Reverman

发明人： Kevin George Harding ,  Francis Howard Little ,  Joseph Benjamin Ross ,  Jeffery John Reverman

IPC分类号： G01B11/24 ,  G06K9/36

CPC分类号： G01B11/285 ,  G01B11/24

摘要： A method and apparatus for measuring an opening defined within object using an optical sensor system is provided. The method includes positioning an illumination source adjacent the opening, illuminating a perimeter circumscribing the opening, receiving an image of the illuminated boundary, and calculating an area within the received boundary. The system includes a light source oriented to project a first sheet of light intersected by a first portion of the opening perimeter, the light source projecting a second sheet of light intersected by a second portion of the opening perimeter, a light detector receiving a portion of the sheet of light intersected by the object opening perimeter and reflected toward the light detector, and an image processor communicatively coupled to the light detector, the image processor programmed to sample an image from the detector and programmed determine the dimensions of the object opening from the sampled image.

摘要翻译： 提供一种使用光学传感器系统测量在物体内限定的开口的方法和装置。 该方法包括将照明源定位在靠近开口处，照亮围绕开口的周边，接收照明边界的图像，以及计算接收边界内的区域。 该系统包括一个光源，该光源被定向成投影由开口周边的第一部分相交的第一片光，该光源投射与该开口周边的第二部分相交的第二片光，一光接收器， 所述光束被物体开口周边相交并且朝向光检测器反射;以及图像处理器，其通信地耦合到光检测器，所述图像处理器被编程为从所述检测器采样图像，并且被编程以确定所述物体开口的尺寸 采样图像。