Passive polarization stabilizer
    1.
    发明授权
    Passive polarization stabilizer 失效
    被动极化稳定器

    公开(公告)号:US06941032B2

    公开(公告)日:2005-09-06

    申请号:US09883241

    申请日:2001-06-19

    CPC classification number: G02B6/2746 G02B6/126 G02B6/34 G02B27/286 H04B10/2572

    Abstract: In an interferometer configuration, a retarder in the form of a half-wave plate (125) and a phase shifter in the form of a glass plate (120) are arranged in one arm (114). The phase shifter provides an optical path difference between the interferometer arms which needs to be greater than the coherence length of the input light to be polarization stabilized. A polarizer in the form of a linear polarizer (118) aligned at 45° to the half-wave plate is arranged across both interferometer arms (114 & 116). Polarization stabilization action is achieved by the retarder in combination with the polarizer. More specifically, for at least one input polarization state, the polarization states in the two interferometer arms are rendered orthogonal by the retarder, the polarizer being aligned to allow only one of the two orthogonal states to be transmitted, the other being absorbed. The device is expected to find application for WDM networks based on broadband sources, such as superluminescent diodes. The device is also expected to be useful for providing a front-end polarization stabilization of the signal supplied to optical elements that are sensitive to the polarization state of their input. Examples of such elements are semiconductor optical amplifiers, integrated optical splitters and electro-optical switches.

    Abstract translation: 在干涉仪配置中,在一个臂(114)中布置了半波片(125)形式的延迟器和玻璃板(120)形式的移相器。 移相器提供干涉仪臂之间的光程差,其需要大于要偏振稳定的输入光的相干长度。 以与半波片成45°的方式对齐的线性偏振器(118)形式的偏振器布置在两个干涉仪臂(114和116)之间。 偏振稳定作用通过缓凝剂与偏振器的组合来实现。 更具体地,对于至少一个输入偏振状态,两个干涉仪臂中的偏振状态由延迟器使其正交,偏振器被对准以允许仅传递两个正交状态中的一个,另一个被吸收。 该设备预计可以应用于基于宽带光源的WDM网络,如超发光二极管。 该装置还可用于提供对其输入的极化状态敏感的提供给光学元件的信号的前端偏振稳定。 这些元件的示例是半导体光放大器,集成光分路器和电光开关。

    Interferometer for measurements of optical properties in bulk samples
    2.
    发明授权
    Interferometer for measurements of optical properties in bulk samples 有权
    用于测量散装样品光学性能的干涉仪

    公开(公告)号:US06181429B2

    公开(公告)日:2001-01-30

    申请号:US09218297

    申请日:1998-12-22

    CPC classification number: G01N21/45

    Abstract: There is provided a method and apparatus for measuring the optical properties of bulk samples. A probe laser beam is fed into the two arms of the apparatus, a reference arm and a measurement arm, both of which contain optical fiber to conduct the laser lights. The measurement arm includes a free space area for mounting a sample to be tested. The probe beam is directed into the sample in free space. The sample also receives light in free space, rather than via the optical fiber, from a second, pump laser. The interaction of the sample and the pump laser affect the optical properties of the sample. This change in optical properties can be detected by comparing the output signals from the measurement and reference arms.

    Abstract translation: 提供了用于测量散装样品的光学性质的方法和装置。 探针激光束被馈送到装置的两个臂中,一个参考臂和一个测量臂,它们都包含用于传导激光的光纤。 测量臂包括用于安装待测样品的自由空间区域。 探头光束在自由空间中被引导到样品中。 样品也从第二个泵激光器接收自由空间而不是通过光纤的光。 样品和泵浦激光器的相互作用影响样品的光学性质。 可以通过比较测量和参考臂的输出信号来检测光学特性的这种变化。

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