摘要:
A calibration plate includes a first pattern in which bars and spaces are repeated, and a second pattern in which bars having an identical width to the spaces of the first pattern and spaces having an identical width to the bars of the first pattern are repeated, wherein the first pattern and the second pattern adjoin each other, and the bars and spaces of the first pattern and the bars and spaces of the second pattern are staggered.
摘要:
A reticle has a transfer region and a peripheral region defined in the plane of the reticle, the transfer region being formed with a pattern to be transferred and the peripheral region being disposed surrounding the periphery of the transfer region. Reference marks for defining one virtual reference line is formed in the plane of the reticle. A transfer pattern is formed in the transfer region and includes a long linear line segment oblique to the reference line. A pair of direction designating marks is disposed in the peripheral region along a virtual straight line parallel or perpendicular to the linear line segment of the transfer pattern.
摘要:
A reticle has a transfer region and a peripheral region defined in the plane of the reticle, the transfer region being formed with a pattern to be transferred and the peripheral region being disposed surrounding the periphery of the transfer region. Reference marks for defining one virtual reference line is formed in the plane of the reticle. A transfer pattern is formed in the transfer region and includes a long linear line segment oblique to the reference line. A pair of direction designating marks is disposed in the peripheral region along a virtual straight line parallel or perpendicular to the linear line segment of the transfer pattern.
摘要:
The pattern exposure method formes a pattern by a combination of a reduction projection exposure system 10 and an electron beam exposure system 20. An optical strain in a region of a prescribed size exposed by the reduction projection exposure system 10 is measured by a coordinates detection system 30. A first pattern of a shot size is exposed by the reduction projection exposure system 10, and a second pattern to be superimposed on the first pattern is formed by the electron beam exposure system 20, correcting based on a correction value which is based on the optical strain in the region of the prescribed size measured by the coordinates detection system 30.
摘要:
An apparatus is disclosed which mechanically supports and electrically connects a magnetic field modulation head for opto-magnetic recording to a supporting/connecting device. The magnetic field modulation head is in slidable contact with a surface of an opto-magnetic disc and is placed face-to-face with a laser pick-up device. The apparatus has a connecting spring member made of a conductive material. The connecting spring member has one end which joins a coil of the magnetic field modulation head with a coil of the magnetic field modulation head, and an opposite end which is fixed on a supporting member. The spring member has a pair of conductive pieces spaced apart from each other. The conductive pieces are made of a material which renders the coil conductive with the supporting member, the one end and the magnetic field modulation head being embedded in a composite resin material. To partially mechanically engage the conductive pieces together, an insulating engaging member may be used. Alternatively, the spring member may have a pair of conductive pieces spaced apart from each other and placed on a single insulating plate made of a flexible composite resin.