Method of determination of corrosion rate
    1.
    发明授权
    Method of determination of corrosion rate 失效
    腐蚀速率测定方法

    公开(公告)号:US07553449B2

    公开(公告)日:2009-06-30

    申请号:US10946049

    申请日:2004-09-21

    IPC分类号: G01N17/00

    CPC分类号: G01N17/00

    摘要: The corrosion rate of a metal immersed in a fluid medium is measured by transmission of a beam of radiation normally in the visible or near infra-red portion of the spectrum, through a thin film of the metal immersed in the medium. The film of the metal is suitably supported on a radiation-transmitting substrate such as a glass plate or slide. The corrosion rate can be determined by passing a radiation beam through the metal film sample using a twin beam system to compensate for instrument factors such as the absorbance by the fluid medium, the cell windows and the film-supporting substrate. As the thickness of the film decreases, the reduction in film thickness is determined by the increase in beam intensity, using a reference beam to compensate for the instrument factors.

    摘要翻译: 浸在流体介质中的金属的腐蚀速率通过浸入介质中的金属薄膜透射通常在光谱的可见光或近红外部分的辐射光束来测量。 金属膜适当地支撑在诸如玻璃板或载玻片的辐射透射基板上。 可以通过使用双束系统使辐射束通过金属膜样品来补偿仪器因素,例如流体介质,电池窗口和膜支撑衬底的吸光度来确定腐蚀速率。 随着膜的厚度减小,膜厚度的降低由光束强度的增加决定,使用参考光束来补偿仪器因素。

    Method of determination of corrosion rate

    公开(公告)号:US20060063263A1

    公开(公告)日:2006-03-23

    申请号:US10946049

    申请日:2004-09-21

    IPC分类号: G01N31/22

    CPC分类号: G01N17/00

    摘要: The corrosion rate of a metal immersed in a fluid medium is measured by transmission of a beam of radiation normally in the visible or near infra-red portion of the spectrum, through a thin film of the metal immersed in the medium. The film of the metal is suitably supported on a radiation-transmitting substrate such as a glass plate or slide. The corrosion rate can be determined by passing a radiation beam through the metal film sample using a twin beam system to compensate for instrument factors such as the absorbance by the fluid medium, the cell windows and the film-supporting substrate. As the thickness of the film decreases, the reduction in film thickness is determined by the increase in beam intensity, using a reference beam to compensate for the instrument factors.