摘要:
A station for testing fiber optic jumper cables includes four indexing plugboard stations. A single cable to be tested is typically attached to extend between two of the plugboard stations. Each plugboard station includes three columns of plug positions, corresponding to three styles of connecters which may be used at the ends of the cable to be tested. An upper row, and a central row, of plug positions correspond to the contact types (PC or APC) which may be used. An indexing mechanism is provided to align one of the plug positions in the central row with a reference cable extending from the plugboard station. Reference jumpers extend from the upper row, being docked in a lower row of plug positions if the cable to be tested is connected to the central row, or being plugged into the central row if the cable to be tested is connected to the upper row. The reference cable extending from each of the plugboard stations is brought into and out of contact with one of the central-row plugboard positions, facilitating a sequence of tests. The reference cables from two of these plugboard stations are connected through an optical switch to an optical time domain reflectometer (OTDR), while the other two reference cables are simply connected to connectors at their far ends. A computer controls indexing the plugboard stations and brings the reference cables into engagement according to a preferred sequence.
摘要:
A fixture is provided for locating open conditions within circuits and short conditions between adjacent circuits on a flexible substrate having circuits extending along each side, as well as individual circuits extending along both sides. In one station of the fixture, the flexible circuit extends against a conductive backing plate, and conductivity measurements, to detect open conditions, are made between two probes moving among test points on the first side of the substrate, which is opposite the backing plate, and between one of these probes and the conductive backing plate. The latter type of measurement is used particularly to detect an open condition in a via extending through the substrate. In another station of the fixture, the first side of the flexible circuit extends against a conductive backing plate having an insulating sheet adjacent to the substrate, conductivity measurements, to detect open conditions, are made between two test probes moving along a side of the substrate opposite this insulated conductive backing plate, and capacitance measurements, to detect short circuit conditions, are made between one of these probes and the insulated conductive backing plate.