Process for forming a semiconductor device and a static-random-access
memory cell
    1.
    发明授权
    Process for forming a semiconductor device and a static-random-access memory cell 失效
    用于形成半导体器件和静态随机存取存储器单元的工艺

    公开(公告)号:US5721167A

    公开(公告)日:1998-02-24

    申请号:US797142

    申请日:1997-02-10

    IPC分类号: H01L21/8244

    CPC分类号: H01L27/11

    摘要: A semiconductor device (10) is formed having an SRAM array with a plurality of SRAM cells. In forming the access and latch transistors, two different gate electrode compositions are used to form the access and latch transistors. More specifically, a dielectric layer (22) is formed between two conductive layers (26 and 28) within the gate electrode (52) for the access transistors while the dielectric layer is not formed between the two conductive layers (26 and 28) for the latch transistors. This structure allows an increase in the beta ratio for the SRAM cell thereby making a more stable SRAM cell without having to use diffused resistors between the access transistors in storage nodes or by having to form a differential thickness between the gate dielectric layers for the latch transistors and the access transistors.

    摘要翻译: 形成具有具有多个SRAM单元的SRAM阵列的半导体器件(10)。 在形成访问和锁存晶体管时,使用两种不同的栅电极组合物来形成访问和锁存晶体管。 更具体地,在用于存取晶体管的栅电极(52)内的两个导电层(26和28)之间形成介电层(22),而在两个导电层(26和28)之间不形成介电层,用于 锁存晶体管。 该结构允许增加SRAM单元的β比,从而形成更稳定的SRAM单元,而不必在存储节点中的存取晶体管之间使用扩散电阻,或者必须在用于锁存晶体管的栅介质层之间形成差分厚度 和存取晶体管。

    Methods and systems for aviation nonconformance component management

    公开(公告)号:US07127409B2

    公开(公告)日:2006-10-24

    申请号:US09797226

    申请日:2001-03-01

    IPC分类号: G06Q10/00

    CPC分类号: G06Q10/06 G06Q10/063

    摘要: A computerized business process that captures component nonconformance data elements at an inspection process level is described. The nonconformance data is gathered via network-based data capture screens and image capture workstations. The data elements include information regarding the aircraft component nonconformance, component disposition, and if necessary, the repair or non-repairable status, type of repair to be conducted, primary non-repairable defect, and digital images of the nonconforming component feature. The information is uploaded to a database integrated with a nonconformance management system. The data is available for users, suppliers, and customers to view through a secure connection to a business entity's server system. The customer logs onto the system and accesses captured data elements and images.