-
公开(公告)号:US20060284114A1
公开(公告)日:2006-12-21
申请号:US11300425
申请日:2005-12-15
申请人: Joseph Olson , Jonathan England , Morgan Evans , Douglas Fielder , Gregg Norris , Shengwu Chang , Damian Brennan , William Callahan
发明人: Joseph Olson , Jonathan England , Morgan Evans , Douglas Fielder , Gregg Norris , Shengwu Chang , Damian Brennan , William Callahan
IPC分类号: H01J37/317
CPC分类号: H01J37/304 , H01J37/3171 , H01J2237/24542 , H01J2237/30483 , H01J2237/31703
摘要: A technique for uniformity tuning in an ion implanter system is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for ion beam uniformity tuning. The method may comprise generating an ion beam in an ion implanter system. The method may also comprise tuning one or more beam-line elements in the ion implanter system to reduce changes in a beam spot of the ion beam when the ion beam is scanned along a beam path. The method may further comprise adjusting a velocity profile for scanning the ion beam along the beam path such that the ion beam produces a substantially uniform ion beam profile along the beam path.
摘要翻译: 公开了一种用于离子注入机系统中均匀性调谐的技术。 在一个特定的示例性实施例中,该技术可以被实现为用于离子束均匀性调谐的方法。 该方法可以包括在离子注入机系统中产生离子束。 该方法还可以包括调整离子注入系统中的一个或多个束线元件,以便当沿着光束路径扫描离子束时,减小离子束的束斑的变化。 该方法还可以包括调整用于沿着光束路径扫描离子束的速度分布,使得离子束沿着光束路径产生基本均匀的离子束分布。