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    Process of measuring slide-reading of abutted-junction read heads
    2.
    发明授权
    Process of measuring slide-reading of abutted-junction read heads 失效
    测量接合读头的滑动读数的过程

    公开(公告)号：US06504362B2

    公开(公告)日：2003-01-07

    申请号：US09902988

    申请日：2001-07-11

    申请人： Douglas Saunders ,  Juan Fernandez-de-Castro ,  Erli Chen ,  Lujun Chen

    发明人： Douglas Saunders ,  Juan Fernandez-de-Castro ,  Erli Chen ,  Lujun Chen

    IPC分类号： G01R3312

    CPC分类号： B82Y25/00 ,  B82Y10/00 ,  G11B5/455 ,  G11B2005/0013 ,  G11B2005/0016 ,  G11B2005/3996

    摘要： Side-reading of an abutted-junction magnetic transducer is measured by constructing at least one microtrack having a transition density. The transducer is moved relative to the microtrack to identify a plurality of positions of the transducer relative to the microtrack where the transducer provides a predetermined response. The side-reading distance of the transducer is identified from the plurality of positions. In one embodiment, a plurality of microtracks are constructed during different iterations, each having a different transition density, and the positions of the transducer are identified during each iteration relative to the respective microtrack. In another embodiment, the selected transition density has a fundamental frequency, and the position of the transducer is identified relative to the microtrack where the transducer provides the predetermined response at each of a plurality of harmonic frequencies of the fundamental frequency.

    摘要翻译： 通过构造至少一个具有转移密度的微轨迹来测量邻接结磁换能器的侧读。 传感器相对于微轨迹移动以识别换能器相对于微轨道的多个位置，其中换能器提供预定响应。 从多个位置识别换能器的侧读距离。 在一个实施例中，在不同迭代期间构造多个微轨迹，每个迭代具有不同的转移密度，并且在每次迭代期间相对于相应微轨迹识别换能器的位置。 在另一个实施例中，所选择的转移密度具有基频，并且相对于微轨迹识别换能器的位置，其中换能器在基频的多个谐波频率的每一个处提供预定的响应。