Semiconductor device with trench transistors and method for manufacturing such a device
    2.
    发明授权
    Semiconductor device with trench transistors and method for manufacturing such a device 有权
    具有沟槽晶体管的半导体器件及其制造方法

    公开(公告)号:US07601596B2

    公开(公告)日:2009-10-13

    申请号:US11600422

    申请日:2006-11-16

    IPC分类号: H01L21/336

    摘要: According to one embodiment, a method for manufacturing a semiconductor device includes forming trenches in a first side of a semiconductor material and forming a thick oxide layer on the trenches and on the first side. A part of the first side and the trenches is masked using a first mask, and the semiconductor material is doped by implantation through the thick oxide layer while the first mask is present. At least part of the thick oxide layer is removed while the first mask remains.

    摘要翻译: 根据一个实施例,一种用于制造半导体器件的方法包括:在半导体材料的第一侧形成沟槽,并在沟槽和第一侧上形成厚的氧化物层。 使用第一掩模掩模第一侧面和沟槽的一部分,并且通过在第一掩模存在的情况下通过厚氧化物层的注入来掺杂半导体材料。 当第一掩模残留时,去除厚氧化物层的至少一部分。

    Method for producing a connection electrode for two semiconductor zones arranged one above another
    3.
    发明申请
    Method for producing a connection electrode for two semiconductor zones arranged one above another 有权
    一种制造用于两个半导体区域的连接电极的方法,所述半导体区域布置在另一个之上

    公开(公告)号:US20070093019A1

    公开(公告)日:2007-04-26

    申请号:US11527743

    申请日:2006-09-26

    IPC分类号: H01L21/8242 H01L21/76

    摘要: Method for producing a connection electrode for two semiconductor zones arranged one above another The invention relates to a method for producing a connection electrode for a first semiconductor zone and a second semiconductor zone, which are arranged one above another and are doped complementarily with respect to one another, which method comprises the method steps of: producing a trench extending through the first semiconductor zone right into the second semiconductor zone in such a way that the first semiconductor zone is uncovered at sidewalls of the trench and the second semiconductor zone is uncovered at least at a bottom of the trench, applying a protective layer to one of the first and second semiconductor zones in the trench, producing a first connection zone in the other of the two semiconductor zones, which is not covered by the protective layer, by introducing dopant atoms into this other semiconductor zone via the trench, the connection zone being of the same conductivity type as said other semiconductor zone, but doped more highly, depositing an electrode layer at least onto the sidewalls and the bottom of the trench for the purpose of producing the connection electrode.

    摘要翻译: 一种制造用于两个半导体区域的连接电极的方法本发明涉及一种用于制造用于第一半导体区域和第二半导体区域的连接电极的方法,所述连接电极被布置在另一个之上,并且相对于一个 另一方面,该方法包括以下方法步骤:产生通过第一半导体区域直接进入第二半导体区域的沟槽,使得第一半导体区域在沟槽的侧壁处未被覆盖,并且至少覆盖第二半导体区域 在沟槽的底部,在沟槽中的第一和第二半导体区域中的一个上施加保护层,在两个半导体区域中的另一个半导体区域中的第一连接区域中,未被保护层覆盖,通过引入掺杂剂 原子通过沟槽进入该另一半导体区,连接区具有相同的导电性 类型作为所述另一半导体区,但是掺杂更高,至少在沟槽的侧壁和底部上沉积电极层以产生连接电极。

    Process for preparing dyes and/or brightener formulations
    5.
    发明授权
    Process for preparing dyes and/or brightener formulations 失效
    制备染料和/或增白剂配方的方法

    公开(公告)号:US06241786B1

    公开(公告)日:2001-06-05

    申请号:US09399248

    申请日:1999-09-20

    IPC分类号: C09B6754

    CPC分类号: C09B69/04 C09B67/0096

    摘要: This invention relates to a process for preparing formulations comprising dyes and/or brighteners which possess at least one free SO3H and/or COOH group, in which an aqueous suspension comprising a) dyes and/or brighteners which possess at least one free SO3H and/or COOH group and b) inorganic synthesis salts is desalinated using a microfiltration membrane having pore diameters of from 0.05 to 40 &mgr;m.

    摘要翻译: 本发明涉及一种制备包含具有至少一种游离SO 3 H和/或COOH基团的染料和/或增白剂的制剂的方法,其中包含a)染料和/或增白剂的水性悬浮液具有至少一种游离SO 3 H和/或 COOH基团和b)使用孔径为0.05至40μm的微滤膜将无机合成盐脱盐。

    Semiconductor device with trench transistors and method for manufacturing such a device
    8.
    发明申请
    Semiconductor device with trench transistors and method for manufacturing such a device 有权
    具有沟槽晶体管的半导体器件及其制造方法

    公开(公告)号:US20080116511A1

    公开(公告)日:2008-05-22

    申请号:US11600422

    申请日:2006-11-16

    IPC分类号: H01L21/336 H01L29/78

    摘要: According to one embodiment, a method for manufacturing a semiconductor device includes forming trenches in a first side of a semiconductor material and forming a thick oxide layer on the trenches and on the first side. A part of the first side and the trenches is masked using a first mask, and the semiconductor material is doped by implantation through the thick oxide layer while the first mask is present. At least part of the thick oxide layer is removed while the first mask remains.

    摘要翻译: 根据一个实施例,一种用于制造半导体器件的方法包括:在半导体材料的第一侧形成沟槽,并在沟槽和第一侧上形成厚的氧化物层。 使用第一掩模掩模第一侧面和沟槽的一部分,并且通过在第一掩模存在的情况下通过厚氧化物层的注入来掺杂半导体材料。 当第一掩模残留时,去除厚氧化物层的至少一部分。