摘要:
A semiconductor device includes a test pattern decoding unit and a scan chain unit. The test pattern receives a scan-in pattern from an external test device and generates a test pattern based on the scan-in pattern and a scan-out pattern. The scan-in pattern is decoded based on a seed pattern and an expectation pattern. The scan chain unit performs logical operation based on the test pattern and feedbacks the scan-out pattern to the test pattern decoding unit.
摘要:
A relaxation oscillator compensates for system delay. The relaxation oscillator includes first and second input signal units that generates first and second capacitor voltages, a delay compensation unit that receives a reference voltage and the first and second capacitor voltages and that generates a compensation voltage. In certain embodiments, a voltage generating unit applies the reference voltage to the delay compensation unit, and a latch unit stores first and second comparison signals compared by the first and second input signal units and transmits a clock signal and a inverted clock signal to the first and second input signal units. The first and second input signal units compare the first and second capacitor voltages with a compensation voltage transmitted from the delay compensation unit.
摘要:
An integrated circuit (IC) device is provided. The IC device includes a detector configured to detect an abnormal condition of the IC device and to generate a detection result as an attack signal, and a noise filter configured to filter out the attack signal as noise and to generate a filtered attack signal. The noise filter is configured to filter out the attack signal as noise when the attack signal is not maintained at a first logic level for a reference period and to generate the filtered attack signal when the attack signal is maintained at the first logic level for the reference period.
摘要:
A smart card system having: a smart card including a security logic circuit to detect an external attack; and a reader communicating with the smart card. The security logic circuit detects the external attack by measuring the external input capacitance through an input/output pad of the smart card and comparing the external input capacitance to the input capacitance of the reader. This improves the security of the smart card system.
摘要:
Voltage glitch detection circuits and methods thereof. The voltage glitch detection circuit may include a monitoring memory array including at least one memory cell storing reference data, a monitoring sense amplifier receiving stored reference data from the monitoring memory array, amplifying the received stored reference data in response to an operation control signal and outputting data based on the reference data, a data storage circuit including at least one latch to store the reference data and a comparator circuit receiving and comparing the data output from the monitoring sense amplifier and the stored reference data from the data storage circuit, and outputting a detection signal based on the comparison. The voltage glitch detection circuit may include a first storage unit configured to latch a first voltage, a second storage unit configured to latch a second voltage, a first comparator circuit first comparing the latched first voltage with a first reference voltage and outputting a first comparison result, a second compariator circuit second comparing the second voltage with a second reference voltage and outputting a second comparison result and a third comparator circuit third comparing the first and second comparison results and outputting a reset detection signal based on the third comparison.
摘要:
A voltage-glitch detection circuit includes a voltage comparator having two input terminals with different capacitance resistance charge/discharge time. Voltage dividers are coupled to the two input terminals of the voltage comparator respectively, and commonly receive a supply voltage. One of the voltage dividers is supplied to the voltage comparator as a reference voltage of the voltage comparator, and the other is supplied as a glitch detection voltage to the voltage comparator.
摘要:
An integrated circuit (IC) is provided. The IC includes a scan controller and a target logic circuit configured to receive a scan input pattern in response to a control of the scan controller, to execute an operation according to the scan input pattern, and to output an execution result. The scan controller compares the execution result with a scan output pattern and outputs a comparison result. The IC can perform a scan test on a particular block that is not controlled by a CPU in a smart card without an additional pad.
摘要:
A smart card system having: a smart card including a security logic circuit to detect an external attack; and a reader communicating with the smart card. The security logic circuit detects the external attack by measuring the external input capacitance through an input/output pad of the smart card and comparing the external input capacitance to the input capacitance of the reader. This improves the security of the smart card system.
摘要:
A relaxation oscillator compensates for system delay. The relaxation oscillator includes first and second input signal units that generates first and second capacitor voltages, a delay compensation unit that receives a reference voltage and the first and second capacitor voltages and that generates a compensation voltage. In certain embodiments, a voltage generating unit applies the reference voltage to the delay compensation unit, and a latch unit stores first and second comparison signals compared by the first and second input signal units and transmits a clock signal and a inverted clock signal to the first and second input signal units. The first and second input signal units compare the first and second capacitor voltages with a compensation voltage transmitted from the delay compensation unit.
摘要:
A security apparatus within a smart card includes a plurality of security blocks with at least one shared component. Each security block that when activated generates a respective output signal indicating whether a respective detected parameter is within a respective acceptable range. A selecting unit couples the shared component to the activated one of the security blocks for minimized area and cost of the security apparatus.