公开(公告)号：US4786865A

公开(公告)日：1988-11-22

申请号：US835347

申请日：1986-03-03

申请人： Itsu Arimura ,  Arthur C. Day

发明人： Itsu Arimura ,  Arthur C. Day

IPC分类号： G01Q30/20 ,  G01R31/302 ,  G01R31/26 ,  G01N23/225

CPC分类号： G01R31/302

摘要： Apparatus and method for testing the susceptibility of an integrated circuit (10) to single event upsets caused by high energy heavy ions, such as are found in cosmic rays. The integrated circuit is mounted in a three axes manipulator (20) by which it is positioned at a desired target point. A light pulse generated by source (32) is filtered and collimated by spatial filter (34), and is focused as a spot on the integrated circuit by optics (60). Preferably, the diameter of the focused spot is 5 microns or less and its wavelength is in the range of 850-1100 nanometers. The susceptibility of any point on the integrated circuit is determined by operating the circuit and monitoring it for errors after it is subjected to the focused light pulse. Timing of the light pulse may also be controlled with respect to integrated circuit operation, to determine susceptibility as a function of time.

摘要翻译： 用于测试集成电路（10）对由高能重离子引起的单个事件的敏感性的装置和方法，例如在宇宙射线中发现的。 集成电路安装在三轴操纵器（20）中，通过它将其定位在期望的目标点。 由源极（32）产生的光脉冲被空间滤波器（34）滤波和准直，并且通过光学器件（60）被聚焦成集成电路上的点。 优选地，聚焦点的直径为5微米或更小，并且其波长在850-1100纳米的范围内。 集成电路上的任何点的敏感度通过操作电路并在经受聚焦光脉冲之后对其进行监视来确定。 也可以相对于集成电路操作来控制光脉冲的定时，以确定作为时间的函数的敏感度。