Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuit
    2.
    发明授权
    Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuit 有权
    具有内置自检(BIST)功能的算法测试模式发生器,用于电路的功能测试

    公开(公告)号:US07062696B2

    公开(公告)日:2006-06-13

    申请号:US09759557

    申请日:2001-01-12

    CPC classification number: G01R31/31813 G01R31/31816 G01R31/318307

    Abstract: A test system includes a test data generator to provide test data (e.g., a test pattern) to a subject circuit (e.g., a digital television video circuit). The test data is functionally to verify the subject circuit. The functional verification of the subject circuit is performed utilizing an output of the subject circuit generated responsive to the test data in accordance with an operational functionality of the subject circuit. The test data generator is also coupled to provide the test data to a built-in self-test (BIST) circuit so as to enable the built-in self-test circuit to receive the test data.

    Abstract translation: 测试系统包括测试数据发生器,以向主题电路(例如,数字电视视频电路)提供测试数据(例如,测试模式)。 测试数据在功能上用于验证主题电路。 根据主题电路的操作功能,利用响应于测试数据产生的主题电路的输出来执行主题电路的功能验证。 测试数据发生器还耦合到测试数据到内置的自检(BIST)电路,以使内置的自检电路能够接收测试数据。

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