公开(公告)号：US20100210469A1

公开(公告)日：2010-08-19

申请号：US12440397

申请日：2007-09-07

Applicant: Jason Jongho Kang ,  Eun-Hee Oh ,  Hyun-Wong Kang ,  Jung-Wan Lee ,  Seung-Heui Lee ,  Song-Ju Yang ,  Jeong-Sun Seo ,  Jong-Ho Lee ,  Kap-Seok Yang

Inventor： Jason Jongho Kang ,  Eun-Hee Oh ,  Hyun-Wong Kang ,  Jung-Wan Lee ,  Seung-Heui Lee ,  Song-Ju Yang ,  Jeong-Sun Seo ,  Jong-Ho Lee ,  Kap-Seok Yang

IPC: C40B30/00 ,  C40B40/06 ,  C40B50/14

CPC classification number: C12Q1/6837 ,  C12Q1/6827 ,  C12Q1/6841 ,  C12Q2565/501

Abstract: The present invention relates to techniques to detect chromosomal columns abnormalities. More specifically, the present invention is directed to a microarray chip for detecting chromosomal abnormalities comprising one or more pooled probe sets, wherein the pooled probe set is specific to a chromosomal abnormality and all probes of each pooled probe set are immobilized together in at least one spot; a method of detecting chromosomal abnormalities using the microarray chip; a kit for diagnosing diseases associated with chromosomal abnormalities comprising the microarray chip; and a method of diagnosing a disease associated with a chromosomal abnormality by identifying the chromosomal abnormality specific to the disease using the microarray chip. The present invention relates to techniques to detect chromosomal abnormalities. More specifically, the present invention is directed to a microarray chip for detecting chromosomal abnormalities comprising one or more pooled probe sets, wherein the pooled probe set is specific to a chromosomal abnormality and all probes of each pooled probe set are immobilized together in at least one spot; a method of detecting chromosomal abnormalities using the microarray chip; a kit for diagnosing diseases associated with chromosomal abnormalities comprising the microarray chip; and a method of diagnosing a disease associated with a chromosomal abnormality by identifying the chromosomal abnormality specific to the disease using the microarray chip.

Abstract translation: 本发明涉及检测染色体柱异常的技术。 更具体地，本发明涉及一种用于检测染色体异常的微阵列芯片，其包含一个或多个汇集的探针组，其中所述合并的探针组对于染色体异常是特异性的，并且每个合并的探针组的所有探针在至少一个 点; 使用微阵列芯片检测染色体异常的方法; 用于诊断与包含微阵列芯片的染色体异常相关疾病的试剂盒; 以及通过使用微阵列芯片鉴定对疾病特异性的染色体异常来诊断与染色体异常相关的疾病的方法。 本发明涉及检测染色体异常的技术。 更具体地，本发明涉及一种用于检测染色体异常的微阵列芯片，其包含一个或多个汇集的探针组，其中所述合并的探针组对于染色体异常是特异性的，并且每个合并的探针组的所有探针在至少一个 点; 使用微阵列芯片检测染色体异常的方法; 用于诊断与包含微阵列芯片的染色体异常相关疾病的试剂盒; 以及通过使用微阵列芯片鉴定对疾病特异性的染色体异常来诊断与染色体异常相关的疾病的方法。

公开(公告)号：US20070048742A1

公开(公告)日：2007-03-01

申请号：US11211185

申请日：2005-08-23

Applicant: Jason-Jongho Kang ,  Eun-Hee Oh ,  Hyun-Woong Kang ,  Ji-Hyun Lee ,  Chang-Joon Bae ,  Jong-Ho Lee ,  Jeong-Sun Seo

Inventor： Jason-Jongho Kang ,  Eun-Hee Oh ,  Hyun-Woong Kang ,  Ji-Hyun Lee ,  Chang-Joon Bae ,  Jong-Ho Lee ,  Jeong-Sun Seo

IPC: C12Q1/68

CPC classification number: C12Q1/6883 ,  C12Q1/6837 ,  C12Q2600/156

Abstract: The present invention relates to a method of detecting a chromosome abnormality and a microarray chip for detecting a chromosome abnormality. More specifically, the present invention is directed to a method of detection for chromosome abnormality in order to easily diagnosing the health condition and disease of the subject by detecting of the chromosome abnormality rapidly and precisely, and to providing a probe for diagnosis of disease by identifying chromosome abnormality specific to the disease.

Abstract translation: 本发明涉及一种检测染色体异常的方法和用于检测染色体异常的微阵列芯片。 更具体地，本发明涉及一种检测染色体异常的方法，以便通过快速且准确地检测染色体异常来容易地诊断受试者的健康状况和疾病，并通过鉴定来提供用于诊断疾病的探针 染色体异常特异性疾病。