公开(公告)号：US07941738B2

公开(公告)日：2011-05-10

申请号：US11716396

申请日：2007-03-09

申请人： Hervé Le-Gall ,  Paul Armagnat ,  Jean-Christophe Pont

发明人： Hervé Le-Gall ,  Paul Armagnat ,  Jean-Christophe Pont

IPC分类号： G06K5/00

CPC分类号： G01R31/31725 ,  G01R31/3171 ,  G01R31/31727 ,  H04L7/0008 ,  H04L7/033

摘要： A bit detection event within a read period is characterized by sub-dividing each read period into elementary time intervals. Certain ones of the elementary intervals are selected to for a window and a counting operation for a number of bits detected during the intervals within the window is performed. The elementary time intervals are defined by a difference between a frequency corresponding to the read period and a bit detection timing frequency. The counting result for the intervals in the window over several consecutive read periods is statistically processed. A reduction of an integrated electronic circuit test duration results from limiting the counting operations performed to the selected elementary time intervals.

摘要翻译： 在读周期内的位检测事件的特征在于将每个读周期划分为基本时间间隔。 选择基本间隔中的某些基本间隔用于窗口，并且执行在窗口内的间隔期间检测到的多个位的计数操作。 基本时间间隔由与读取期间对应的频率与位检测定时频率之间的差定义。 统计处理在几个连续读取周期内窗口间隔的计数结果。 集成电子电路测试持续时间的减少是将执行的计数操作限制到所选择的基本时间间隔。

公开(公告)号：US20070226595A1

公开(公告)日：2007-09-27

申请号：US11716396

申请日：2007-03-09

申请人： Herve Le-Gall ,  Paul Armagnat ,  Jean-Christophe Pont

发明人： Herve Le-Gall ,  Paul Armagnat ,  Jean-Christophe Pont

IPC分类号： H03M13/00

CPC分类号： G01R31/31725 ,  G01R31/3171 ,  G01R31/31727 ,  H04L7/0008 ,  H04L7/033

摘要： A bit detection event within a read period is characterized by sub-dividing each read period into elementary time intervals. Certain ones of the elementary intervals are selected to for a window and a counting operation for a number of bits detected during the intervals within the window is performed. The elementary time intervals are defined by a difference between a frequency corresponding to the read period and a bit detection timing frequency. The counting result for the intervals in the window over several consecutive read periods is statistically processed. A reduction of an integrated electronic circuit test duration results from limiting the counting operations performed to the selected elementary time intervals.

摘要翻译： 在读周期内的位检测事件的特征在于将每个读周期划分为基本时间间隔。 选择基本间隔中的某些基本间隔用于窗口，并且执行在窗口内的间隔期间检测到的多个位的计数操作。 基本时间间隔由与读取期间对应的频率与位检测定时频率之间的差定义。 统计处理在几个连续读取周期内窗口间隔的计数结果。 集成电子电路测试持续时间的减少是将执行的计数操作限制到所选择的基本时间间隔。