Multiple analyte detection systems and methods of detecting multiple analytes
    1.
    发明申请
    Multiple analyte detection systems and methods of detecting multiple analytes 有权
    多种分析物检测系统和检测多种分析物的方法

    公开(公告)号:US20080171397A1

    公开(公告)日:2008-07-17

    申请号:US11653568

    申请日:2007-01-16

    IPC分类号: G01N21/76

    摘要: A multiple analyte detection system includes a carrier having reagents disposed thereat, with each of the reagents capable of optically changing in response to exposure to a respective analyte. The system further includes a photodetector positioned to collectively detect light interacted with each of the reagents, a processor to determine a presence or an absence of each of the analytes in response to the light collectively-detected, and an indicator to provide an indication of the presence or the absence of each of the analytes. A method of detecting multiple analytes includes exposing reagents capable of optically changing in response to exposure to a respective analyte to a sample. The method further includes collectively detecting light interacted with each of the reagents, determining a presence or an absence of each of the analytes in response to the light collectively detected, and indicating the presence or the absence of each of the analytes determined.

    摘要翻译: 多分析物检测系统包括具有在其上设置的试剂的载体,其中每种试剂能够响应于暴露于相应分析物而光学变化。 该系统还包括光电检测器,其被定位成共同检测与每个试剂相互作用的光;处理器,用于响应于总体检测的光来确定每个分析物的存在或不存在;以及指示器, 存在或不存在每种分析物。 检测多种分析物的方法包括将暴露于相应分析物的样品响应于能够进行光学变化的试剂露出。 该方法还包括共同检测与每种试剂相互作用的光,响应于共同检测的光,确定每种分析物的存在或不存在,并指示所确定的每种分析物的存在或不存在。

    Integrated optoelectronic system for measuring fluorescence or luminescence emission decay
    2.
    发明授权
    Integrated optoelectronic system for measuring fluorescence or luminescence emission decay 有权
    用于测量荧光或发光衰减的集成光电子系统

    公开(公告)号:US07391512B2

    公开(公告)日:2008-06-24

    申请号:US11017748

    申请日:2004-12-22

    IPC分类号: G01N21/64 G01J1/58 G01J3/443

    CPC分类号: G01N21/6408

    摘要: An optoelectronic system for measuring fluorescence or luminescence emission decay, including (a) a light source being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode detecting the emission; (d) a second integrated circuit comprising a detection analysis system determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.

    摘要翻译: 一种用于测量荧光或发光衰减的光电子系统,包括(a)作为发光二极管的光源,半导体激光器或闪光管; (b)第一集成电路,包括至少一个电路,使得所述光源向所述样品发射光脉冲,从而导致来自所述样品的荧光或发光发射; (c)检测发光的光电二极管; (d)第二集成电路,包括检测分析系统,通过分析检测到的发射的衰减来确定关于样品的信息; 和(e)包围光源的外壳,第一集成电路,第二集成电路和光电二极管。

    METHOD AND APPARATUS FOR TESTING TRANSMITTERS IN OPTICAL FIBER NETWORKS
    5.
    发明申请
    METHOD AND APPARATUS FOR TESTING TRANSMITTERS IN OPTICAL FIBER NETWORKS 有权
    光纤网络测试发射机的方法和装置

    公开(公告)号:US20090257745A1

    公开(公告)日:2009-10-15

    申请号:US12102099

    申请日:2008-04-14

    IPC分类号: H04B17/00 H04B10/08

    CPC分类号: G02F1/0136 H04B10/0799

    摘要: An eye mask is provided that is defined at least partially in terms of absolute, or non-relative, optical power level values. In essence, the eye mask of the invention is a hybrid of the traditional eye mask in that the eye mask of the invention includes power level values on the optical power axis that are based on the minimum OMA set forth in the applicable standard or data sheet specification rather than on measured power level values obtained from the part being tested. Using the hybrid eye mask of the invention obviates the need to perform at least some of the tests often used to measure transmitter attributes. In addition, using the hybrid eye mask of the invention reduces the possibility that a transmitter may fail the eye mask test even though the transmitter operates satisfactorily.

    摘要翻译: 提供了至少部分地根据绝对或非相对光功率水平值定义的眼罩。 实质上,本发明的眼罩是传统眼罩的混合物,因为本发明的眼罩包括基于在适用的标准或数据表中列出的最小OMA的光功率轴上的功率电平值 规格而不是从被测零件获得的测量功率水平值。 使用本发明的混合眼罩避免了执行经常用于测量发射器属性的至少一些测试的需要。 此外,使用本发明的混合眼罩可以降低发射机可能失败眼罩测试的可能性,即使发射机令人满意地工作。