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公开(公告)号:US08013599B2
公开(公告)日:2011-09-06
申请号:US10993467
申请日:2004-11-19
IPC分类号: G01N27/82
CPC分类号: G01B7/28 , G01N27/902 , G01N27/9033
摘要: A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.
摘要翻译: 一种用于检查具有包括局部最小值和局部最大值的表面轮廓的部件的方法。 该方法包括将涡流探针定位在部件的表面附近以产生第一位置指示,将涡流探针定位在部件的表面附近以产生与第一位置指示不同的第二位置指示,以及 在第一和第二位置指示之间插值以确定部件表面的一部分的轮廓。
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公开(公告)号:US06812697B2
公开(公告)日:2004-11-02
申请号:US10253848
申请日:2002-09-24
申请人: William Stewart McKnight , Shridhar Champaknath Nath , Sandie Elizabeth Gresham , Richard Lloyd Trantow , Douglas Edward Ingram , John William Ertel , Thomas James Batzinger , Curtis Wayne Rose , Francis Howard Little
发明人: William Stewart McKnight , Shridhar Champaknath Nath , Sandie Elizabeth Gresham , Richard Lloyd Trantow , Douglas Edward Ingram , John William Ertel , Thomas James Batzinger , Curtis Wayne Rose , Francis Howard Little
IPC分类号: G01N2790
CPC分类号: G01N27/9006 , G01N27/902 , G01N27/904
摘要: The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.
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公开(公告)号:US07436992B2
公开(公告)日:2008-10-14
申请号:US10909198
申请日:2004-07-30
CPC分类号: G01N27/9013 , G01N27/9046 , G01N27/9073
摘要: A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.
摘要翻译: 检查元件的方法。 该方法包括产生要检查的部件的扫描方案,将侧安装探针耦合到涡流检查系统,将涡流引入到部件中,测量部件中的涡流以产生多个扫描数据, 以及分析所述扫描数据以生成被检测部件的至少一个图像。
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