公开(公告)号：US20080204578A1

公开(公告)日：2008-08-28

申请号：US11710653

申请日：2007-02-23

Applicant: Jonathan D. Scheuch ,  Wayne Joseph Tucker ,  Dante Pietro D'Amato

Inventor： Jonathan D. Scheuch ,  Wayne Joseph Tucker ,  Dante Pietro D'Amato

IPC: H04N9/64

CPC classification number: H04N5/361 ,  G01J3/2803 ,  G01J2003/2869

Abstract: A method of performing dark correction for signals generated by an image sensor is disclosed. Dark state signals are received from an image sensor and a dark correction ratio is determined for each pixel based on the dark state signals. Operational state signals are received from the image sensor and a pseudo dark signal is determined for each pixel based on the dark correction ratio and further based on the operational state signals. A corrected signal value based on the pseudo dark signal is determined. The method is capable of compensating for dark signals from the image sensor over a course of a series of measurements notwithstanding changes in temperature and exposure time.

Abstract translation: 公开了对由图像传感器产生的信号进行暗校正的方法。 从图像传感器接收暗状态信号，并且基于暗状态信号为每个像素确定暗校正比。 从图像传感器接收操作状态信号，并且基于暗校正比率，并且还基于操作状态信号为每个像素确定伪暗信号。 确定基于伪暗信号的校正信号值。 该方法能够在一系列测量过程中补偿来自图像传感器的暗信号，尽管温度和曝光时间有变化。

公开(公告)号：US06734959B2

公开(公告)日：2004-05-11

申请号：US10193522

申请日：2002-07-11

Applicant: David J. Griffiths ,  Jonathan D. Scheuch ,  Sean David Griffin ,  Ronald A. Murray ,  Kelly A. Edgar

Inventor： David J. Griffiths ,  Jonathan D. Scheuch ,  Sean David Griffin ,  Ronald A. Murray ,  Kelly A. Edgar

IPC: G01J104

CPC classification number: G01J1/42 ,  G01J2001/0481 ,  G01J2001/4252

Abstract: A prober for measuring the light output of digital devices integrally formed on a single wafer. The prober includes a light-integrating sphere sequentially aligned with selected devices. Each time that a device is aligned with the sphere, the device aligned with the sphere is activated, so that the light output of each device is individually measured. In the disclosed embodiment, the devices are vertical cavity surface emitting lasers (VCSELs) and light emitting diodes (LEDs).

Abstract translation: 用于测量在单个晶片上整体形成的数字设备的光输出的探测器。 探测器包括与所选设备顺序对准的光积分球。 每当设备与球体对准时，与球体对准的设备被激活，以便单独测量每个设备的光输出。 在所公开的实施例中，器件是垂直腔表面发射激光器（VCSEL）和发光二极管（LED）。