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    Functional and stress testing of LGA devices
    5.
    发明授权
    Functional and stress testing of LGA devices 失效
    LGA器件的功能和压力测试

    公开(公告)号：US07479796B2

    公开(公告)日：2009-01-20

    申请号：US11747202

    申请日：2007-05-10

    申请人： John Saunders Corbin, Jr. ,  Jose Arturo Garza ,  Dales Morrison Kent ,  Kenneth Carl Larsen ,  Howard Victor Mahaney, Jr. ,  Hoa Thanh Phan ,  John Joseph Salazar

    发明人： John Saunders Corbin, Jr. ,  Jose Arturo Garza ,  Dales Morrison Kent ,  Kenneth Carl Larsen ,  Howard Victor Mahaney, Jr. ,  Hoa Thanh Phan ,  John Joseph Salazar

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2891

    摘要： Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.

    摘要翻译： 公开了用于测试LGA设备的改进的方法，系统和设备。 一个示例性实施例包括测试嵌套组件冷却线的垂直布线，以便最小化测试嵌套足迹并增加单个测试卡上的可用测试位置。 另一示例性实施例包括将外部负载和力矩隔离并调整到散热器/冷板中，其中这些负载和力矩涉及控制质心以恢复散热片/芯片接口的更理想的热性能。 另一个示例性实施例包括便于LGA插座的简单且低成本替换的嵌套架构。 最后，另一示例性实施例包括通过使用干式空气排气对测试巢组件部件进行有效的冷凝控制。

    Functional and stress testing of LGA devices
    7.
    发明授权
    Functional and stress testing of LGA devices 失效
    LGA器件的功能和压力测试

    公开(公告)号：US07423440B2

    公开(公告)日：2008-09-09

    申请号：US11747207

    申请日：2007-05-10

    申请人： John Saunders Corbin, Jr. ,  Jose Arturo Garza ,  Dales Morrison Kent ,  Kenneth Carl Larsen ,  Howard Victor Mahaney, Jr. ,  Hoa Thanh Phan ,  John Joseph Salazar

    发明人： John Saunders Corbin, Jr. ,  Jose Arturo Garza ,  Dales Morrison Kent ,  Kenneth Carl Larsen ,  Howard Victor Mahaney, Jr. ,  Hoa Thanh Phan ,  John Joseph Salazar

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2891

    摘要： Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.

    摘要翻译： 公开了用于测试LGA设备的改进的方法，系统和设备。 一个示例性实施例包括测试嵌套组件冷却线的垂直布线，以便最小化测试嵌套足迹并增加单个测试卡上的可用测试位置。 另一示例性实施例包括将外部负载和力矩隔离并调整到散热器/冷板中，其中这些负载和力矩涉及控制质心以恢复散热片/芯片接口的更理想的热性能。 另一个示例性实施例包括便于LGA插座的简单且低成本替换的嵌套架构。 最后，另一示例性实施例包括通过使用干式空气排气对测试巢组件部件进行有效的冷凝控制。

    ELECTRONIC EQUIPMENT CABINET STRUCTURE
    10.
    发明申请
    ELECTRONIC EQUIPMENT CABINET STRUCTURE 有权
    电子设备柜结构

    公开(公告)号：US20120062084A1

    公开(公告)日：2012-03-15

    申请号：US13229704

    申请日：2011-09-10

    申请人： Richard Evans LEWIS, II ,  Jose Arturo Garza, JR. ,  D. Brian Donowho

    发明人： Richard Evans LEWIS, II ,  Jose Arturo Garza, JR. ,  D. Brian Donowho

    IPC分类号： H05K5/02

    CPC分类号： H05K5/0217 ,  A47B47/00 ,  H05K5/0234 ,  H05K5/0247 ,  H05K7/18 ,  H05K7/183 ,  H05K7/20009

    摘要： An electronic equipment cabinet structure includes a frame having a plurality of vertical support posts and a plurality of cross members that connect the support posts together. In one aspect, the cabinet structure further includes at least one caster plate connected to one of the plurality of cross members, wherein the caster plate includes a C-shaped portion to fittingly correspond with the cross member to which it is connected, thereby providing rigidity to the frame. In another aspect, the cabinet structure further includes at least one bracket having a base and two sides extending in the same direction away from the base, the edges of the two sides being connected to one of the cross members and the base being connected to one of the vertical support posts. In still another aspect, the cabinet structure further includes at least one bracket connected to one of the vertical support posts, wherein the bracket includes a first embossed portion nested within a corresponding second embossed portion on the vertical support post to which the bracket is connected.

    摘要翻译： 电子设备柜结构包括具有多个垂直支撑柱的框架和将支撑柱连接在一起的多个横向构件。 一方面，机柜结构还包括至少一个连接到多个横向构件中的一个的脚轮板，其中脚轮板包括与其连接的横向构件配合对应的C形部分，由此提供刚性 到框架。 在另一方面，机柜结构还包括至少一个支架，其具有基部和两侧沿远离基座的相同方向延伸，两侧的边缘连接到一个横向构件，基座连接到一个 的垂直支柱。 在另一方面，机柜结构还包括连接到垂直支撑柱中的一个的至少一个托架，其中支架包括嵌在托架连接到的垂直支撑柱上的对应的第二压花部分内的第一压花部分。