摘要:
Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.
摘要:
A data processing method for optimizing one or more parameters of a message handling system comprises defining a test workload comprising a plurality of messages, simulating the normal operation of the message handling system, processing at least a portion of the test workload, changing one or more parameters of the message handling system, monitoring the performance of the message handling system, and generating an optimization of at least one parameter based upon the performance of the message handling system.
摘要:
A shotpeen nozzle includes a tubular core mounted in a casing. The casing has an inlet for receiving shot in a stream of pressurized air, and the core includes an outlet for discharging the stream. A laser is mounted to the casing for projecting a laser beam in parallel with the core at its outlet in the direction of discharge of the stream therefrom.
摘要:
Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.
摘要:
Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.
摘要:
Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.
摘要:
The present invention relates to a procedure for mixing dehydated nopal flour and/or other vegetable flours with cereal flours, refined and/or whole flours from corn, wheat, oats and other leguminous and/or oleaginous flours and obtaining peculiar foodstuffs due to color and nutritional profile high in fiber and other nutrients. Humankind's diet is generally low in dietary fiber, vegetables in general and nopal in particular, are one of the richest natural sources of dietary fiber, nopal's virtue is its very high content of insoluble fiber and soluble fiber. Similarly, using this current procedure it is possible to substitute water by liquefied nopal and/or other liquefied vegetables in the elaboration of products like tortillas, bread, cookies, pastas, wheat flour tortillas, etc., that may or may not be a step in the previous procedure. In addition, substitution of typical breading and batter formulations by nopal flour and/or other vegetables and/or products elaborated by the previous procedures in the process of breading meat, fish, seafood, and vegetables and other. On the other hand, using this process it is possible to elaborate low calorie foodstuffs, based on cut dehydrated nopal, seasoned or not.
摘要:
System for logging diagnostic information, for use in a transactional environment having means for sending a transactional and re-sendable request to an application program. A counter is associated with the request, wherein a value associated with the counter is updated when an error occurs in the environment. The environment also comprises a counter threshold. The system comprises a comparator, responsive to sending the request, for comparing the value associated with the counter against the counter threshold; a tracing control component, responsive to the value associated with the counter meeting the counter threshold, for enabling a tracing program; and a logging component, responsive to re-sending the request, for logging diagnostic information generated by the tracing program.
摘要:
Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.
摘要:
Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads and moments into the heatsink/cold plate, wherein these loads and moments involve controlling the centroid to restore more ideal thermal performance of the heatsink/chip interface. Still another example embodiment includes a nest architecture facilitating easy and low-cost replacement of LGA sockets. Finally, another example embodiment includes efficient condensation control of test nest assembly parts by using dry-air exhaust.