Single-ended transmission for direct access test mode within a differential input and output circuit
    1.
    发明申请
    Single-ended transmission for direct access test mode within a differential input and output circuit 有权
    单端传输,用于差分输入和输出电路中的直接访问测试模式

    公开(公告)号:US20050251720A1

    公开(公告)日:2005-11-10

    申请号:US10839635

    申请日:2004-05-05

    摘要: An integrated circuit, such as an integrated circuit memory device, includes an output circuit capable to provide a differential signal on first and second contacts during a first mode of operation, such as in a read or write mode of operation, and a single-ended signal on the first contact during a second mode of operation, such as a test mode of operation. A first variable resistor, responsive to a first control signal, is coupled to a first voltage source and the first contact. A second variable resistor, responsive to a second control signal, is coupled to a second voltage source and the second contact. A first transistor has a first electrode coupled to the first contact, a second electrode coupled to the current source and a gate to receive a first input signal. A second transistor has a first electrode coupled to the second contact, a second electrode coupled to the current source and a gate to receive a second input signal. A differential signal is provided on the first and second contacts responsive to the first and second input signals and first and second control signals. A test circuit included in external test equipment with a predetermined resistor is coupled to the integrated circuit and receives a single-ended signal from the output circuit in a test mode of operation.

    摘要翻译: 诸如集成电路存储器件的集成电路包括输出电路,其能够在第一操作模式(例如在读取或写入操作模式下)在第一和第二触点上提供差分信号,并且单端 在第二操作模式下的第一接触信号,例如测试操作模式。 响应于第一控制信号的第一可变电阻器耦合到第一电压源和第一触点。 响应于第二控制信号的第二可变电阻器耦合到第二电压源和第二触点。 第一晶体管具有耦合到第一触点的第一电极,耦合到电流源的第二电极和用于接收第一输入信号的栅极。 第二晶体管具有耦合到第二触点的第一电极,耦合到电流源的第二电极和用于接收第二输入信号的栅极。 响应于第一和第二输入信号以及第一和第二控制信号,在第一和第二接点上提供差分信号。 包含在具有预定电阻器的外部测试设备中的测试电路耦合到集成电路,并且在测试操作模式下从输出电路接收单端信号。

    Single-ended transmission for direct access test mode within a differential input and output circuit
    2.
    发明授权
    Single-ended transmission for direct access test mode within a differential input and output circuit 有权
    单端传输,用于差分输入和输出电路中的直接访问测试模式

    公开(公告)号:US07197684B2

    公开(公告)日:2007-03-27

    申请号:US10839635

    申请日:2004-05-05

    IPC分类号: G01R31/28

    摘要: An integrated circuit, among other embodiments, includes an output circuit to provide a differential signal on first and second contacts during a first mode of operation, such as in a read or write mode of operation, and a single-ended signal on the first contact during a second mode of operation, such as a test mode of operation. A first variable resistor, responsive to a first control signal, is coupled to a first voltage source and the first contact. A second variable resistor, responsive to a second control signal, is coupled to a second voltage source and the second contact. A first transistor has a first electrode coupled to the first contact, a second electrode coupled to the current source and a gate to receive a first input signal. A second transistor has a first electrode coupled to the second contact, a second electrode coupled to the current source and a gate to receive a second input signal.

    摘要翻译: 除其他实施例之外,集成电路包括输出电路,以在第一操作模式(例如在读取或写入操作模式下)在第一和第二触点上提供差分信号,以及在第一触点上的单端信号 在第二操作模式下,例如测试操作模式。 响应于第一控制信号的第一可变电阻器耦合到第一电压源和第一触点。 响应于第二控制信号的第二可变电阻器耦合到第二电压源和第二触点。 第一晶体管具有耦合到第一触点的第一电极,耦合到电流源的第二电极和用于接收第一输入信号的栅极。 第二晶体管具有耦合到第二触点的第一电极,耦合到电流源的第二电极和用于接收第二输入信号的栅极。