公开(公告)号：US20120030846A1

公开(公告)日：2012-02-02

申请号：US13194422

申请日：2011-07-29

申请人： Shamachary Sathish ,  Vijayaraghava Nalladega ,  Kumar V. Jata ,  Mark P. Blodgett

发明人： Shamachary Sathish ,  Vijayaraghava Nalladega ,  Kumar V. Jata ,  Mark P. Blodgett

IPC分类号： G01Q20/02 ,  G01Q10/00

CPC分类号： G01Q60/08

摘要： An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.

摘要翻译： 原子力显微镜（AFM）系统能够在纳米尺度上对样品材料的多种物理特性进行成像。 该系统提供了使用放置在样品下方的电磁线圈对物理性质进行成像的装置和方法。 线圈的激发在样品中产生电流，其可用于对样品的形貌进行成像，样品的物理性质或两者。

公开(公告)号：US08726410B2

公开(公告)日：2014-05-13

申请号：US13194422

申请日：2011-07-29

申请人： Shamachary Sathish ,  Vijayaraghava Nalladega ,  Kumar V Jata ,  Mark P Blodgett

发明人： Shamachary Sathish ,  Vijayaraghava Nalladega ,  Kumar V Jata ,  Mark P Blodgett

IPC分类号： G01Q60/50 ,  G01Q60/56

CPC分类号： G01Q60/08

摘要： An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.

摘要翻译： 原子力显微镜（AFM）系统能够在纳米尺度上对样品材料的多种物理特性进行成像。 该系统提供了使用放置在样品下方的电磁线圈对物理性质进行成像的装置和方法。 线圈的激发在样品中产生电流，其可用于对样品的形貌进行成像，样品的物理性质或两者。

公开(公告)号：US08322221B1

公开(公告)日：2012-12-04

申请号：US12411826

申请日：2009-03-26

申请人： Shamachary Sathish ,  John T. Welter ,  Kumar V. Jata ,  Richard Reibel

发明人： Shamachary Sathish ,  John T. Welter ,  Kumar V. Jata ,  Richard Reibel

IPC分类号： G01N9/24 ,  G01N29/04

CPC分类号： G01N29/043 ,  G01N29/0654 ,  G01N29/2456 ,  G01N29/28 ,  G01N2291/0421 ,  G01N2291/0423

摘要： A non-contact near field high resolution acoustic imaging system of a sample, the system including an acoustic wave generator generating a plurality of acoustic waves a ultrasonic horn amplifying the waves to an amplitude of between about 20 microns and about 300 microns, and a frequency between about 20 kHz and about 40 khz. The ultrasonic horn further directs the amplified waves to impinge upon the sample. On contact between the waves and the sample, a plurality of transmitted energy is transmitted to the sample, a plurality of longitudinal displacements and surface acoustic wave displacements in the sample are created. An adjustable separation distance lies between the sample and the ultrasonic horn, the distance adjusted to maximize the transmitted energy. The distance is preferably greater than the maximum displacement of the ultrasonic horn, or approximately 0.1 mm. The non-contact near field high resolution acoustic imaging system further includes a surface displacement detector for detecting the longitudinal wave displacements or surface acoustic wave displacements, the detector including a tip and a tip diameter; and a computer for digitizing and storing the longitudinal wave displacements or surface acoustic wave displacements. The longitudinal displacements or surface acoustic wave displacements are analyzed to create an image of at least a portion of the sample, the image alternatively having a resolution about equal to the surface displacement detector tip diameter.

摘要翻译： 一种样品的非接触近场高分辨率声学成像系统，该系统包括产生多个声波的声波发生器，将波幅放大到约20微米至约300微米之间的振幅，以及频率 约20kHz至约40khz。 超声波喇叭进一步引导放大的波撞击样品。 在波与样品之间接触时，多个透射能量被传输到样品，产生样品中的多个纵向位移和表面声波位移。 样品和超声波喇叭之间可调距离距离，调整距离以最大化发射能量。 该距离优选地大于超声波喇叭的最大位移，或大约0.1mm。 非接触近场高分辨率声学成像系统还包括用于检测纵波位移或表面声波位移的表面位移检测器，检测器包括尖端和尖端直径; 以及用于数字化和存储纵波位移或表面声波位移的计算机。 分析纵向位移或表面声波位移以产生至少一部分样品的图像，该图像具有大约等于表面位移检测器尖端直径的分辨率。

公开(公告)号：US20090000382A1

公开(公告)日：2009-01-01

申请号：US12136332

申请日：2008-06-10

申请人： Shamachary Sathish ,  Kumar V. Jata ,  John T. Welter ,  Thomas R. Boehlein ,  Norman D. Schehl

发明人： Shamachary Sathish ,  Kumar V. Jata ,  John T. Welter ,  Thomas R. Boehlein ,  Norman D. Schehl

IPC分类号： G01N29/04

CPC分类号： G01N25/72 ,  G01N29/228 ,  G01N29/2418 ,  G01N2291/0231 ,  G01N2291/0258 ,  G01N2291/02827 ,  G01N2291/02881 ,  G01N2291/0421

摘要： A non-contact acousto-thermal method and apparatus are provided for detection of incipient damage in materials. The apparatus utilizes an ultrasonic horn which receives an acoustic wave generated by an ultrasonic transducer energized by an RF pulse. The ultrasonic horn is placed at a distance from the sample to be tested with sufficient gap so that when excited, the face of the ultrasonic horn does not come into contact with the sample. An IR camera is placed at a distance from the opposite side of the sample. The acoustic wave is amplified by the ultrasonic horn, and the interaction between the sample and the acoustic wave produces changes in the temperature of the sample in the region of interaction during acoustic excitation such that the temperature of the material rapidly increases. The temperature-time profile is captured by the IR camera and may be analyzed by a data acquisition unit.

摘要翻译： 提供了非接触式声热法和装置，用于检测材料中的初期损伤。 该装置使用超声波喇叭，该超声波喇叭接收由RF脉冲激励的超声换能器产生的声波。 将超声波喇叭放置在与待测试样品一定距离的距离处，具有足够的间隙，使得当被激发时，超声波喇叭的表面不与样品接触。 将IR相机放置在与样品相反一侧的距离处。 声波被超声波喇叭放大，样品和声波之间的相互作用在声学激发期间在相互作用区域中产生样品的温度变化，使得材料的温度迅速增加。 温度 - 时间曲线由红外摄像机捕获，并可由数据采集单元进行分析。