公开(公告)号：US06195772B1

公开(公告)日：2001-02-27

申请号：US08850790

申请日：1997-05-02

申请人： Bruce F. Mielke ,  Matthew C. Hendricks ,  Howard Marshall ,  Richard Swan ,  Lee R. Althouse ,  Ken A. Ito

发明人： Bruce F. Mielke ,  Matthew C. Hendricks ,  Howard Marshall ,  Richard Swan ,  Lee R. Althouse ,  Ken A. Ito

IPC分类号： G01R3128

CPC分类号： G01R31/3016 ,  G01R31/2834 ,  G01R31/31727 ,  G01R31/31907 ,  G01R31/31922

摘要： An electronic circuit tester (e.g., for testing integrated circuit wafers or packaged integrated circuits) is provided. The tester is preferably based on a relatively inexpensive computer system such as a personal computer and includes at least one high-precision clock circuit that is programmable with respect to frequency and number of clock pulses. The high-precision clock circuit is connectable to the circuit being tested to permit certain timing-critical tests to be performed, even though a large number of other data channels in the tester are controlled by a relatively low speed clock circuit. The tester also includes analog circuitry that can be programmed to provide various analog signals suitable for performing parametric testing on an electronic device under test.

摘要翻译： 提供电子电路测试器（例如，用于测试集成电路晶片或封装的集成电路）。 测试器优选地基于诸如个人计算机的相对便宜的计算机系统，并且包括至少一个相对于时钟脉冲的频率和数量可编程的高精度时钟电路。 即使测试仪中的大量其他数据通道由相对较低速度的时钟电路控制，高精度时钟电路也可连接到被测电路，以允许执行一些定时关键测试。 测试仪还包括可编程的模拟电路，以提供适用于在被测电子设备上进行参数测试的各种模拟信号。