SUBSTRATE PROCESSING METHOD AND METHOD OF MANUFACTURING CRYSTALLINE SILICON CARBIDE (SIC) SUBSTRATE
    3.
    发明申请
    SUBSTRATE PROCESSING METHOD AND METHOD OF MANUFACTURING CRYSTALLINE SILICON CARBIDE (SIC) SUBSTRATE 有权
    基板处理方法和制造晶体碳化硅(SIC)基板的方法

    公开(公告)号:US20120070968A1

    公开(公告)日:2012-03-22

    申请号:US13234594

    申请日:2011-09-16

    IPC分类号: H01L21/265 H01L21/26

    摘要: The present invention provides a method of processing a substrate and a method of manufacturing a silicon carbide (SiC) substrate in which, when annealing processing is performed on a crystalline silicon carbide (SiC) substrate, the occurrence of surface roughness is suppressed. A substrate processing method according to an embodiment of the present invention includes a step of performing plasma irradiation on a single crystal silicon carbide (SiC) substrate (1) and a step of performing high temperature heating processing on the single crystal silicon carbide (SiC) substrate (1) in which the plasma irradiation is performed.

    摘要翻译: 本发明提供一种处理基板的方法和制造碳化硅(SiC)基板的方法,其中当对结晶碳化硅(SiC)基板进行退火处理时,抑制了表面粗糙度的发生。 根据本发明实施例的基板处理方法包括对单晶碳化硅(SiC)基板(1)进行等离子体照射的步骤和对单晶碳化硅(SiC)进行高温加热处理的步骤, 进行等离子体照射的基板(1)。

    Substrate processing method and method of manufacturing crystalline silicon carbide (SIC) substrate
    4.
    发明授权
    Substrate processing method and method of manufacturing crystalline silicon carbide (SIC) substrate 有权
    晶圆碳化硅(SIC)基板的基板加工方法和方法

    公开(公告)号:US08187958B2

    公开(公告)日:2012-05-29

    申请号:US13234594

    申请日:2011-09-16

    IPC分类号: H01L21/265

    摘要: The present invention provides a method of processing a substrate and a method of manufacturing a silicon carbide (SiC) substrate in which, when annealing processing is performed on a crystalline silicon carbide (SiC) substrate, the occurrence of surface roughness is suppressed. A substrate processing method according to an embodiment of the present invention includes a step of performing plasma irradiation on a single crystal silicon carbide (SiC) substrate (1) and a step of performing high temperature heating processing on the single crystal silicon carbide (SiC) substrate (1) in which the plasma irradiation is performed.

    摘要翻译: 本发明提供一种处理基板的方法和制造碳化硅(SiC)基板的方法,其中当对结晶碳化硅(SiC)基板进行退火处理时,抑制了表面粗糙度的发生。 根据本发明实施例的基板处理方法包括对单晶碳化硅(SiC)基板(1)进行等离子体照射的步骤和对单晶碳化硅(SiC)进行高温加热处理的步骤, 进行等离子体照射的基板(1)。